Test Resource Partitioning For System On A Chip PDF Download
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Author | : Vikram Iyengar |
Publisher | : Springer Science & Business Media |
Total Pages | : 234 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461511135 |
Download Test Resource Partitioning for System-on-a-Chip Book in PDF, ePub and Kindle
Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.
Author | : Anshuman Chandra |
Publisher | : |
Total Pages | : 370 |
Release | : 2002 |
Genre | : Plug and play (Computer architecture) |
ISBN | : |
Download Test Resource Partitioning and Test Data Compression for System-on-a-chip Book in PDF, ePub and Kindle
Author | : Bashir M. Al-Hashimi |
Publisher | : IET |
Total Pages | : 940 |
Release | : 2006-01-31 |
Genre | : Technology & Engineering |
ISBN | : 0863415520 |
Download System-on-Chip Book in PDF, ePub and Kindle
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Author | : Raimund Ubar |
Publisher | : IGI Global |
Total Pages | : 550 |
Release | : 2011-01-01 |
Genre | : Computers |
ISBN | : 1609602145 |
Download Design and Test Technology for Dependable Systems-on-chip Book in PDF, ePub and Kindle
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author | : Zuber Patel |
Publisher | : Springer Nature |
Total Pages | : 299 |
Release | : 2020-08-28 |
Genre | : Technology & Engineering |
ISBN | : 9811562296 |
Download Advances in VLSI and Embedded Systems Book in PDF, ePub and Kindle
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedded systems, and CAD for VLSI. With an aim to address the demand for complex and high-functionality systems as well as portable consumer electronics, the contents focus on basic concepts of circuit and systems design, fabrication, testing, and standardization. This book can be useful for students, researchers as well as industry professionals interested in emerging trends in VLSI and embedded systems.
Author | : Patrick Girard |
Publisher | : Springer Science & Business Media |
Total Pages | : 376 |
Release | : 2010-03-11 |
Genre | : Technology & Engineering |
ISBN | : 1441909281 |
Download Power-Aware Testing and Test Strategies for Low Power Devices Book in PDF, ePub and Kindle
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author | : Alfredo Benso |
Publisher | : Springer Science & Business Media |
Total Pages | : 242 |
Release | : 2005-12-15 |
Genre | : Technology & Engineering |
ISBN | : 030648711X |
Download Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Book in PDF, ePub and Kindle
This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.
Author | : Gloria Huertas Sánchez |
Publisher | : Springer Science & Business Media |
Total Pages | : 459 |
Release | : 2007-06-03 |
Genre | : Technology & Engineering |
ISBN | : 1402053150 |
Download Oscillation-Based Test in Mixed-Signal Circuits Book in PDF, ePub and Kindle
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Author | : Francisco da Silva |
Publisher | : Springer Science & Business Media |
Total Pages | : 297 |
Release | : 2006-09-15 |
Genre | : Technology & Engineering |
ISBN | : 0387346090 |
Download The Core Test Wrapper Handbook Book in PDF, ePub and Kindle
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.
Author | : Dimitris Gizopoulos |
Publisher | : Springer Science & Business Media |
Total Pages | : 431 |
Release | : 2006-01-22 |
Genre | : Technology & Engineering |
ISBN | : 0387294090 |
Download Advances in Electronic Testing Book in PDF, ePub and Kindle
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.