Strategies To Reduce Power During Vlsi Circuit Testing PDF Download
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Author | : Subhadip Kundu |
Publisher | : |
Total Pages | : 0 |
Release | : 2012-09-25 |
Genre | : |
ISBN | : 9783659255205 |
Download Strategies to Reduce Power During VLSI Circuit Testing Book in PDF, ePub and Kindle
Author | : Patrick Girard |
Publisher | : Springer Science & Business Media |
Total Pages | : 376 |
Release | : 2010-03-11 |
Genre | : Technology & Engineering |
ISBN | : 1441909281 |
Download Power-Aware Testing and Test Strategies for Low Power Devices Book in PDF, ePub and Kindle
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Author | : Nicola Nicolici |
Publisher | : Springer Science & Business Media |
Total Pages | : 182 |
Release | : 2006-04-11 |
Genre | : Technology & Engineering |
ISBN | : 0306487314 |
Download Power-Constrained Testing of VLSI Circuits Book in PDF, ePub and Kindle
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
Author | : Nikhil Jayakumar |
Publisher | : Springer Science & Business Media |
Total Pages | : 229 |
Release | : 2009-12-02 |
Genre | : Technology & Engineering |
ISBN | : 1441909508 |
Download Minimizing and Exploiting Leakage in VLSI Design Book in PDF, ePub and Kindle
Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs. This book presents two techniques aimed at reducing leakage power in digital VLSI ICs. The first technique reduces leakage through the selective use of high threshold voltage sleep transistors. The second technique reduces leakage by applying the optimal Reverse Body Bias (RBB) voltage. This book also shows readers how to turn the leakage problem into an opportunity, through the use of sub-threshold logic.
Author | : M. Bushnell |
Publisher | : Springer Science & Business Media |
Total Pages | : 690 |
Release | : 2006-04-11 |
Genre | : Technology & Engineering |
ISBN | : 0306470403 |
Download Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Book in PDF, ePub and Kindle
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author | : Santanu Chattopadhyay |
Publisher | : CRC Press |
Total Pages | : 86 |
Release | : 2018-04-24 |
Genre | : Technology & Engineering |
ISBN | : 1351227769 |
Download Thermal-Aware Testing of Digital VLSI Circuits and Systems Book in PDF, ePub and Kindle
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Author | : |
Publisher | : |
Total Pages | : |
Release | : |
Genre | : |
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Download Low Power High Fault Coverage Test Techniques for Digital VLSI Circuits Book in PDF, ePub and Kindle
Testing of digital VLSI circuits entails many challenges as a consequence of rapid growth of semiconductor manufacturing technology and the unprecedented levels of design complexity and the gigahertz range of operating frequencies. These challenges include keeping the average and peak power dissipation and test application time within acceptable limits. This dissertation proposes techniques to addresses these challenges during test. The first proposed technique, called bit-swapping LFSR (BS-LFSR), uses new observations concerning the output sequence of an LFSR to design a low-transition test-pattern-generator (TPG) for test-per-clock built-in self-test (BIST) to achieve reduction in the overall switching activity in the circuit-under-test (CUT). The obtained results show up to 28% power reduction for the proposed design, and up-to 63% when it is combined with another established technique. The proposed BS-LFSR is then extended for use in test-per-scan BIST. The results obtained while scanning in test vectors show up to 60% reduction in average power consumption. The BS-LFSR is then extended further to act as a multi-degree smoother for test patterns generated by conventional LFSRs before applying them to the CUT. Experimental results show up to 55% reduction in average power. Another technique that aims to reduce peak power in scan-based BIST is presented. The new technique uses a two-phase scan-chain ordering algorithm to reduce average and peak power in scan and capture cycles. Experimental results show up to 65% and 55% reduction in average and peak power, respectively. Finally, a technique that aims to significantly increase the fault coverage in test-per-scan BIST, while keeping the test-application time short, is proposed. The results obtained show a significant improvement in fault coverage and test application time compared with other techniques.
Author | : Gianluca Tempesti |
Publisher | : Springer Science & Business Media |
Total Pages | : 406 |
Release | : 2010-08-30 |
Genre | : Computers |
ISBN | : 3642153224 |
Download Evolvable Systems: From Biology to Hardware Book in PDF, ePub and Kindle
Biology has inspired electronics from the very beginning: the machines that we now call computers are deeply rooted in biological metaphors. Pioneers such as Alan Turing and John von Neumann openly declared their aim of creating arti?cial machines that could mimic some of the behaviors exhibited by natural organisms. Unfortunately, technology had not progressed enough to allow them to put their ideas into practice. The 1990s saw the introduction of programmable devices, both digital (FP- GAs) and analogue (FPAAs). These devices, by allowing the functionality and the structure of electronic devices to be easily altered, enabled researchers to endow circuits with some of the same versatility exhibited by biological entities and sparked a renaissance in the ?eld of bio-inspired electronics with the birth of what is generally known as evolvable hardware. Eversince,the?eldhasprogressedalongwiththetechnologicalimprovements and has expanded to take into account many di?erent biological processes, from evolution to learning, from development to healing. Of course, the application of these processes to electronic devices is not always straightforward (to say the least!), but rather than being discouraged, researchers in the community have shown remarkable ingenuity, as demostrated by the variety of approaches presented at this conference and included in these proceedings.
Author | : Krzysztof Iniewski |
Publisher | : John Wiley & Sons |
Total Pages | : 632 |
Release | : 2012-04-17 |
Genre | : Technology & Engineering |
ISBN | : 1118181476 |
Download Advanced Circuits for Emerging Technologies Book in PDF, ePub and Kindle
The book will address the-state-of-the-art in integrated circuit design in the context of emerging systems. New exciting opportunities in body area networks, wireless communications, data networking, and optical imaging are discussed. Emerging materials that can take system performance beyond standard CMOS, like Silicon on Insulator (SOI), Silicon Germanium (SiGe), and Indium Phosphide (InP) are explored. Three-dimensional (3-D) CMOS integration and co-integration with sensor technology are described as well. The book is a must for anyone serious about circuit design for future technologies. The book is written by top notch international experts in industry and academia. The intended audience is practicing engineers with integrated circuit background. The book will be also used as a recommended reading and supplementary material in graduate course curriculum. Intended audience is professionals working in the integrated circuit design field. Their job titles might be : design engineer, product manager, marketing manager, design team leader, etc. The book will be also used by graduate students. Many of the chapter authors are University Professors.
Author | : Hafizur Rahaman |
Publisher | : Springer |
Total Pages | : 427 |
Release | : 2012-06-26 |
Genre | : Computers |
ISBN | : 3642314945 |
Download Progress in VLSI Design and Test Book in PDF, ePub and Kindle
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.