Silicon Nitride Silicon Dioxide And Emerging Dielectrics 11 PDF Download

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Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11

Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11
Author: Electrochemical society. Meeting
Publisher: The Electrochemical Society
Total Pages: 950
Release: 2011
Genre: Science
ISBN: 1566778654

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This issue of ECS Transactions contains the peer-reviewed full length papers of the International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics held May 1-6, 2011 in Montreal as a part of the 219th Meeting of The Electrochemical Society. The papers address a very diverse range of topics. In addition to the deposition and characterization of the dielectrics, more specific topics addressed by the papers include applications, device characterization and reliability, interface states, interface traps, defects, transistor and gate oxide studies, and modeling.


Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9

Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9
Author: Ram Ekwal Sah
Publisher: The Electrochemical Society
Total Pages: 863
Release: 2007
Genre: Dielectric films
ISBN: 1566775523

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This issue of ECS Transactions contains the papers presented in the symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films, and Emerging Dielectics held May 6-11, 2007 in Chicago. Papers were presented on deposition, characterization and applications of the dielectrics including high- and low-k dielectrics, as well as interface states, device characterization, reliabiliy and modeling.


Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 10

Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 10
Author: R. Ekwal Sah
Publisher: The Electrochemical Society
Total Pages: 871
Release: 2009
Genre: Dielectric films
ISBN: 1566777100

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The issue of ECS Transactions contains papers presented at the Tenth International Symposium on Silicon Nitride, Silicon Dioxide, and Alternate Emerging Dielectrics held in San Francisco on May 24-29, 2009. The papers address a very wide range of fabrication and characterization techniques, and applications of thin dielectric films in microelectronic and optoelectronic devices. More specific topics addressed by the papers include reliability, interface states, gate oxides, passivation, and dielctric breakdown.


Silicon Nitride and Silicon Dioxide Thin Insulating Films

Silicon Nitride and Silicon Dioxide Thin Insulating Films
Author: Electrochemical Society. Dielectric Science and Technology Division
Publisher: The Electrochemical Society
Total Pages: 304
Release: 2001
Genre: Science
ISBN: 9781566773133

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Charge-Trapping Non-Volatile Memories

Charge-Trapping Non-Volatile Memories
Author: Panagiotis Dimitrakis
Publisher: Springer
Total Pages: 215
Release: 2017-02-14
Genre: Technology & Engineering
ISBN: 3319487051

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This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced. Provides a comprehensive overview of the technology for charge-trapping non-volatile memories; Details new architectures and current modeling concepts for non-volatile memory devices; Focuses on conduction through multi-layer gate dielectrics stacks.