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Practical Guide to Apertureless Optical Scanning Microscopy

Practical Guide to Apertureless Optical Scanning Microscopy
Author: Vladimir Protasenko
Publisher: LAP Lambert Academic Publishing
Total Pages: 116
Release: 2009-02-23
Genre:
ISBN: 9783838300108

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It is always challenging to break the rules, especially in such well established discipline as the optics is. One superstition, saying that optical resolution is limited by optical wavelength and by optics quality, has fallen two decades ago. In early 90's Wickramasinghe et al. have realized [1,2] that incident optical field can be concentrated by sharp protrusions and that tip curvature (not a light wavelength) will determine then actual optical resolution. Originally applied for elastic scattering signal with demonstration of sub-nanometer lateral resolution, this fruitful idea was implemented later in JILA (Boulder, Colorado, USA) in emission studies of single quantum dots and molecules. In 2004, 10-20 times emission enhancement and 20-30 nm spatial optical resolution have been demonstrated on single fluorophores. With a detail description of the project provided in this brochure you can also achieve such unprecedent parameters in your optical lab.


A Practical Guide to Optical Microscopy

A Practical Guide to Optical Microscopy
Author: John Girkin
Publisher: CRC Press
Total Pages: 247
Release: 2019-06-14
Genre: Science
ISBN: 1351630350

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Choice Recommended Title, March 2020 Optical microscopy is used in a vast range of applications ranging from materials engineering to in vivo observations and clinical diagnosis, and thanks to the latest advances in technology, there has been a rapid growth in the number of methods available. This book is aimed at providing users with a practical guide to help them select, and then use, the most suitable method for their application. It explores the principles behind the different forms of optical microscopy, without the use of complex maths, to provide an understanding to help the reader utilise a specific method and then interpret the results. Detailed physics is provided in boxed sections, which can be bypassed by the non-specialist. It is an invaluable tool for use within research groups and laboratories in the life and physical sciences, acting as a first source for practical information to guide less experienced users (or those new to a particular methodology) on the range of techniques available. Features: The first book to cover all current optical microscopy methods for practical applications Written to be understood by a non-optical expert with inserts to provide the physical science background Brings together conventional widefield and confocal microscopy, with advanced non-linear and super resolution methods, in one book To learn more about the author please visit here.


Super-Resolution Microscopy

Super-Resolution Microscopy
Author: Udo J. Birk
Publisher: John Wiley & Sons
Total Pages: 405
Release: 2017-12-04
Genre: Science
ISBN: 3527341331

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This unique book on super-resolution microscopy techniques presents comparative, in-depth analyses of the strengths and weaknesses of the individual approaches. It was written for non-experts who need to understand the principles of super-resolution or who wish to use recently commercialized instruments as well as for professionals who plan to realize novel microscopic devices. Explaining the practical requirements in terms of hardware, software and sample preparation, the book offers a wealth of hands-on tips and practical tricks to get a setup running, provides invaluable help and support for successful data acquisition and specific advice in the context of data analysis and visualization. Furthermore, it addresses a wide array of transdisciplinary fields of applications. The author begins by outlining the joint efforts that have led to achieving super-resolution microscopy combining advances in single-molecule photo-physics, fluorophore design and fluorescent labeling, instrument design and software development. The following chapters depict and compare current main standard techniques such as structured illumination microscopy, single-molecule localization, stimulated emission depletion microscopy and multi-scale imaging including light-sheet and expansion microscopy. For each individual approach the experimental setups are introduced, the imaging protocols are provided and the various applications illustrated. The book concludes with a discussion of future challenges addressing issues of routine applications and further commercialization of the available methods. Guiding users in how to make choices for the design of their own experiments from scratch to promising application, this one-stop resource is intended for researchers in the applied sciences, from chemistry to biology and medicine to physics and engineering.


A Practical Guide to Scanning Probe Microscopy

A Practical Guide to Scanning Probe Microscopy
Author: Rebecca Howland
Publisher:
Total Pages: 74
Release: 1998-06
Genre:
ISBN: 9780788171260

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Provides basic information about scanning probe microscopes (SPMs), which are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, & spectacular three-dimensional imaging -- from atoms of silicon to micron-sized protrusions on the surface of a living cell. Issues covered in this handbook range from fundamental physics of SPMs to their practical capabilities & instrumentation. Examples of applications are included throughout the text, & several application-specific articles are listed at the end of each chapter.


Building Practical Apertureless Scanning Near-field Microscopy

Building Practical Apertureless Scanning Near-field Microscopy
Author: Muhammed Zeki Gungordu
Publisher:
Total Pages: 86
Release: 2010
Genre: Electronic dissertations
ISBN:

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The fundamental objective of this study is to establish a functional, practical apertureless type scanning near-field optical microscope, and to figure out the working mechanism behind it. Whereas a far-field microscope can measure the propagating field's components, this gives us little information about the features of the sample. The resolution is limited to about half of the wavelength of the illuminating light. On the other hand, the a-SNOM system enables achieving non-propagating components of the field, which provides more details about the sample's features. It is really difficult to measure because the amplitude of this field decays exponentially when the tip is moved away from the sample. The sharpness of the tip is the only limitation for resolution of the a-SNOM system. Consequently, the sharp tips are achieved by using electrochemical etching, and these tips are used to detect near-field signal. Separating the weak a-SNOM system signals from the undesired background signal, the higher demodulation background suppression is utilized by lock-in detection.


Confocal Scanning Optical Microscopy and Related Imaging Systems

Confocal Scanning Optical Microscopy and Related Imaging Systems
Author: Gordon S. Kino
Publisher: Academic Press
Total Pages: 353
Release: 1996-09-18
Genre: Science
ISBN: 008052978X

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This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications Discusses the theory and design of near-field optical microscopes Explains phase imaging in the scanning optical and interference microscopes