Transmission Electron Microscopy And Diffractometry Of Materials PDF Download
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Author | : Brent Fultz |
Publisher | : Springer Science & Business Media |
Total Pages | : 775 |
Release | : 2012-10-14 |
Genre | : Science |
ISBN | : 3642297609 |
Download Transmission Electron Microscopy and Diffractometry of Materials Book in PDF, ePub and Kindle
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author | : Brent Fultz |
Publisher | : Springer Science & Business Media |
Total Pages | : 764 |
Release | : 2012-10-13 |
Genre | : Science |
ISBN | : 3642297617 |
Download Transmission Electron Microscopy and Diffractometry of Materials Book in PDF, ePub and Kindle
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Author | : Brent Fultz |
Publisher | : Springer Science & Business Media |
Total Pages | : 778 |
Release | : 2002 |
Genre | : Science |
ISBN | : 9783540437642 |
Download Transmission Electron Microscopy and Diffractometry of Materials Book in PDF, ePub and Kindle
Inelastic electron scattering and spectroscopy. Diffraction from crystals. Electron diffraction and crystallography.
Author | : Brent Fultz |
Publisher | : Springer Science & Business Media |
Total Pages | : 763 |
Release | : 2013-06-29 |
Genre | : Technology & Engineering |
ISBN | : 3662049015 |
Download Transmission Electron Microscopy and Diffractometry of Materials Book in PDF, ePub and Kindle
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
Author | : Brent Fultz |
Publisher | : |
Total Pages | : 772 |
Release | : 2014-01-15 |
Genre | : |
ISBN | : 9783662049020 |
Download Transmission Electron Microscopy and Diffractometry of Materials Book in PDF, ePub and Kindle
Author | : Marc De Graef |
Publisher | : Cambridge University Press |
Total Pages | : 741 |
Release | : 2003-03-27 |
Genre | : Science |
ISBN | : 0521620066 |
Download Introduction to Conventional Transmission Electron Microscopy Book in PDF, ePub and Kindle
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
Author | : C. Barry Carter |
Publisher | : Springer |
Total Pages | : 518 |
Release | : 2016-08-24 |
Genre | : Technology & Engineering |
ISBN | : 3319266519 |
Download Transmission Electron Microscopy Book in PDF, ePub and Kindle
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author | : Yang Leng |
Publisher | : John Wiley & Sons |
Total Pages | : 384 |
Release | : 2009-03-04 |
Genre | : Technology & Engineering |
ISBN | : 0470822996 |
Download Materials Characterization Book in PDF, ePub and Kindle
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author | : David B. Williams |
Publisher | : Springer Science & Business Media |
Total Pages | : 804 |
Release | : 2009-08-05 |
Genre | : Science |
ISBN | : 038776500X |
Download Transmission Electron Microscopy Book in PDF, ePub and Kindle
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.
Author | : Gerhard Dehm |
Publisher | : John Wiley & Sons |
Total Pages | : 403 |
Release | : 2012-05-30 |
Genre | : Technology & Engineering |
ISBN | : 3527652183 |
Download In-situ Electron Microscopy Book in PDF, ePub and Kindle
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.