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X-ray Absorption Spectroscopy for the Chemical and Materials Sciences

X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
Author: John Evans
Publisher: John Wiley & Sons
Total Pages: 222
Release: 2018-02-05
Genre: Technology & Engineering
ISBN: 1119990912

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A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.


X-ray Absorption Spectroscopy for the Chemical and Materials Sciences

X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
Author: John Evans
Publisher: John Wiley & Sons
Total Pages: 222
Release: 2018-02-05
Genre: Technology & Engineering
ISBN: 1119990904

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A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage — providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.


X-Ray Absorption and X-Ray Emission Spectroscopy

X-Ray Absorption and X-Ray Emission Spectroscopy
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
Total Pages: 896
Release: 2016-01-14
Genre: Science
ISBN: 1118844289

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During the last two decades, remarkable and often spectacularprogress has been made in the methodological and instrumentalaspects of x–ray absorption and emission spectroscopy. Thisprogress includes considerable technological improvements in thedesign and production of detectors especially with the developmentand expansion of large-scale synchrotron reactors All this hasresulted in improved analytical performance and new applications,as well as in the perspective of a dramatic enhancement in thepotential of x–ray based analysis techniques for the nearfuture. This comprehensive two-volume treatise features articlesthat explain the phenomena and describe examples of X–rayabsorption and emission applications in several fields, includingchemistry, biochemistry, catalysis, amorphous and liquid systems,synchrotron radiation, and surface phenomena. Contributors explainthe underlying theory, how to set up X–ray absorptionexperiments, and how to analyze the details of the resultingspectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory andApplications: Combines the theory, instrumentation and applications of x-rayabsorption and emission spectroscopies which offer uniquediagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchersacross multi-disciplines since intense beams from modern sourceshave revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers workingon x-rays and related synchrotron sources and applications inmaterials, physics, medicine, environment/geology, andbiomedical materials


X-Ray Absorption Spectroscopy

X-Ray Absorption Spectroscopy
Author: Graham George
Publisher:
Total Pages: 410
Release: 2019-10
Genre:
ISBN: 9783110570373

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Targeted for chemists, the current textbook outlines the principles, experimental methods and data analysis in X-Ray Absorption Spectroscopy (XAS). The authors introduce EXAFS, Near-Edge XAS, X-Ray Imaging and many other advanced experimental techniques. A special section of the book is devoted to applications of XAS in chemistry, materials and environmental sciences.


International Tables for Crystallography, Volume I

International Tables for Crystallography, Volume I
Author: Christopher Chantler
Publisher: John Wiley & Sons
Total Pages: 1090
Release: 2024-08-19
Genre: Science
ISBN: 1119433940

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X-ray absorption spectroscopy and X-ray emission spectroscopy are complementary to crystallographic methods, particularly for materials science and the study of nanostructure and systems with partial disorder and partial local order, including solutions, gases, liquids, glasses and powders. This new volume of International Tables for Crystallography has nine parts and over 150 chapters contributed by a wide range of international experts. Part 1 provides a brief overview and introduction to the background of X-ray absorption spectroscopy (XAS) and experimental facilities. Part 2 discusses the quantum theory of XAS and related approaches. Part 3 describes both standard and advanced experimental methods used in XAS, X-ray emission spectroscopy (XES) and related techniques. Part 4 covers both standard and more advanced pre-processing of data. Part 5 gives an extensive overview of the analysis of experimental data. Part 6 provides details of the major software packages for data collection, reduction and analysis. Part 7 outlines the importance in science, reporting and hypothesis testing of the exchange of input and processed output data, and data deposition. It also presents excerpts of tables of data and supplementary material for XAS, pre-edge studies, X-ray absorption near-edge spectroscopy (XANES) and X-ray absorption fine structure (XAFS) studies. These tables are also available in full as online supporting information. Part 8 explores a wide range of applications of XAS in fields including materials science, physics, chemistry, biology, earth sciences, catalysis and cultural heritage. Part 9 presents definitions of the terms and quantities used, as developed by the International Union of Crystallography's Commission on XAFS. The volume has been written for the worldwide XAS community of thousands of practitioners, beamline scientists, experts and academics, and for the novice user who wishes to know what XAS and XES can do for them and how they may use these techniques for their particular purposes. The volume is therefore intended to be a self-contained, authoritative reference work that can also be used for training, learning or teaching, providing practical guidance for readers of all levels of experience. More information on the volumes in the series International Tables for Crystallography can be found at https://it.iucr.org.


Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
Total Pages: 544
Release: 2012-10-25
Genre: Science
ISBN: 3642273807

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.


X-Ray Absorption Spectroscopy of Semiconductors

X-Ray Absorption Spectroscopy of Semiconductors
Author: Claudia S. Schnohr
Publisher: Springer
Total Pages: 367
Release: 2014-11-05
Genre: Technology & Engineering
ISBN: 3662443627

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.


Advances in X-ray Absorption Fine Structure Analysis

Advances in X-ray Absorption Fine Structure Analysis
Author: Zhongrui (jerry) Li
Publisher:
Total Pages: 400
Release: 2020-11-15
Genre:
ISBN: 9781925823882

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This book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD). This book may serve as a reference book for researchers and technicians taking up synchrotron radiation application research and postgraduates majoring in the X-ray absorption spectroscopy field. It will provide the beginners with all the necessary information in the field of XAFS. Also, experienced users active in particular subfields of XAFS spectroscopies will learn in this book about the enormous potential of XAFS for other applications in physics, chemistry, biology, materials science and engineering, geo- and environmental science, etc. For more details, please visit https: //centralwestpublishing.com s book provides a comprehensive, theoretical, practical, and thorough guide to current X-ray absorption fine structure (XAFS) spectroscopy and modern applications. It contains the experimental and theoretical aspects of XAFS in 14 chapters based on recent developments in the XAFS approach to science and technology, describing the basic principles and theories, calculation methods, computer programs, advanced methodologies and techniques, experiments, data analysis and interpretation and applications. Among the broad XAFS subjects of synchrotron radiation applications, the book specifically covers EXAFS, XANES and NEXAFS, AXAFS, DAFS, XMCD, MEXAFS, XMLD, and X-ray natural dichroism (XNCD and XNLD).


Introduction to XAFS

Introduction to XAFS
Author: Grant Bunker
Publisher: Cambridge University Press
Total Pages: 269
Release: 2010-01-28
Genre: Science
ISBN: 1139485091

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X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.


XAFS for Everyone

XAFS for Everyone
Author: Scott Calvin
Publisher: CRC Press
Total Pages: 459
Release: 2013-05-20
Genre: Science
ISBN: 1439878633

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XAFS for Everyone provides a practical, thorough guide to x-ray absorption fine-structure (XAFS) spectroscopy for both novices and seasoned practitioners from a range of disciplines. The text is enhanced with more than 200 figures as well as cartoon characters who offer informative commentary on the different approaches used in XAFS spectroscopy. The book covers sample preparation, data reduction, tips and tricks for data collection, fingerprinting, linear combination analysis, principal component analysis, and modeling using theoretical standards. It describes both near-edge (XANES) and extended (EXAFS) applications in detail. Examples throughout the text are drawn from diverse areas, including materials science, environmental science, structural biology, catalysis, nanoscience, chemistry, art, and archaeology. In addition, five case studies from the literature demonstrate the use of XAFS principles and analysis in practice. The text includes derivations and sample calculations to foster a deeper comprehension of the results. Whether you are encountering this technique for the first time or looking to hone your craft, this innovative and engaging book gives you insight on implementing XAFS spectroscopy and interpreting XAFS experiments and results. It helps you understand real-world trade-offs and the reasons behind common rules of thumb.