Surface And Thin Film Analysis PDF Download
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Author | : Henning Bubert |
Publisher | : Wiley-VCH |
Total Pages | : 0 |
Release | : 2002-05-07 |
Genre | : Science |
ISBN | : 9783527304585 |
Download Surface and Thin Film Analysis Book in PDF, ePub and Kindle
The development and quality assurance of such high-tech materials as semiconductors or biopolymers demand special analytical methods for surfaces and thin films. This book presents the whole spectrum of methods available in a clear manner, moving beyond the basics, equipment and applications to compare these methods. This allows users to find the optimum method in solving any given problem. - The book is richly illustrated with 200 figures - Almost 900 references guide to the primary literature - A list of suppliers, each with full address, makes it easy to obtain the required equipment
Author | : John Venables |
Publisher | : Cambridge University Press |
Total Pages | : 392 |
Release | : 2000-08-31 |
Genre | : Science |
ISBN | : 9780521785006 |
Download Introduction to Surface and Thin Film Processes Book in PDF, ePub and Kindle
This book covers the experimental and theoretical understanding of surface and thin film processes. It presents a unique description of surface processes in adsorption and crystal growth, including bonding in metals and semiconductors. Emphasis is placed on the strong link between science and technology in the description of, and research for, new devices based on thin film and surface science. Practical experimental design, sample preparation and analytical techniques are covered, including detailed discussions of Auger electron spectroscopy and microscopy. Thermodynamic and kinetic models of structure are emphasised throughout. The book provides extensive leads into practical and research literature, as well as resources on the World Wide Web (see http://venables.asu.edu/book). Each chapter contains problems which aim to develop awareness of the subject and the methods used. Aimed as a graduate textbook, this book will also be useful as a sourcebook for graduate students, researchers and practitioners in physics, chemistry, materials science and engineering.
Author | : Leonard C. Feldman |
Publisher | : |
Total Pages | : 384 |
Release | : 1986 |
Genre | : Mathematics |
ISBN | : |
Download Fundamentals of Surface and Thin Film Analysis Book in PDF, ePub and Kindle
Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy and RBS methods. Annotation copyrighted by Book News, Inc., Portland, OR
Author | : Terry L. Alford |
Publisher | : Springer Science & Business Media |
Total Pages | : 349 |
Release | : 2007-02-16 |
Genre | : Technology & Engineering |
ISBN | : 0387292608 |
Download Fundamentals of Nanoscale Film Analysis Book in PDF, ePub and Kindle
From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.
Author | : Mario Birkholz |
Publisher | : John Wiley & Sons |
Total Pages | : 378 |
Release | : 2006-05-12 |
Genre | : Technology & Engineering |
ISBN | : 3527607048 |
Download Thin Film Analysis by X-Ray Scattering Book in PDF, ePub and Kindle
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author | : Matthew Pelliccione |
Publisher | : Springer Science & Business Media |
Total Pages | : 206 |
Release | : 2008-01-29 |
Genre | : Technology & Engineering |
ISBN | : 0387751092 |
Download Evolution of Thin Film Morphology Book in PDF, ePub and Kindle
The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes.
Author | : L. B. Freund |
Publisher | : Cambridge University Press |
Total Pages | : 772 |
Release | : 2004-01-08 |
Genre | : Technology & Engineering |
ISBN | : 9781139449823 |
Download Thin Film Materials Book in PDF, ePub and Kindle
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
Author | : Hartmut Frey |
Publisher | : Springer Science & Business Media |
Total Pages | : 380 |
Release | : 2015-05-06 |
Genre | : Technology & Engineering |
ISBN | : 3642054307 |
Download Handbook of Thin Film Technology Book in PDF, ePub and Kindle
“Handbook of Thin Film Technology” covers all aspects of coatings preparation, characterization and applications. Different deposition techniques based on vacuum and plasma processes are presented. Methods of surface and thin film analysis including coating thickness, structural, optical, electrical, mechanical and magnetic properties of films are detailed described. The several applications of thin coatings and a special chapter focusing on nanoparticle-based films can be found in this handbook. A complete reference for students and professionals interested in the science and technology of thin films.
Author | : Hans Lüth |
Publisher | : Springer Science & Business Media |
Total Pages | : 566 |
Release | : 2013-04-17 |
Genre | : Technology & Engineering |
ISBN | : 3662043521 |
Download Solid Surfaces, Interfaces and Thin Films Book in PDF, ePub and Kindle
This book emphasises both experimental and theoretical aspects of surface, interface and thin film physics. Compa- red to the earlier editions, which bore the title "Surfaces and Interfaces of Solid Materials", the book now places more emphasis on thin films, including also their superconducting and ferromagnetic properties. The present 4th edition thus presents techniques of preparing well-defined solid surfaces and interfaces, fundamental aspects of adsorption and layer growth, as well as basic models for the descripti- on of structural, vibronic and electronic properties of sur- faces, interfaces and thin films. Because of their importan- ce for modern information technology, significant attention is paid to the electronic properties of semiconductor inter- faces and heterostructures. Collective phenomena , such as superconductivity and ferromagnetism, also feature promi- nently. Experimental sections covering essential measurement and preparation techniques are presented in separate panels.
Author | : Orlando Auciello |
Publisher | : John Wiley & Sons |
Total Pages | : 282 |
Release | : 2001 |
Genre | : Science |
ISBN | : 9780471241416 |
Download In Situ Real-Time Characterization of Thin Films Book in PDF, ePub and Kindle
An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application