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Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint)

Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint)
Author: M. L. Crawford
Publisher: Forgotten Books
Total Pages: 152
Release: 2018-09-08
Genre: Technology & Engineering
ISBN: 9781390511246

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Excerpt from Using a Tem Cell for Emc Measurements of Electronic Equipment Various approaches have been investigated to find ways by which to increase the test volume available in a cell without reducing its upper useful frequency. One is to design the cell with an off - set septum. Ah asymmetric or offset septum cell was fabricated as shown in the cross-sectional drawings of figure 12. The E-field distributions above and below the septum of this cell are shown in figure 13. This cell offers approximately 29% greater test volume in its lower half space than a symmetric cell of similar size with an equivalent high-frequency cutoff and resonance limitation. This additional test space, however, comes at the price of less test field uniformity and greater difficulty in using the cell at multimode frequencies. A previous publication comparing the characteristics of this cell with a symmetric cell of similar size is available for further study, if desired [8. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.


Using a TEM (Transverse Electromagnetic) Cell for EMC (Electromagnetic Compatibility) Measurements of Electronic Equipment, National Bureau of Standards, Washington, D.C. National Engineering Lab

Using a TEM (Transverse Electromagnetic) Cell for EMC (Electromagnetic Compatibility) Measurements of Electronic Equipment, National Bureau of Standards, Washington, D.C. National Engineering Lab
Author: M. L. CRAWFORD
Publisher:
Total Pages: 0
Release: 1981
Genre:
ISBN:

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A Handbook for EMC Testing and Measurement

A Handbook for EMC Testing and Measurement
Author: David Morgan
Publisher: IET
Total Pages: 305
Release: 1994-06-30
Genre: Science
ISBN: 0863417566

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The book reviews developments in the following fields: electromagnetic compatibility; EMC standards; EMC testing; radiated emission testing; antennas; radiated susceptibility testing; measurement equipment; electromagnetic transient testing; and uncertainty analysis


Principles and Techniques of Electromagnetic Compatibility

Principles and Techniques of Electromagnetic Compatibility
Author: Christos Christopoulos
Publisher: CRC Press
Total Pages: 348
Release: 1995-02-22
Genre: Technology & Engineering
ISBN: 9780849378928

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Unlike other publications, this new book offers a different approach to the study of electromagnetic compatibility (EMC). It emphasizes the understanding of relevant electromagnetic interactions in increasingly complex systems. Mathematical tools are introduced when pursuing the physical picture unaided becomes counterproductive. In order to handle complexity, numerical tools are developed and the basis and capabilities of these tools are presented. Part I of the book covers underlying concepts and techniques. This includes discussions on electromagnetic fields, electrical circuit components, and electrical signals and circuits. The second part deals with general EMC concepts and techniques and will be useful for predicting the EMC behavior of systems. More practical techniques used to control electromagnetic interference and the design of EMC into products are presented in Part III. The main EMC standards and test techniques are described in the final part of the book. Chapters are designed to allow readers to study the entire book at a pace which reflects their own background and interests. The book appeals to both EMC applications-oriented and analysis-oriented readers. This text provides useful source material for a serious study of EMC, including references to more advanced work.