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Author | : Michael Figueiredo |
Publisher | : Springer Science & Business Media |
Total Pages | : 189 |
Release | : 2012-08-24 |
Genre | : Technology & Engineering |
ISBN | : 146143467X |
Download Reference-Free CMOS Pipeline Analog-to-Digital Converters Book in PDF, ePub and Kindle
This book shows that digitally assisted analog to digital converters are not the only way to cope with poor analog performance caused by technology scaling. It describes various analog design techniques that enhance the area and power efficiency without employing any type of digital calibration circuitry. These techniques consist of self-biasing for PVT enhancement, inverter-based design for improved speed/power ratio, gain-of-two obtained by voltage sum instead of charge redistribution, and current-mode reference shifting instead of voltage reference shifting. Together, these techniques allow enhancing the area and power efficiency of the main building blocks of a multiplying digital-to-analog converter (MDAC) based stage, namely, the flash quantizer, the amplifier, and the switched capacitor network of the MDAC. Complementing the theoretical analyses of the various techniques, a power efficient operational transconductance amplifier is implemented and experimentally characterized. Furthermore, a medium-low resolution reference-free high-speed time-interleaved pipeline ADC employing all mentioned design techniques and circuits is presented, implemented and experimentally characterized. This ADC is said to be reference-free because it precludes any reference voltage, therefore saving power and area, as reference circuits are not necessary. Experimental results demonstrate the potential of the techniques which enabled the implementation of area and power efficient circuits.
Author | : Chen-Kai Hsu |
Publisher | : |
Total Pages | : 0 |
Release | : 2020 |
Genre | : |
ISBN | : |
Download Pipeline Analog-to-digital Converter Design in Scaled CMOS Technology Book in PDF, ePub and Kindle
Pipeline analog-to-digital converters (ADCs) are typically chosen for medium-to-high-resolution and high-bandwidth applications. Nevertheless, each generation of technology scaling, strongly driven by the demand for even more powerful digital computation capabilities, continuously entails a great challenge on the precision of the interstage gain in pipeline ADCs. The inaccurate interstage gain leads to the quantization leakage error in pipeline ADCs, which degrades the signal-to-noise-and-distortion ratio (SNDR) of pipeline ADCs. This dissertation demonstrates three techniques to address the inaccurate interstage gain in pipeline ADCs. To start with, an interstage gain error shaping (GES) technique is proposed. It can substantially suppress the in-band quantization leakage error in pipeline ADCs. It works for both closed-loop and open-loop amplification. It does not require extra clock phases, long convergence time, or an interruption of the digitization, incur large power or area overhead, or pose a constraint on the input signal. A two-stage pipeline successive-approximation-register (SAR) ADC equipped with the proposed second-order GES technique in 40-nm low-power (LP) CMOS technology achieves a 75.8-dB SNDR over 12.5-MHz bandwidth while operating at 100 MS/s and consuming 1.54 mW. It achieves a 174.9-dB Schreier figure of merit (FoM). The GES-related hardware only occupies less than 2% of the total active area. Next, an enhanced interstage GES technique that adopts a digital error feedback (DEF) method to address the truncation error in the prior implementation is proposed, which can extend the interstage gain error tolerance by five times. The proposed DEF technique does not introduce additional errors as it operates purely in the digital domain. In addition, a first-order passive quantization noise shaping (NS) technique that reduces the input-pair ratio of the two-input-pair comparator by 2.7 times is proposed. The proposed passive NS technique can alleviate the noise penalty caused by using a multiple-input-pair comparator. A two-stage pipeline SAR ADC equipped with the proposed techniques in 40-nm LP CMOS technology achieves a 77.1-dB SNDR over 6.25-MHz bandwidth while operating at 100 MS/s and consuming 1.38 mW. It achieves a 173.7-dB Schreier FoM. Finally, the use of foreground interstage gain calibration is demonstrated to address the inaccurate interstage gain in pipeline ADCs. It is implemented in a 13-bit 40-MS/s two-stage pipeline SAR ADC. The prototype ADC is designed for the phase-II readout electronics of the ATLAS liquid argon (LAr) calorimeter. To ensure its robustness under the harsh radioactive environment, several radiation-hardened techniques are implemented. To increase its yield, foreground digital-to-analog converter (DAC) mismatch calibration is also implemented. It is implemented in 65-nm LP CMOS technology. With the foreground calibration, it achieves an effective number of bits (ENOB) better than 11.2 bits over the bandwidth of interest while consuming 17.6 mW. Besides, on-chip high-speed reference buffers are deployed to avoid the need for large decoupling capacitors and provide stable reference voltages by tracking bandgap voltage references.
