Random Testing Of Digital Circuits PDF Download
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Author | : Rene David |
Publisher | : CRC Press |
Total Pages | : 508 |
Release | : 2020-11-26 |
Genre | : Technology & Engineering |
ISBN | : 1000146014 |
Download Random Testing of Digital Circuits Book in PDF, ePub and Kindle
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author | : Kenneth David Wagner |
Publisher | : |
Total Pages | : 492 |
Release | : 1986 |
Genre | : |
ISBN | : |
Download Digital Circuits Book in PDF, ePub and Kindle
Author | : Rene David |
Publisher | : CRC Press |
Total Pages | : 496 |
Release | : 2020-11-25 |
Genre | : Technology & Engineering |
ISBN | : 1000110168 |
Download Random Testing of Digital Circuits Book in PDF, ePub and Kindle
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author | : Hubert Alan Miller |
Publisher | : |
Total Pages | : 312 |
Release | : 1979 |
Genre | : Digital electronics |
ISBN | : |
Download Adaptive and Pseudo Random Testing of Digital Circuits Book in PDF, ePub and Kindle
Author | : David |
Publisher | : |
Total Pages | : |
Release | : 1998 |
Genre | : |
ISBN | : |
Download Random Testing of Digital Circuit ... Book in PDF, ePub and Kindle
Author | : B. R. Wilkins |
Publisher | : John Wiley & Sons |
Total Pages | : 216 |
Release | : 1986 |
Genre | : Digital electronics |
ISBN | : |
Download Testing Digital Circuits Book in PDF, ePub and Kindle
Author | : Francis C. Wong |
Publisher | : Elsevier |
Total Pages | : 248 |
Release | : 2012-12-02 |
Genre | : Technology & Engineering |
ISBN | : 0080504345 |
Download Digital Circuit Testing Book in PDF, ePub and Kindle
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author | : N. K. Jha |
Publisher | : Cambridge University Press |
Total Pages | : 1022 |
Release | : 2003-05-08 |
Genre | : Computers |
ISBN | : 9781139437431 |
Download Testing of Digital Systems Book in PDF, ePub and Kindle
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author | : Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory |
Publisher | : |
Total Pages | : 50 |
Release | : 1976 |
Genre | : |
ISBN | : |
Download Efficiency of compact testing for sequential circuits Book in PDF, ePub and Kindle
Compact testing uses random inputs to test digital circuits. Detection is achieved by comparison between some statistic property of the circuit under test, like the frequency of ones on the output line, and the same property for the fault-free circuit. This paper shows that compact testing can be used efficiently for sequential machines, although it has some inherent limitations. Synchronization is achieved by a long sequence of random inputs whose length is circuit dependent. However, for most sequential circuits, synchronization can be achieved in a few seconds. The great majority of failures inside the memory elements are easily detected even with short tests. Compact testing also detects most of the failures in the combinational parts. There, its efficiency is largely dependent upon the test length and also the characteristics of the random number generators. However, even the most subtle failures may be detected if the test has sufficient length. Some of the requirements and trade-offs to achieve efficient detection are presented.
Author | : Parag K. Lala |
Publisher | : Academic Press |
Total Pages | : 222 |
Release | : 1997 |
Genre | : Computers |
ISBN | : 9780124343306 |
Download Digital Circuit Testing and Testability Book in PDF, ePub and Kindle
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.