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X-ray Standing Wave Technique, The: Principles And Applications

X-ray Standing Wave Technique, The: Principles And Applications
Author: Jorg Zegenhagen
Publisher: World Scientific
Total Pages: 557
Release: 2013-01-30
Genre: Science
ISBN: 9814513105
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The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

The X-ray Standing Wave Technique

The X-ray Standing Wave Technique
Author:
Publisher:
Total Pages: 534
Release: 2013
Genre: Electromagnetic waves
ISBN: 9789812279002
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The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.

X-Ray Standing Waves on Surfaces

X-Ray Standing Waves on Surfaces
Author:
Publisher:
Total Pages: 20
Release: 1993
Genre:
ISBN:
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The x-ray standing wave technique is a sensitive tool for determining the position of atoms within a crystal, adsorbed onto a surface or distributed within the crystal or at the interface. The technique is based on the x-ray standing wave field that arises as a result of the interference of coherently related incident and reflected plane waves and is described by the theory of dynamical diffraction of x-rays. When two coherently related traveling plane waves having the same wavelength pass through each other their superposition results in a standing wave of period D = lambda/2 sin theta; where lambda is the wavelength of the traveling waves, and 2 theta is the relative angle between them. The generation of a standing wave requires both an incident and a reflected wave and the letter can be generated by either Bragg diffraction or total external reflection.

Development of the X-ray Standing Waves Methodology to Probe the Interfaces of Periodic Multilayers

Development of the X-ray Standing Waves Methodology to Probe the Interfaces of Periodic Multilayers
Author: Meiyi Wu
Publisher:
Total Pages: 0
Release: 2018
Genre:
ISBN:
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The interfacial information of periodic multilayers can be crucial for the development of reflecting mirrors which operate in the X-ray and extreme ultraviolet (X-EUV) ranges. Such information may contain the interdiffusion and chemical process at the interfaces of the layers. The idea of this thesis is to apply the X-ray standing wave technique to the characterization of materials, mainly but not limited to the periodic multilayers. X-ray standing wave technique enables to enhance the excitation (photoemission, fluorescence etc.) of specific locations within a periodic stack. The nature of such advantage is the interference of two coherent X-ray beams. One may compare the X-ray standing waves with the mechanical standing waves. The constructive interference at the anti-nodal plane amplifies the electric field; while the destructive interference at the nodal plane minimizes the electric field. In this way, the experimental spectra obtained under standing wave field will be mostly the material located on the anti-nodal plane. Combined with other techniques such as X-ray emission spectroscopy and X-ray photoelectron spectroscopy, a depth-selective information with a sub-nanoscale sensitivity can be obtained.

X-Ray Diffraction

X-Ray Diffraction
Author: Oliver H. Seeck
Publisher: CRC Press
Total Pages: 438
Release: 2015-02-10
Genre: Science
ISBN: 9814303607
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High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Total-Reflection X-Ray Fluorescence Analysis and Related Methods

Total-Reflection X-Ray Fluorescence Analysis and Related Methods
Author: Reinhold Klockenkämper
Publisher: John Wiley & Sons
Total Pages: 554
Release: 2014-12-15
Genre: Science
ISBN: 1118988965
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Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study

Handbook of Spectroscopy

Handbook of Spectroscopy
Author: G¿nter Gauglitz
Publisher: John Wiley & Sons
Total Pages: 1168
Release: 2006-03-06
Genre: Science
ISBN: 3527605029
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This handbook provides a straightforward introduction to spectroscopy, showing what it can do and how it does it, together with a clear, integrated and objective account of the wealth of information that can be derived from spectra. The sequence of chapters covers a wide range of the electromagnetic spectrum, and the physical processes involved, from nuclear phenomena to molecular rotation processes. - A day-by-day laboratory guide: its design based on practical knowledge of spectroscopists at universities, industries and research institutes - A well-structured information source containing methods and applications sections framed by sections on general topics - Guides users to a decision about which spectroscopic method and which instrumentation will be the most appropriate to solve their own practical problem - Rapid access to essential information - Correct analysis of a huge number of measured spectra data and smart use of such information sources as databases and spectra libraries

X-Ray and Neutron Structure Analysis in Materials Science

X-Ray and Neutron Structure Analysis in Materials Science
Author: J. Hasek
Publisher: Springer Science & Business Media
Total Pages: 388
Release: 2012-12-06
Genre: Science
ISBN: 1461307678
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During the last few decades, crystallography has become a wide and economically important field of science with many interesting applications in materials research, in different branches of physics, chemistry, geology, pharmacology, biochemistry, electronics, in many technological processes, machinery, heavy industry, etc. Twenty Nobel prizes awarded for achieve ments belonging to this· field only underline its distinction. Crystallo graphy has become a commonly used term, but - like a whale - it is much easier to recognize than to describe because of an extreme diversity of sub jects involved which range from highly sophisticated theories to the develop ment of routine technological processes or testing of materials in produc tion. It is apparent that only some aspects of selected topics could be included on a single occasion. The conference "ADVANCED METHODS IN X-RAY AND NEUTRON STRUCTURE ANALYSIS OF MATERIALS" held in Karlovy Vary (Czechoslovakia) on October 5-9, 1987, was intended to cover the most important crystallographic aspects of ma terials science. The conference was attended by 250 people from 16 countries (Belgium,Bulgaria, China, Czechoslovakia, Finland, France, FRG, GDR, Hungary, Italy, The Netherlands, Poland, Sweden, USA, USSR and Yugoslavia).

X-Ray and Neutron Dynamical Diffraction

X-Ray and Neutron Dynamical Diffraction
Author: André Authier
Publisher: Springer Science & Business Media
Total Pages: 419
Release: 2012-12-06
Genre: Science
ISBN: 1461558794
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This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.