Author | : Yun Chiu |
Publisher | : Springer-Verlag New York Incorporated |
Total Pages | : 400 |
Release | : 2006-01-01 |
Genre | : Computers |
ISBN | : 9780387270395 |
Download Analysis and Design of Pipeline Analog-to-Digital Converters Book in PDF, ePub and Kindle
Presenting a treatment of the subject of the pipeline analog-to-digital converter (ADC), this book emphasizes implementation techniques using CMOS switched-capacitor circuits. The core materials of the textbook include architecture, circuit building blocks, practical limitations, consideration of precision, and calibration techniques.
Author | : Mikael Gustavsson |
Publisher | : Springer Science & Business Media |
Total Pages | : 378 |
Release | : 2006-04-18 |
Genre | : Technology & Engineering |
ISBN | : 0306473054 |
Download CMOS Data Converters for Communications Book in PDF, ePub and Kindle
CMOS Data Converters for Communications distinguishes itself from other data converter books by emphasizing system-related aspects of the design and frequency-domain measures. It explains in detail how to derive data converter requirements for a given communication system (baseband, passband, and multi-carrier systems). The authors also review CMOS data converter architectures and discuss their suitability for communications. The rest of the book is dedicated to high-performance CMOS data converter architecture and circuit design. Pipelined ADCs, parallel ADCs with an improved passive sampling technique, and oversampling ADCs are the focus for ADC architectures, while current-steering DAC modeling and implementation are the focus for DAC architectures. The principles of the switched-current and the switched-capacitor techniques are reviewed and their applications to crucial functional blocks such as multiplying DACs and integrators are detailed. The book outlines the design of the basic building blocks such as operational amplifiers, comparators, and reference generators with emphasis on the practical aspects. To operate analog circuits at a reduced supply voltage, special circuit techniques are needed. Low-voltage techniques are also discussed in this book. CMOS Data Converters for Communications can be used as a reference book by analog circuit designers to understand the data converter requirements for communication applications. It can also be used by telecommunication system designers to understand the difficulties of certain performance requirements on data converters. It is also an excellent resource to prepare analog students for the new challenges ahead.
Author | : Weitao Li |
Publisher | : Springer |
Total Pages | : 181 |
Release | : 2017-08-01 |
Genre | : Technology & Engineering |
ISBN | : 3319620126 |
Download High-Resolution and High-Speed Integrated CMOS AD Converters for Low-Power Applications Book in PDF, ePub and Kindle
This book is a step-by-step tutorial on how to design a low-power, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) integrated CMOS analog-to-digital (AD) converter, to respond to the challenge from the rapid growth of IoT. The discussion includes design techniques on both the system level and the circuit block level. In the architecture level, the power-efficient pipelined AD converter, the hybrid AD converter and the time-interleaved AD converter are described. In the circuit block level, the reference voltage buffer, the opamp, the comparator, and the calibration are presented. Readers designing low-power and high-performance AD converters won’t want to miss this invaluable reference. Provides an in-depth introduction to the newest design techniques for the power-efficient, high-resolution (not less than 12 bit), and high-speed (not less than 200 MSps) AD converter; Presents three types of power-efficient architectures of the high-resolution and high-speed AD converter; Discusses the relevant circuit blocks (i.e., the reference voltage buffer, the opamp, and the comparator) in two aspects, relaxing the requirements and improving the performance.
