Testing Digital Circuits PDF Download
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Author | : Francis C. Wong |
Publisher | : Elsevier |
Total Pages | : 248 |
Release | : 2012-12-02 |
Genre | : Technology & Engineering |
ISBN | : 0080504345 |
Download Digital Circuit Testing Book in PDF, ePub and Kindle
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author | : Parag K. Lala |
Publisher | : Springer Nature |
Total Pages | : 99 |
Release | : 2022-06-01 |
Genre | : Technology & Engineering |
ISBN | : 303179785X |
Download An Introduction to Logic Circuit Testing Book in PDF, ePub and Kindle
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author | : N. K. Jha |
Publisher | : Cambridge University Press |
Total Pages | : 1022 |
Release | : 2003-05-08 |
Genre | : Computers |
ISBN | : 9781139437431 |
Download Testing of Digital Systems Book in PDF, ePub and Kindle
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author | : Rene David |
Publisher | : CRC Press |
Total Pages | : 508 |
Release | : 2020-11-26 |
Genre | : Technology & Engineering |
ISBN | : 1000146014 |
Download Random Testing of Digital Circuits Book in PDF, ePub and Kindle
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author | : Parag K. Lala |
Publisher | : Academic Press |
Total Pages | : 222 |
Release | : 1997 |
Genre | : Computers |
ISBN | : 9780124343306 |
Download Digital Circuit Testing and Testability Book in PDF, ePub and Kindle
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author | : M. Bushnell |
Publisher | : Springer Science & Business Media |
Total Pages | : 690 |
Release | : 2006-04-11 |
Genre | : Technology & Engineering |
ISBN | : 0306470403 |
Download Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Book in PDF, ePub and Kindle
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author | : Alexander Miczo |
Publisher | : Wiley |
Total Pages | : 480 |
Release | : 1985-12 |
Genre | : |
ISBN | : 9780471604228 |
Download Digital Logic Testing and Simulation Book in PDF, ePub and Kindle
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Author | : Parag K. Lala |
Publisher | : Morgan & Claypool Publishers |
Total Pages | : 111 |
Release | : 2009 |
Genre | : Computers |
ISBN | : 1598293508 |
Download An Introduction to Logic Circuit Testing Book in PDF, ePub and Kindle
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author | : Brian R. Wilkins |
Publisher | : |
Total Pages | : 196 |
Release | : 1986 |
Genre | : Digital electronics |
ISBN | : |
Download Testing digital circuits Book in PDF, ePub and Kindle
Author | : Dimitris Gizopoulos |
Publisher | : Springer Science & Business Media |
Total Pages | : 431 |
Release | : 2006-01-22 |
Genre | : Technology & Engineering |
ISBN | : 0387294090 |
Download Advances in Electronic Testing Book in PDF, ePub and Kindle
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.