Scanning Probe Microscope For The Analysis Of Thermal And Electrical Properties Of Nanolaminates PDF Download

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Scanning Probe Microscope for the Analysis of Thermal and Electrical Properties of Nanolaminates

Scanning Probe Microscope for the Analysis of Thermal and Electrical Properties of Nanolaminates
Author:
Publisher:
Total Pages: 0
Release: 2001
Genre:
ISBN:

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Funding of $144,540 was received for the purchase of a special scanning probe microscope (SPM) through the Defense University Research Instrumentation Program (DURIP). These funds were used to purchase a new SPM and related hardware for the analysis of nanolaminate thin films. An AutoProbe CP SPM was purchased from Thermomicroscopes in Sunnyvale, California for $121,499. A Dektak3 Surface Profiler was also purchased from Veeco Metrology Group in Santa Barbara, California for $23,041. The instrumentation was received and installed and have been giving excellent results. This new instrumentation has significantly impacted our AFOSR-sponsored research and research-related education. The SPM and surface profilometer have greatly enhanced our ability to characterize the properties of nanolaminate thin films.


Scanning Probe Microscopy

Scanning Probe Microscopy
Author: Vijay Nalladega
Publisher: BoD – Books on Demand
Total Pages: 258
Release: 2012-04-27
Genre: Science
ISBN: 9535105760

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Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.


Scanning Probe Microscopy of Soft Matter

Scanning Probe Microscopy of Soft Matter
Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
Total Pages: 663
Release: 2011-12-19
Genre: Technology & Engineering
ISBN: 3527327436

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Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors


Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Author: Paula M. Vilarinho
Publisher: Springer Science & Business Media
Total Pages: 503
Release: 2006-06-15
Genre: Science
ISBN: 1402030193

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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.


Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 823
Release: 2010-12-17
Genre: Technology & Engineering
ISBN: 3642104975

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.


Scanning Probe Microscopy¿in Industrial Applications

Scanning Probe Microscopy¿in Industrial Applications
Author: Dalia G. Yablon
Publisher: John Wiley & Sons
Total Pages: 337
Release: 2013-10-24
Genre: Technology & Engineering
ISBN: 111872304X

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Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.


Scanning Probe Microscopy

Scanning Probe Microscopy
Author: Ernst Meyer
Publisher: Springer Science & Business Media
Total Pages: 236
Release: 2003-08-27
Genre: Science
ISBN: 9783540431800

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.


Scanning Probe Microscopy

Scanning Probe Microscopy
Author: Laurene Tetard
Publisher: American Chemical Society
Total Pages: 203
Release: 2023-05-22
Genre: Science
ISBN: 0841299579

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Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale. Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.


Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author: Bharat Bhushan
Publisher: Springer Science & Business Media
Total Pages: 634
Release: 2012-10-24
Genre: Science
ISBN: 3642254144

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.