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X-Ray and Neutron Diffraction in Nonideal Crystals

X-Ray and Neutron Diffraction in Nonideal Crystals
Author: Mikhail A. Krivoglaz
Publisher: Springer Science & Business Media
Total Pages: 483
Release: 2012-12-06
Genre: Science
ISBN: 3642742912

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Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).


Diffuse Scattering of X-Rays and Neutrons by Fluctuations

Diffuse Scattering of X-Rays and Neutrons by Fluctuations
Author: Mikhail A. Krivoglaz
Publisher: Springer
Total Pages: 0
Release: 1996
Genre: Science
ISBN: 9783642787652

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Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scattering of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first monograph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two-volume mono graph published in Russian in 1983-84 (this edition is the revised translation of the latter).


Powder diffraction : proceedings of the II International School on Powder Diffraction ; January 20 - 23, 2002, IACS, Kolkata, India ; (as part of 125 years of celebration)

Powder diffraction : proceedings of the II International School on Powder Diffraction ; January 20 - 23, 2002, IACS, Kolkata, India ; (as part of 125 years of celebration)
Author: S. P. Sen Gupta
Publisher: Allied Publishers
Total Pages: 182
Release: 2002
Genre: Diffraction
ISBN: 9788177642629

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The Crystal Structure of Thorium and Zirconium Dihydrides by X-ray and Neutron Diffraction

The Crystal Structure of Thorium and Zirconium Dihydrides by X-ray and Neutron Diffraction
Author: R. E. Rundle
Publisher:
Total Pages: 20
Release: 1951
Genre: Neutrons
ISBN:

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Thorium forms a tetragonal lower hydride of composition ThH{sub 2}. The hydrides ThH{sub 2}, ThD{sub 2} and ZrD{sub 2} have been studied by neutron diffraction in order that hydrogen positions could be determined. The hydrides are isomorphous, and have a deformed fluorite structure. Metal-hydrogen distances in thorium hydride are unusually large, as in UH{sub 3}. Thorium and zirconium scattering amplitudes and a revised scattering amplitude for deuterium are reported.


Industrial Applications of X-Ray Diffraction

Industrial Applications of X-Ray Diffraction
Author: Frank Smith
Publisher: CRC Press
Total Pages: 1024
Release: 1999-09-22
Genre: Science
ISBN: 1482276119

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By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major


Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering
Author: Mario Birkholz
Publisher: John Wiley & Sons
Total Pages: 378
Release: 2006-05-12
Genre: Technology & Engineering
ISBN: 3527607048

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With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.


X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science
Author: Gubicza, Jen?
Publisher: IGI Global
Total Pages: 359
Release: 2014-03-31
Genre: Technology & Engineering
ISBN: 1466658533

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.


International Tables for Crystallography, Volume B

International Tables for Crystallography, Volume B
Author: Uri Shmueli
Publisher: Springer Science & Business Media
Total Pages: 704
Release: 2008-08-27
Genre: Science
ISBN: 9781402082054

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International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc. (follow the link on the right hand side of this page). Volume B presents accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure-factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods, and fundamental as well as advanced treatments of symmetry in reciprocal space. In Part 2, these general accounts are followed by detailed expositions of crystallographic statistics, the theory of direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination, including applications of direct methods to electron crystallography. Part 3 deals with applications of reciprocal space to molecular geometry and `best'-plane calculations, and contains a treatment of the principles of molecular graphics and modelling and their applications. A convergence-acceleration method of importance in the computation of approximate lattice sums is presented and the part concludes with a discussion of the Ewald method. Part 4 contains treatments of various diffuse-scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. Polymer crystallography and reciprocal-space images of aperiodic crystals are also treated. Part 5 of the volume contains introductory treatments of the theory of the interaction of radiation with matter (dynamical theory) as applied to X-ray, electron and neutron diffraction techniques. The simplified trigonometric expressions for the structure factors in the 230 three-dimensional space groups, which appeared in Volume I of International Tables for X-ray Crystallography, are now given in Appendix 1.4.3 to Chapter 1.4 of this volume. Volume B is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallographic research. Graduate students specializing in crystallography will find much material suitable for self-study and a rich source of references to the relevant literature.