Soc System On A Chip Testing For Plug And Play Test Automation PDF Download
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Author | : Krishnendu Chakrabarty |
Publisher | : Springer Science & Business Media |
Total Pages | : 202 |
Release | : 2013-04-17 |
Genre | : Technology & Engineering |
ISBN | : 1475765274 |
Download SOC (System-on-a-Chip) Testing for Plug and Play Test Automation Book in PDF, ePub and Kindle
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Author | : Krishnendu Chakrabarty |
Publisher | : |
Total Pages | : 199 |
Release | : 2002 |
Genre | : |
ISBN | : |
Download Special Issue on SOC (System-on-a-Chip) Testing for Plug and Play Test Automation Book in PDF, ePub and Kindle
Author | : Vikram Iyengar |
Publisher | : Springer Science & Business Media |
Total Pages | : 234 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461511135 |
Download Test Resource Partitioning for System-on-a-Chip Book in PDF, ePub and Kindle
Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.
Author | : Erik Larsson |
Publisher | : Springer Science & Business Media |
Total Pages | : 397 |
Release | : 2006-03-30 |
Genre | : Technology & Engineering |
ISBN | : 0387256245 |
Download Introduction to Advanced System-on-Chip Test Design and Optimization Book in PDF, ePub and Kindle
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author | : Érika Cota |
Publisher | : Springer Science & Business Media |
Total Pages | : 220 |
Release | : 2011-09-23 |
Genre | : Technology & Engineering |
ISBN | : 1461407915 |
Download Reliability, Availability and Serviceability of Networks-on-Chip Book in PDF, ePub and Kindle
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Author | : Dimitris Gizopoulos |
Publisher | : Springer Science & Business Media |
Total Pages | : 431 |
Release | : 2006-01-22 |
Genre | : Technology & Engineering |
ISBN | : 0387294090 |
Download Advances in Electronic Testing Book in PDF, ePub and Kindle
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Author | : Gloria Huertas Sánchez |
Publisher | : Springer Science & Business Media |
Total Pages | : 459 |
Release | : 2007-06-03 |
Genre | : Technology & Engineering |
ISBN | : 1402053150 |
Download Oscillation-Based Test in Mixed-Signal Circuits Book in PDF, ePub and Kindle
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.
Author | : Francisco da Silva |
Publisher | : Springer Science & Business Media |
Total Pages | : 297 |
Release | : 2006-09-15 |
Genre | : Technology & Engineering |
ISBN | : 0387346090 |
Download The Core Test Wrapper Handbook Book in PDF, ePub and Kindle
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.
Author | : Manoj Sachdev |
Publisher | : Springer Science & Business Media |
Total Pages | : 343 |
Release | : 2007-06-04 |
Genre | : Technology & Engineering |
ISBN | : 0387465472 |
Download Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Book in PDF, ePub and Kindle
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Author | : Alfredo Benso |
Publisher | : Springer Science & Business Media |
Total Pages | : 242 |
Release | : 2005-12-15 |
Genre | : Technology & Engineering |
ISBN | : 030648711X |
Download Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Book in PDF, ePub and Kindle
This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.