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Recent Advances in Metrology

Recent Advances in Metrology
Author: Sanjay Yadav
Publisher: Springer Nature
Total Pages: 376
Release: 2022-07-27
Genre: Technology & Engineering
ISBN: 9811924686

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This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement.


Recent Advances in Metrology and Fundamental Constants

Recent Advances in Metrology and Fundamental Constants
Author: Terry J. Quinn
Publisher: IOS Press
Total Pages: 886
Release: 2001
Genre: Science
ISBN: 9781586031671

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Over the last decade of the 20th century, many improvements took place in the field of metrology and fundamental constants. These developments and improvements are discussed in this book. The old caesium SI second definition has found a new realization with the fountain approach, replacing the classical thermal atomic beam. The use of cold atom techniques, slowed down and cooled, has opened a number of unexpected avenues for metrology and fundamental constants, one of these possibilities being the atom interferometry. Another development was the demonstration of the possiblility of performing a direct frequency division in the visible, using short femtosecond pulses. Many other developments are also discussed.


Recent Advances in Metrology

Recent Advances in Metrology
Author: Sanjay Yadav
Publisher:
Total Pages: 0
Release: 2023
Genre:
ISBN: 9789811924699

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This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial application, automation and quality control. This book is aimed for all the personnel engaged in conformity assessment, quality system management, calibration and testing in all sectors of industry. The book will be a valuable reference for metrologists, scientists, engineers, academicians and students from research institutes and industrial establishments to explore the future directions in the areas of sensors, advance materials, measurement and quality improvement. .


Advances in Optical Form and Coordinate Metrology

Advances in Optical Form and Coordinate Metrology
Author: Richard Leach
Publisher:
Total Pages: 0
Release: 2020
Genre: Metrology
ISBN: 9780750325240

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Advances in Optical Form and Coordinate Metrology covers the latest advances in the development of optical form and coordinate measuring instruments plus the manipulation of point cloud data. The book presents some basic principles of the optical measurement methods and takes a deeper look at the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed include the drive towards faster instruments for in-process applications, the ability to measure highly complex objects (in e.g. additive manufacturing), performance verification and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.


Recent Advances in Metrology

Recent Advances in Metrology
Author: Sanjay Yadav
Publisher: Springer Nature
Total Pages: 225
Release: 2023-10-03
Genre: Technology & Engineering
ISBN: 9819945941

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This book presents the select proceedings of the 11th National Conference on Advances in Metrology (AdMet 2022). The book highlights and discusses the recent technological developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, digital transformation in metrology, among others. This book is aimed for those engaged in conformity assessment, quality system management, calibration, and testing in all sectors of industry. The book is a valuable reference for metrologists, scientists, engineers, academicians, and students from research institutes and industrial establishments to explore the future directions and research in the areas of sensors, advance materials, measurements, and quality improvement.


Recent Advances in Metrology and Fundamental Constants

Recent Advances in Metrology and Fundamental Constants
Author: T.J. Quinn
Publisher: IOS Press
Total Pages: 836
Release: 2001-12-18
Genre: Science
ISBN: 1614990026

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The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.


New Trends and Developments in Metrology

New Trends and Developments in Metrology
Author: Luigi Cocco
Publisher: BoD – Books on Demand
Total Pages: 294
Release: 2016-07-20
Genre: Technology & Engineering
ISBN: 9535124773

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Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.