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X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science
Author: Gubicza, Jen?
Publisher: IGI Global
Total Pages: 359
Release: 2014-03-31
Genre: Technology & Engineering
ISBN: 1466658533

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.


Profile Analysis

Profile Analysis
Author: David Marvin Green
Publisher: Oxford University Press, USA
Total Pages: 145
Release: 1988
Genre: Auditory perception
ISBN: 0195049489

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This book reviews recent research on the ability of human listeners to discern changes in the shape of complex acoustic spectra - what is known as auditory profile analysis.


Statistical Analysis of Profile Monitoring

Statistical Analysis of Profile Monitoring
Author: Rassoul Noorossana
Publisher: John Wiley & Sons
Total Pages: 298
Release: 2011-09-09
Genre: Technology & Engineering
ISBN: 1118071972

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A one-of-a-kind presentation of the major achievements in statistical profile monitoring methods Statistical profile monitoring is an area of statistical quality control that is growing in significance for researchers and practitioners, specifically because of its range of applicability across various service and manufacturing settings. Comprised of contributions from renowned academicians and practitioners in the field, Statistical Analysis of Profile Monitoring presents the latest state-of-the-art research on the use of control charts to monitor process and product quality profiles. The book presents comprehensive coverage of profile monitoring definitions, techniques, models, and application examples, particularly in various areas of engineering and statistics. The book begins with an introduction to the concept of profile monitoring and its applications in practice. Subsequent chapters explore the fundamental concepts, methods, and issues related to statistical profile monitoring, with topics of coverage including: Simple and multiple linear profiles Binary response profiles Parametric and nonparametric nonlinear profiles Multivariate linear profiles monitoring Statistical process control for geometric specifications Correlation and autocorrelation in profiles Nonparametric profile monitoring Throughout the book, more than two dozen real-world case studies highlight the discussed topics along with innovative examples and applications of profile monitoring. Statistical Analysis of Profile Monitoring is an excellent book for courses on statistical quality control at the graduate level. It also serves as a valuable reference for quality engineers, researchers and anyone who works in monitoring and improving statistical processes.


Thin Film and Depth Profile Analysis

Thin Film and Depth Profile Analysis
Author: H. Oechsner
Publisher: Springer Science & Business Media
Total Pages: 214
Release: 2013-03-08
Genre: Technology & Engineering
ISBN: 3642464998

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The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.


Handbook of Methodological Approaches to Community-based Research

Handbook of Methodological Approaches to Community-based Research
Author: Leonard Jason
Publisher: Oxford University Press
Total Pages: 409
Release: 2016
Genre: Education
ISBN: 0190243651

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The Handbook of Methodological Approaches to Community-Based Research is intended to aid the community-oriented researcher in learning about and applying cutting-edge quantitative, qualitative, and mixed methods approaches.


Cam Profile Analysis and Simulation using Synthetic Curves

Cam Profile Analysis and Simulation using Synthetic Curves
Author: Swarn Prakash Mall
Publisher: Swarn Prakash Mall
Total Pages: 124
Release: 2013-09-28
Genre: Science
ISBN:

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Cam follower mechanisms are versatile mechanisms for obtaining complex motion outputs. Cams are also having vast range of applications due to their flexibility in operations, as they may easily be replaced, are adjustable and changeable for timing or for different motion requirements. The kinematic behavior of follower establishes the basic suitability of cam for the given application. The cam profile curves are mainly responsible, at the core, for proper operation of the cam follower mechanism, as they are the main input of the cam follower system. Synthetic curves, which are generated, parametrically, through a set of known data points with desired number of curve segments, may be proved to be a major improvement over the traditional trigonometric and polynomial cam profile curves. In present work Hermite and Bèzier curves are studied for their effect on the kinematic behavior of follower, when used as cam profile curves. Both the curves are generated by varying their different curve parameters, viz. length and direction of tangent vector for Hermite curves, and number of control points with their different positions for Bèzier curves. The kinematic behavior of follower is simulated for cam profiles using these synthetic curves in MATLAB. The resulting follower displacements, velocities, accelerations and jerks are analyzed and comparative study is performed with the kinematic behavior of cycloidal cam profile. It is observed that the Hermite curve, when used as a cam profile, has caused 28.32% improved (i.e. reduced) maximum acceleration of follower than that obtained for cycloidal curve, while deviating from cycloidal cam profile by a maximum instantaneous difference in displacement of follower by 4.95 %. At the same time Bèzier curve has facilitated continuous jerk of follower, which is not, at all, possible by using a cycloidal curve. Thus, it is finally concluded that the synthetic curves, when used as cam profile, are providing better kinematic behaviour of cam follower mechanism, with lower maximum velocities, lower maximum accelerations, and lower maximum values of other undesirable higher order kinematic characteristic terms with the flexibility of shape control and better support for CAD/CAM applications. This Ebook is a master's dissertation on 'Cam Profile Analysis and Simulation using Synthetic Curves' submitted in September, 2013.


Diffraction Analysis of the Microstructure of Materials

Diffraction Analysis of the Microstructure of Materials
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
Total Pages: 557
Release: 2013-11-21
Genre: Science
ISBN: 3662067234

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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.


Meta-analysis of Binary Data Using Profile Likelihood

Meta-analysis of Binary Data Using Profile Likelihood
Author: Dankmar Bohning
Publisher: CRC Press
Total Pages: 207
Release: 2008-03-27
Genre: Mathematics
ISBN: 1420011332

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Providing reliable information on an intervention effect, meta-analysis is a powerful statistical tool for analyzing and combining results from individual studies. Meta-Analysis of Binary Data Using Profile Likelihood focuses on the analysis and modeling of a meta-analysis with individually pooled data (MAIPD). It presents a unifying approac