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| Author | : Mikhail Aleksandrovich Krivoglaz |
| Publisher | : Springer |
| Total Pages | : 440 |
| Release | : 1969 |
| Genre | : Science |
| ISBN | : |
| Author | : M. A. Krivoglaz |
| Publisher | : Springer |
| Total Pages | : 0 |
| Release | : 2014-05-14 |
| Genre | : Science |
| ISBN | : 9781489955821 |
| Author | : Mikhail A. Krivoglaz |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 483 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 3642742912 |
Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter ing of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first mono graph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two volume monograph published in Russian in 1983-84 (this edition is the revised translation of the latter).
| Author | : Mikhail A. Krivoglaz |
| Publisher | : Springer |
| Total Pages | : 0 |
| Release | : 1996 |
| Genre | : Science |
| ISBN | : 9783642787652 |
Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scattering of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first monograph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two-volume mono graph published in Russian in 1983-84 (this edition is the revised translation of the latter).
| Author | : Mikhail Aleksandrovich Krivoglaz |
| Publisher | : |
| Total Pages | : 328 |
| Release | : 1996 |
| Genre | : Science |
| ISBN | : |
| Author | : Mikhail Aleksandrovich Krivoglaz |
| Publisher | : Springer |
| Total Pages | : 442 |
| Release | : 1969 |
| Genre | : Science |
| ISBN | : |
| Author | : G. L. Squires |
| Publisher | : Cambridge University Press |
| Total Pages | : 273 |
| Release | : 2012-03-29 |
| Genre | : Science |
| ISBN | : 1107644062 |
A long-awaited reprint of the book that has established itself as the classic textbook on neutron scattering. It will be an invaluable introductory text for students taking courses on neutron scattering, as well as for researchers and those who would like to deepen their knowledge on the subject through self-study.
| Author | : M. L. Goldberger |
| Publisher | : |
| Total Pages | : 48 |
| Release | : 1946 |
| Genre | : Neutrons |
| ISBN | : |
| Author | : André Authier |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 419 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 1461558794 |
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
| Author | : Mario Birkholz |
| Publisher | : John Wiley & Sons |
| Total Pages | : 378 |
| Release | : 2006-05-12 |
| Genre | : Technology & Engineering |
| ISBN | : 3527607048 |
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
