Process Variations And Probabilistic Integrated Circuit Design PDF Download
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Author | : Manfred Dietrich |
Publisher | : Springer Science & Business Media |
Total Pages | : 261 |
Release | : 2011-11-20 |
Genre | : Technology & Engineering |
ISBN | : 1441966218 |
Download Process Variations and Probabilistic Integrated Circuit Design Book in PDF, ePub and Kindle
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Author | : Victor Champac |
Publisher | : Springer |
Total Pages | : 195 |
Release | : 2018-04-18 |
Genre | : Technology & Engineering |
ISBN | : 3319754653 |
Download Timing Performance of Nanometer Digital Circuits Under Process Variations Book in PDF, ePub and Kindle
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
Author | : Amith Singhee |
Publisher | : Springer Science & Business Media |
Total Pages | : 254 |
Release | : 2010-09-09 |
Genre | : Technology & Engineering |
ISBN | : 1441966064 |
Download Extreme Statistics in Nanoscale Memory Design Book in PDF, ePub and Kindle
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5–6s (0.
Author | : Vasilis F. Pavlidis |
Publisher | : Newnes |
Total Pages | : 770 |
Release | : 2017-07-04 |
Genre | : Technology & Engineering |
ISBN | : 0124104843 |
Download Three-Dimensional Integrated Circuit Design Book in PDF, ePub and Kindle
Three-Dimensional Integrated Circuit Design, Second Eition, expands the original with more than twice as much new content, adding the latest developments in circuit models, temperature considerations, power management, memory issues, and heterogeneous integration. 3-D IC experts Pavlidis, Savidis, and Friedman cover the full product development cycle throughout the book, emphasizing not only physical design, but also algorithms and system-level considerations to increase speed while conserving energy. A handy, comprehensive reference or a practical design guide, this book provides effective solutions to specific challenging problems concerning the design of three-dimensional integrated circuits. Expanded with new chapters and updates throughout based on the latest research in 3-D integration: Manufacturing techniques for 3-D ICs with TSVs Electrical modeling and closed-form expressions of through silicon vias Substrate noise coupling in heterogeneous 3-D ICs Design of 3-D ICs with inductive links Synchronization in 3-D ICs Variation effects on 3-D ICs Correlation of WID variations for intra-tier buffers and wires Offers practical guidance on designing 3-D heterogeneous systems Provides power delivery of 3-D ICs Demonstrates the use of 3-D ICs within heterogeneous systems that include a variety of materials, devices, processors, GPU-CPU integration, and more Provides experimental case studies in power delivery, synchronization, and thermal characterization
Author | : Trent McConaghy |
Publisher | : Springer Science & Business Media |
Total Pages | : 198 |
Release | : 2012-10-02 |
Genre | : Technology & Engineering |
ISBN | : 1461422698 |
Download Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide Book in PDF, ePub and Kindle
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
Author | : Siddharth Garg |
Publisher | : |
Total Pages | : 75 |
Release | : 2013 |
Genre | : Integrated circuits |
ISBN | : 9781601986597 |
Download Addressing Process Variations at the Microarchitecture and System Level Book in PDF, ePub and Kindle
Author | : Martin Wirnshofer |
Publisher | : Springer Science & Business Media |
Total Pages | : 91 |
Release | : 2013-02-15 |
Genre | : Technology & Engineering |
ISBN | : 9400761961 |
Download Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits Book in PDF, ePub and Kindle
Increasing performance demands in integrated circuits, together with limited energy budgets, force IC designers to find new ways of saving power. One innovative way is the presented adaptive voltage scaling scheme, which tunes the supply voltage according to the present process, voltage and temperature variations as well as aging. The voltage is adapted “on the fly” by means of in-situ delay monitors to exploit unused timing margin, produced by state-of-the-art worst-case designs. This book discusses the design of the enhanced in-situ delay monitors and the implementation of the complete control-loop comprising the monitors, a control-logic and an on-chip voltage regulator. An analytical Markov-based model of the control-loop is derived to analyze its robustness and stability. Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits provides an in-depth assessment of the proposed voltage scaling scheme when applied to an arithmetic and an image processing circuit. This book is written for engineers interested in adaptive techniques for low-power CMOS circuits.
Author | : Fang Gong |
Publisher | : |
Total Pages | : 118 |
Release | : 2012 |
Genre | : |
ISBN | : |
Download Stochastic Modeling and Analysis of Custom Integrated Circuits Book in PDF, ePub and Kindle
In the past few decades, the semiconductor industry kept shrinking the feature size of CMOS transistors with great efforts in order to pack more functional devices onto a smaller footprint, which follows the famous Moore's law. However, it becomes extremely difficult to ensure the correct functionalities of fabricated circuits in today's integrated circuit (IC) technology, because the increasing variations from the manufacturing have introduced inevitable and significant uncertainties in circuit performance. Moreover, the requirements of lower power consumption and higher operating frequency for today's mobile devices demand tighter performance constraints on fabricated circuits. Therefore, reliable and efficient statistical analysis methodologies are highly sought to enable IC designers to predict the stochastic behavior in fabricated circuits under random process variations before entering expensive manufacturing. In this research, the impacts of process variations are studied in the contexts of failure analysis of memory circuits, stochastic behavioral modeling and variational capacitance extraction and novel solutions to these contexts are presented. In particular, memory circuits require an extremely small failure probability for one single cell due to their high replication count on a small footprint, thereby making it a great challenging task to provide accurate estimations. To this end, an improved importance sampling algorithm is proposed to significantly expedite the convergence rate of failure probability estimation for memory circuits without compromising accuracy. For high dimensional problems, the conventional importance sampling schemes tend to lose accuracy and become very unreliable. To fix this issue, a novel and fast statistical analysis is presented to estimate the extremely small failure probability of memory circuits in high dimensions. In addition, an efficient statistical analysis is proposed to explore the stochastic behavior of circuit designs due to random process variations. This methodology enables IC designers to accurately predict the "arbitrary" probabilistic distribution of circuit performance considering the uncertainties from the manufacturing. Lastly, parasitic capacitance has more impact on circuit performance in today's sub-micron CMOS technology, which leads to unpredictable delay variations and severe timing errors. To address this issue, a novel and fast capacitance extraction algorithm is proposed to model the geometric variations of interconnect circuits and accurately calculate the variational parasitic capacitance. These stochastic modeling and analysis methodologies can be used to analyze custom circuits under process variations in the present nano-technology era and future generations of IC technology.
Author | : Jian Cheng Zhang |
Publisher | : Springer Science & Business Media |
Total Pages | : 244 |
Release | : 2013-03-09 |
Genre | : Technology & Engineering |
ISBN | : 1461522250 |
Download Yield and Variability Optimization of Integrated Circuits Book in PDF, ePub and Kindle
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.
Author | : Victor Champac |
Publisher | : Springer |
Total Pages | : 185 |
Release | : 2019-01-12 |
Genre | : Technology & Engineering |
ISBN | : 9783030092399 |
Download Timing Performance of Nanometer Digital Circuits Under Process Variations Book in PDF, ePub and Kindle
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.