Progress In Nanoscale Characterization And Manipulation PDF Download
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Author | : Rongming Wang |
Publisher | : Springer |
Total Pages | : 508 |
Release | : 2018-08-30 |
Genre | : Science |
ISBN | : 9811304548 |
Download Progress in Nanoscale Characterization and Manipulation Book in PDF, ePub and Kindle
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Author | : |
Publisher | : |
Total Pages | : 665 |
Release | : 2017 |
Genre | : |
ISBN | : 9787301283066 |
Download 纳米表征与调控研究进展 Book in PDF, ePub and Kindle
本书为中外物理学精品书系中高瞻系列里的一部。是由国内著名物理学家用英文编写的专著。主要内容是介绍近些年我国在纳米结构表征及其调控研究的最新成果.
Author | : Hilmi Ünlü |
Publisher | : Springer Nature |
Total Pages | : 939 |
Release | : 2022-10-18 |
Genre | : Technology & Engineering |
ISBN | : 3030934608 |
Download Progress in Nanoscale and Low-Dimensional Materials and Devices Book in PDF, ePub and Kindle
This book describes most recent progress in the properties, synthesis, characterization, modelling, and applications of nanomaterials and nanodevices. It begins with the review of the modelling of the structural, electronic and optical properties of low dimensional and nanoscale semiconductors, methodology of synthesis, and characterization of quantum dots and nanowires, with special attention towards Dirac materials, whose electrical conduction and sensing properties far exceed those of silicon-based materials, making them strong competitors. The contributed reviews presented in this book touch on broader issues associated with the environment, as well as energy production and storage, while highlighting important achievements in materials pertinent to the fields of biology and medicine, exhibiting an outstanding confluence of basic physical science with vital human endeavor. The subjects treated in this book are attractive to the broader readership of graduate and advanced undergraduate students in physics, chemistry, biology, and medicine, as well as in electrical, chemical, biological, and mechanical engineering. Seasoned researchers and experts from the semiconductor/device industry also greatly benefit from the book’s treatment of cutting-edge application studies.
Author | : Sverre Myhra |
Publisher | : CRC Press |
Total Pages | : 353 |
Release | : 2012-06-12 |
Genre | : Science |
ISBN | : 1439854157 |
Download Characterization of Nanostructures Book in PDF, ePub and Kindle
The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale objects, as well as to ensembles of such objects. Section I: Techniques and Methods overviews the physical principles of the main techniques and describes those operational modes that are most relevant to nanoscale characterization. It provides sufficient technical detail so that readers and prospective users can gain an appreciation of the strengths and limitations of particular techniques. The section covers both mainstream and less commonly used techniques. Section II: Applications of Techniques to Structures of Different Dimensionalities and Functionalities deals with the methods for materials characterization of generic types of systems, using carefully chosen illustrations from the literature. Each chapter begins with a brief description of the materials and supplies a context for the methods for characterization. The volume concludes with a series of flow charts and brief descriptions of tactical issues. The authors focus on the needs of the research laboratory but also address those of quality control, industrial troubleshooting, and online analysis. Characterization of Nanostructures describes those techniques and their operational modes that are most relevant to nanoscale characterization. It is especially relevant to systems of different dimensionalities and functionalities. The book builds a bridge between generalists, who play vital roles in the post-disciplinary area of nanotechnology, and specialists, who view themselves as more in the context of the discipline.
Author | : Zikang Tang |
Publisher | : Springer Science & Business Media |
Total Pages | : 246 |
Release | : 2007-11-22 |
Genre | : Technology & Engineering |
ISBN | : 0387730486 |
Download Nanoscale Phenomena Book in PDF, ePub and Kindle
This book collects selected lectures from the Third Workshop of the Croucher Advanced Study Institute on Nano Science and Technology, and showcases contributions from world-renowned researchers. The book presents in-depth articles on the latest developments in nanomaterials and nanotechnology, and provides a cross-disciplinary perspective covering physics and biophysics, chemistry, materials science, and engineering.
Author | : Osvaldo de Oliveira Jr |
Publisher | : William Andrew |
Total Pages | : 224 |
Release | : 2017-03-18 |
Genre | : Technology & Engineering |
ISBN | : 0323497799 |
Download Nanocharacterization Techniques Book in PDF, ePub and Kindle
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers
Author | : Seungbum Hong |
Publisher | : Springer Science & Business Media |
Total Pages | : 294 |
Release | : 2013-11-27 |
Genre | : Technology & Engineering |
ISBN | : 1441990445 |
Download Nanoscale Phenomena in Ferroelectric Thin Films Book in PDF, ePub and Kindle
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.
Author | : N. John Dinardo |
Publisher | : Wiley-VCH Verlag GmbH |
Total Pages | : 280 |
Release | : 2000 |
Genre | : Interfaces (Physical sciences) |
ISBN | : 9783527298389 |
Download Nanoscale Characterization of Surfaces and Interfaces Book in PDF, ePub and Kindle
Derived from the highly acclaimed series, Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of their physics and technology and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the associated processes. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
Author | : Ehrenfried Zschech |
Publisher | : MDPI |
Total Pages | : 140 |
Release | : 2021-09-01 |
Genre | : Science |
ISBN | : 3036507566 |
Download Characterization of Nanomaterials Book in PDF, ePub and Kindle
This Special Issue “Characterization of Nanomaterials” collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium “Materials challenges—Micro- and nanoscale characterization”, it covered various topics of nanoscale materials characterization along the whole value and innovation chain, from fundamental research up to industrial applications. The scope of this Special Issue is to provide an overview of the current status, recent developments and research activities in the field of nanoscale materials characterization, with a particular emphasis on future scenarios. Primarily, analytical techniques for the characterization of thin films and nanostructures are discussed, including modeling and simulation. We anticipate that this Special Issue will be accessible to a wide audience, as it explores not only methodical aspects of nanoscale materials characterization, but also materials synthesis, fabrication of devices and applications.
Author | : Javier Piqueras |
Publisher | : |
Total Pages | : 456 |
Release | : 2003-03-27 |
Genre | : Science |
ISBN | : |
Download Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures: Volume 738 Book in PDF, ePub and Kindle
A primary driver of progress in nanoscience and technology is the continuing advances in the ability to measure structure, and particularly properties, at spatially localized scales. From the point of view of characterization, it is worth mentioning advances in the interpretation of processes in semiconductors, the ability to observe and manipulate metal, carbon and silicon nanowires and nanodots, and studies in molecular self-assembly. The papers in this book fall into two categories - those addressing classes of characterization techniques that emphasize how the combination of theoretical, experimental, and instrumentational developments lead to new capabilities in nanoscale characterization, and those focused on the use of various spatially localized approaches on a single phenomenon or materials issue. Topics include: characterization with electron optics; novel measurements of nanoscale properties; size-dependent behavior of nanoparticles; biological systems at the nanoscale; processing and properties of nanowires and heterostructures; and local phenomena in materials and microstructures.