Author | : Chang-Hyuk Cho |
Publisher | : |
Total Pages | : |
Release | : 2005 |
Genre | : Analog-to-digital converters |
ISBN | : |
Download A Power Optimized Pipelined Analog-to-digital Converter Design in Deep Sub-micron CMOS Technology Book in PDF, ePub and Kindle
High-speed, medium-resolution, analog-to-digital converters (ADCs) are important building blocks in a wide range of applications. High-speed, medium-resolution ADCs have been implemented by various ADC architectures such as a folding ADC, a subranging ADC, and a pipeline ADC. Among them, pipeline ADCs have proven to be efficient architectures for applications such as digital communication systems, data acquisition systems and video systems. Especially, power dissipation is a primary concern in applications requiring portability. Thus, the objective of this work is to design and build a low-voltage low-power medium-resolution (8-10bits) high-speed pipeline ADC in deep sub-micron CMOS technology. The non-idealities of the circuit realization are carefully investigated in order to identify the circuit requirements for a low power circuit design of a pipeline ADC. The resolution per stage plays an important role in determining overall power dissipation of a pipeline ADC. The pros and cons of both large and small number of bits per-stage are examined. A power optimization algorithm is developed to decide more accurately which approach is better for lower power dissipation. Both identical and non-identical number of bit per-stage approaches are considered and their differences are analyzed. A low-power, low-voltage 10-bit 100Msamples/s pipeline ADC was designed and implemented in a 0.18mm CMOS process. The power consumption was minimized with the right selection of the per-stage resolution based on the result of the power optimization algorithm and by the scaling down the sampling capacitor size in subsequent stages.
Author | : Rudy J. van de Plassche |
Publisher | : Springer Science & Business Media |
Total Pages | : 628 |
Release | : 2013-04-17 |
Genre | : Technology & Engineering |
ISBN | : 1475737688 |
Download CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters Book in PDF, ePub and Kindle
CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes the requirements of input and signal reconstruction filtering in case a converter is applied into a signal processing system. CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters describes design details of high-speed A/D and D/A converters, high-resolution A/D and D/A converters, sample-and-hold amplifiers, voltage and current references, noise-shaping converters and sigma-delta converters, technology parameters and matching performance, comparators and limitations of comparators and finally testing of converters.
Author | : Kyung Ryun Kim |
Publisher | : Stanford University |
Total Pages | : 128 |
Release | : 2010 |
Genre | : |
ISBN | : |
Download Pipelined Analog-to-digital Conversion Using Class-AB Amplifiers Book in PDF, ePub and Kindle
In high-performance pipelined analog-to-digital converters (ADCs), the residue amplifiers dissipate the majority of the overall converter power. Therefore, finding alternatives to the relatively inefficient, conventional class-A circuit realization is an active area of research. One option for improvement is to employ class-AB amplifiers, which can, in principle, provide large drive currents on demand and improve the efficiency of residue amplification. Unfortunately, due to the simultaneous demand for high speed and high gain in pipelined ADCs, the improvements seen in class-AB designs have so far been limited. This dissertation presents the design of an efficient class-AB amplification scheme based on a pseudo-differential, single-stage and cascode-free architecture. Nonlinear errors due to finite DC gain are addressed using a deterministic digital background calibration that measures the circuit imperfections in time intervals between normal conversion cycles of the ADC. As a proof of concept, a 12-bit 30-MS/s pipelined ADC was realized using class-AB amplifiers with the proposed digital calibration. The prototype ADC occupies an active area of 0.36 mm2 in 90-nm CMOS. It dissipates 2.95 mW from a 1.2-V supply and achieves an SNDR of 64.5 dB for inputs near the Nyquist frequency. The corresponding figure of merit is 72 fJ/conversion-step.
Author | : David William Cline |
Publisher | : |
Total Pages | : 786 |
Release | : 1995 |
Genre | : |
ISBN | : |
Download Noise, Speed, and Power Tradeoffs in Pipelined Analog to Digital Converters Book in PDF, ePub and Kindle
Author | : Amir Zjajo |
Publisher | : Springer Science & Business Media |
Total Pages | : 311 |
Release | : 2010-10-29 |
Genre | : Technology & Engineering |
ISBN | : 9048197252 |
Download Low-Power High-Resolution Analog to Digital Converters Book in PDF, ePub and Kindle
With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.