Thermal Aware Testing Techniques For Digital Vlsi Circuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Thermal Aware Testing Techniques For Digital Vlsi Circuits PDF full book. Access full book title Thermal Aware Testing Techniques For Digital Vlsi Circuits.
Author | : Arpita Dutta |
Publisher | : |
Total Pages | : 136 |
Release | : 2017-05-18 |
Genre | : |
ISBN | : 9783330075313 |
Download Thermal Aware Testing Techniques for Digital VLSI Circuits Book in PDF, ePub and Kindle
Author | : Santanu Chattopadhyay |
Publisher | : CRC Press |
Total Pages | : 138 |
Release | : 2018-04-20 |
Genre | : Computers |
ISBN | : 9780815378822 |
Download Thermal-Aware Testing of Digital VLSI Circuits and Systems Book in PDF, ePub and Kindle
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
Author | : M. Bushnell |
Publisher | : Springer Science & Business Media |
Total Pages | : 712 |
Release | : 2004-12-15 |
Genre | : Technology & Engineering |
ISBN | : 0792379918 |
Download Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Book in PDF, ePub and Kindle
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author | : Josep Altet |
Publisher | : Springer Science & Business Media |
Total Pages | : 226 |
Release | : 2002-06-30 |
Genre | : Science |
ISBN | : 9781402070761 |
Download Thermal Testing of Integrated Circuits Book in PDF, ePub and Kindle
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
Author | : Abdallatif S. Abuissa |
Publisher | : |
Total Pages | : 129 |
Release | : 2009 |
Genre | : |
ISBN | : |
Download Low Power High Fault Coverage Test Techniques for Digital Vlsi Circuits Book in PDF, ePub and Kindle
Author | : Suman Lata Tripathi |
Publisher | : CRC Press |
Total Pages | : 391 |
Release | : 2020-08-19 |
Genre | : Technology & Engineering |
ISBN | : 1000168174 |
Download Advanced VLSI Design and Testability Issues Book in PDF, ePub and Kindle
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Author | : Santanu Chattopadhyay |
Publisher | : CRC Press |
Total Pages | : 118 |
Release | : 2018-04-24 |
Genre | : Technology & Engineering |
ISBN | : 1351227777 |
Download Thermal-Aware Testing of Digital VLSI Circuits and Systems Book in PDF, ePub and Kindle
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Author | : Angela Krstic |
Publisher | : Springer Science & Business Media |
Total Pages | : 216 |
Release | : 1998-10-31 |
Genre | : Computers |
ISBN | : 9780792382959 |
Download Delay Fault Testing for VLSI Circuits Book in PDF, ePub and Kindle
With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices. After a long period of prevailing belief that high stuck-at fault coverage is sufficient to guarantee high quality of shipped products, the industry is now forced to rethink other types of testing. Delay testing has been a topic of extensive research both in industry and in academia for more than a decade. As a result, several delay fault models and numerous testing methodologies have been proposed. Delay Fault Testing for VLSI Circuits presents a selection of existing delay testing research results. It combines introductory material with state-of-the-art techniques that address some of the current problems in delay testing. Delay Fault Testing for VLSI Circuits covers some basic topics such as fault modeling and test application schemes for detecting delay defects. It also presents summaries and conclusions of several recent case studies and experiments related to delay testing. A selection of delay testing issues and test techniques such as delay fault simulation, test generation, design for testability and synthesis for testability are also covered. Delay Fault Testing for VLSI Circuits is intended for use by CAD and test engineers, researchers, tool developers and graduate students. It requires a basic background in digital testing. The book can used as supplementary material for a graduate-level course on VLSI testing.
Author | : Daryouche R. Behboudi |
Publisher | : |
Total Pages | : 394 |
Release | : 1991 |
Genre | : Integrated circuits |
ISBN | : |
Download A Thermal Simulator for Digital VLSI Circuits Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : |
Release | : |
Genre | : |
ISBN | : |
Download Low Power High Fault Coverage Test Techniques for Digital VLSI Circuits Book in PDF, ePub and Kindle
Testing of digital VLSI circuits entails many challenges as a consequence of rapid growth of semiconductor manufacturing technology and the unprecedented levels of design complexity and the gigahertz range of operating frequencies. These challenges include keeping the average and peak power dissipation and test application time within acceptable limits. This dissertation proposes techniques to addresses these challenges during test. The first proposed technique, called bit-swapping LFSR (BS-LFSR), uses new observations concerning the output sequence of an LFSR to design a low-transition test-pattern-generator (TPG) for test-per-clock built-in self-test (BIST) to achieve reduction in the overall switching activity in the circuit-under-test (CUT). The obtained results show up to 28% power reduction for the proposed design, and up-to 63% when it is combined with another established technique. The proposed BS-LFSR is then extended for use in test-per-scan BIST. The results obtained while scanning in test vectors show up to 60% reduction in average power consumption. The BS-LFSR is then extended further to act as a multi-degree smoother for test patterns generated by conventional LFSRs before applying them to the CUT. Experimental results show up to 55% reduction in average power. Another technique that aims to reduce peak power in scan-based BIST is presented. The new technique uses a two-phase scan-chain ordering algorithm to reduce average and peak power in scan and capture cycles. Experimental results show up to 65% and 55% reduction in average and peak power, respectively. Finally, a technique that aims to significantly increase the fault coverage in test-per-scan BIST, while keeping the test-application time short, is proposed. The results obtained show a significant improvement in fault coverage and test application time compared with other techniques.