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Design for Testability, Debug and Reliability

Design for Testability, Debug and Reliability
Author: Sebastian Huhn
Publisher: Springer Nature
Total Pages: 164
Release: 2021-04-19
Genre: Technology & Engineering
ISBN: 3030692094
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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Design for Testability, Debug and Reliability

Design for Testability, Debug and Reliability
Author: Sebastian Huhn
Publisher:
Total Pages: 0
Release: 2021
Genre:
ISBN: 9783030692100
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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

Fundamentals of Design of Experiments for Automotive Engineering Volume I

Fundamentals of Design of Experiments for Automotive Engineering Volume I
Author: Young J. Chiang
Publisher: SAE International
Total Pages: 358
Release: 2023-11-28
Genre: Computers
ISBN: 1468606026
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In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)

Electronic Design Automation

Electronic Design Automation
Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
Total Pages: 971
Release: 2009-03-11
Genre: Technology & Engineering
ISBN: 0080922007
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This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes

Real-Time Systems Design and Analysis

Real-Time Systems Design and Analysis
Author: Phillip A. Laplante
Publisher: Wiley-IEEE Press
Total Pages: 392
Release: 1997
Genre: Computers
ISBN:
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"IEEE Press is pleased to bring you this Second Edition of Phillip A. Laplante's best-selling and widely-acclaimed practical guide to building real-time systems. This book is essential for improved system designs, faster computation, better insights, and ultimate cost savings. Unlike any other book in the field, REAL-TIME SYSTEMS DESIGN AND ANALYSIS provides a holistic, systems-based approach that is devised to help engineers write problem-solving software. Laplante's no-nonsense guide to real-time system design features practical coverage of: Related technologies and their histories Time-saving tips * Hands-on instructions Pascal code Insights into decreasing ramp-up times and more!"

Software Testing and Analysis

Software Testing and Analysis
Author: Mauro Pezze
Publisher: John Wiley & Sons
Total Pages: 516
Release: 2008
Genre: Computers
ISBN:
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Teaches readers how to test and analyze software to achieve an acceptable level of quality at an acceptable cost Readers will be able to minimize software failures, increase quality, and effectively manage costs Covers techniques that are suitable for near-term application, with sufficient technical background to indicate how and when to apply them Provides balanced coverage of software testing & analysis approaches By incorporating modern topics and strategies, this book will be the standard software-testing textbook

Software Testing Techniques

Software Testing Techniques
Author: Boris Beizer
Publisher: Dreamtech Press
Total Pages: 572
Release: 2003
Genre: Computer software
ISBN: 9788177222609
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Software Testing Techniques, 2nd Edition is the first book-length work that explicitly addresses the idea that design for testability is as important as testing itself not just by saying that testability is a desirable goal, but by showing the reader how it to do it. Every chapter has testability guidelines that illustrate how the technique discussed in the chapter can be used to make software more easily tested and therefore more reliable and maintainable. Application of all techniques to unit, integration, maintenance, and system testing are discussed throughout this book.As a self-study text, as a classroom text, as a working reference, it is a book that no programmer, independent software tester, software engineer, testing theorist, system designer, or software project manager can be without.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
Author: Laung-Terng Wang
Publisher: Elsevier
Total Pages: 809
Release: 2006-08-14
Genre: Technology & Engineering
ISBN: 0080474799
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.