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Open Metrology Software

Open Metrology Software
Author: Soumajit Dutta
Publisher:
Total Pages: 282
Release: 2008
Genre:
ISBN:

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The objective of this thesis is to create an open interface software system for an existing UPCMM (Ultra Precision Coordinate Measuring Machine) using the I++DME specification so that the machine can be operated not only by its own application software but also by any other I++DME compliant software. The I++DME is a relatively new interface specification proposed by an international committee in response to the interchangeability problem that exists between different CMM hardware and software available on the market. The UPCMM, a three axes Cartesian CMM, was developed and manufactured by KODAK for their specific measurement purposes and is a comparatively new member to the Center for Precision Metrology's CMM family. The controller for this UPCMM is made up of industry-standard components, but at this time no software exists that supports the I++DME specification for these components. The work contained in this thesis includes understanding the working principle of the UPCMM machine, performing basic measurement operations to determine the present measurement capability and writing an operating manual for other CMM users, in addition to developing the new interface software so that the UPCMM can be operated by any I++DME compliant software. At the conclusion of these tasks, basic measurements are performed using the new I++DME interface and the results are compared with measurements taken by the original software (DeltaTau). The correlation of these results is one indication of the successful implementation of the I++DME interface.


National Semiconductor Metrology Program

National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)
Publisher:
Total Pages: 120
Release: 1997
Genre: Semiconductors
ISBN:

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National Semiconductor Metrology Program

National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)
Publisher:
Total Pages: 160
Release: 2000
Genre: Semiconductors
ISBN:

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Software Development Measurement Programs

Software Development Measurement Programs
Author: Miroslaw Staron
Publisher: Springer
Total Pages: 271
Release: 2018-07-13
Genre: Computers
ISBN: 3319918362

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This book seeks to promote the structured, standardized and accurate use of software measurement at all levels of modern software development companies. To do so, it focuses on seven main aspects: sound scientific foundations, cost-efficiency, standardization, value-maximization, flexibility, combining organizational and technical aspects, and seamless technology integration. Further, it supports companies in their journey from manual reporting to automated decision support by combining academic research and industrial practice. When scientists and engineers measure something, they tend to focus on two different things. Scientists focus on the ability of the measurement to quantify whatever is being measured; engineers, however, focus on finding the right qualities of measurement given the designed system (e.g. correctness), the system’s quality of use (e.g. ease of use), and the efficiency of the measurement process. In this book, the authors argue that both focuses are necessary, and that the two are complementary. Thus, the book is organized as a gradual progression from theories of measurement (yes, you need theories to be successful!) to practical, organizational aspects of maintaining measurement systems (yes, you need the practical side to understand how to be successful). The authors of this book come from academia and industry, where they worked together for the past twelve years. They have worked with both small and large software development organizations, as researchers and as measurement engineers, measurement program leaders and even teachers. They wrote this book to help readers define, implement, deploy and maintain company-wide measurement programs, which consist of a set of measures, indicators and roles that are built around the concept of measurement systems. Based on their experiences introducing over 40,000 measurement systems at over a dozen companies, they share essential tips and tricks on how to do it right and how to avoid common pitfalls.


Information Modeling for Interoperable Dimensional Metrology

Information Modeling for Interoperable Dimensional Metrology
Author: Y Zhao
Publisher: Springer Science & Business Media
Total Pages: 380
Release: 2011-08-28
Genre: Technology & Engineering
ISBN: 1447121678

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Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity. Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.


A Practical Guide to Surface Metrology

A Practical Guide to Surface Metrology
Author: Michael Quinten
Publisher: Springer Nature
Total Pages: 247
Release: 2020-01-01
Genre: Technology & Engineering
ISBN: 3030294544

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This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.


Metrology and Theory of Measurement

Metrology and Theory of Measurement
Author: Valery A. Slaev
Publisher: Walter de Gruyter GmbH & Co KG
Total Pages: 481
Release: 2019-12-02
Genre: Science
ISBN: 3110651319

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Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.


Metrology and Instrumentation

Metrology and Instrumentation
Author: Samir Mekid
Publisher: John Wiley & Sons
Total Pages: 404
Release: 2021-12-29
Genre: Technology & Engineering
ISBN: 1119721733

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Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.


Advanced Mathematical And Computational Tools In Metrology Vii

Advanced Mathematical And Computational Tools In Metrology Vii
Author: Patrizia Ciarlini
Publisher: World Scientific
Total Pages: 384
Release: 2006-03-06
Genre: Mathematics
ISBN: 9814478504

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This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology.


Advanced Mathematical and Computational Tools in Metrology and Testing VIII

Advanced Mathematical and Computational Tools in Metrology and Testing VIII
Author: Franco Pavese
Publisher: World Scientific
Total Pages: 419
Release: 2009
Genre: Technology & Engineering
ISBN: 9812839526

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The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons.