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| Author | : |
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| Total Pages | : 244 |
| Release | : 2012 |
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| ISBN | : 9781467330428 |
| Author | : |
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| Total Pages | : |
| Release | : 2012 |
| Genre | : Fault-tolerant computing |
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| Author | : |
| Publisher | : |
| Total Pages | : 236 |
| Release | : 2015 |
| Genre | : Integrated circuits |
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| Author | : |
| Publisher | : ASM International |
| Total Pages | : |
| Release | : 2018-12-01 |
| Genre | : |
| ISBN | : 1627080996 |
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
| Author | : |
| Publisher | : |
| Total Pages | : 304 |
| Release | : 2014 |
| Genre | : Fault-tolerant computing |
| ISBN | : 9781479961559 |
| Author | : Jimson Mathew |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 347 |
| Release | : 2013-09-07 |
| Genre | : Technology & Engineering |
| ISBN | : 1461441935 |
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.
| Author | : IEEE Staff |
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| Total Pages | : |
| Release | : 2016-09-19 |
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| ISBN | : 9781509036240 |
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
| Author | : |
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| Total Pages | : 482 |
| Release | : 2011 |
| Genre | : Fault-tolerant computing |
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| Release | : 2016 |
| Genre | : Integrated circuits |
| ISBN | : 9781509036233 |
| Author | : Vanderlei Bonato |
| Publisher | : Springer |
| Total Pages | : 374 |
| Release | : 2016-03-15 |
| Genre | : Computers |
| ISBN | : 331930481X |
This book constitutes the refereed proceedings of the 12th International Symposium on Applied Reconfigurable Computing, ARC 2016, held in Rio de Janeiro, Brazil, in March 2016. The 20 full papers presented in this volume were carefully reviewed and selected from 47 submissions. They are organized in topical headings named: video and image processing; fault-tolerant systems; tools and architectures; signal processing; and multicore systems. In addition, the book contains 3 invited papers and 8 poster papers on funded RD running and completed projects.
