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Near Field Scanning Optical Microscopy(NSOM) of Nano Devices

Near Field Scanning Optical Microscopy(NSOM) of Nano Devices
Author: Chun Hong Low
Publisher:
Total Pages: 63
Release: 2008
Genre: Atomic force microscopy
ISBN:

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This thesis aims to investigate the optical properties of nano-devices using the technique of Near-Field Scanning Optical Microscopy (NSOM). A unique setup to perform Atomic Force Microscopy (AFM) and NSOM simultaneously in a scanning electron microscope (SEM) to collect spatially resolved luminescence and image transport on nano-scale structures, particularly nanowires, will allow direct determination of transport parameters, such as minority carrier mobility and diffusion length that are vital to the performance of optoelectronic devices. The work involves the development of a unique nano-scale imaging technique applicable to a wide range of structures. The main structures of interest in this thesis will be GaN nanowires. Instead of using a laser for generating charge for imaging, the e-beam from the SEM was used to generate localized charge for an NSOM probe to monitor the motion of the excess charge due to diffusion and/or drift via electron-hole recombination process. For the first time in this research, the author addressed numerous challenges such as the intricate NSOM technique to resolve sub-wavelength dimension measurements of the elements and determine optimized experimental parameters to compensate for the relatively low efficiency of NSOM optical collection. Of significance, transport imaging of 1-10 [micrometer] long GaN nanowires resulted in minority carrier diffusion lengths ranging from 1-2 [micrometer]. An initial experimental exploration was also conducted to determine the theoretical prediction of the unique transmission enhancement of Au nanobowties fabricated on luminescent GaAs heterostructure. The author will report the working principles, experimental procedures, optimal process parameters and the respective imaging results for assessing the properties of the nano-devices studied in this thesis work. Recommendations for future work pertaining to the augmentation of related NSOM work will also be made to ensure continued progress in this area of work.


Near-field Nano/Atom Optics and Technology

Near-field Nano/Atom Optics and Technology
Author: Motoichi Ohtsu
Publisher: Springer Science & Business Media
Total Pages: 309
Release: 2012-12-06
Genre: Science
ISBN: 4431679375

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Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.


Nano-optics and Near-field Optical Microscopy

Nano-optics and Near-field Optical Microscopy
Author: Anatoly V. Zayats
Publisher: Artech House
Total Pages: 379
Release: 2009
Genre: Science
ISBN: 1596932848

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"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.


Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Author: Gerd Kaupp
Publisher: Springer Science & Business Media
Total Pages: 302
Release: 2006-10-24
Genre: Technology & Engineering
ISBN: 3540284729

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.


A Near-field Optical Microscopy Nanoarray

A Near-field Optical Microscopy Nanoarray
Author:
Publisher:
Total Pages:
Release: 2001
Genre:
ISBN:

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Multiplexing near-field scanning optical microscopy (NSOM) by the use of a nanoarray with parallel imaging is studied. The fabrication, characterization, and utilization of nanoarrays with[approximately] 100 nm diameter apertures spaced 500 nm center-to- center is presented. Extremely uniform nanoarrays with[approximately] 10[sup 8] apertures were fabricated by electron beam lithography and reactive ion etching. The nanoarrays were characterized by atomic force microscopy (AFM) and scanning electron microscopy (SEM). In this paper we utilize these nanoarrays in a laser-illuminated microscope with parallel detection on a charge- coupled device (CCD). Detection of B-phycoerythrin (B-PE) molecules using near-field illumination is presented. In principle, our system can be used to obtain high lateral resolution NSOM images over a wide-field of view (e.g. 50-100[mu]m) within seconds.


Near-field Characterization of Photonic Nanodevices

Near-field Characterization of Photonic Nanodevices
Author: Maxim Abashin
Publisher: LAP Lambert Academic Publishing
Total Pages: 100
Release: 2009-08
Genre:
ISBN: 9783838307114

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The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signal-to-noise performance in near-field microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM) and applications of this approach to characterization of several classes of the photonic nanodevices.


Handbook of Microscopy for Nanotechnology

Handbook of Microscopy for Nanotechnology
Author: Nan Yao
Publisher: Springer Science & Business Media
Total Pages: 745
Release: 2006-07-12
Genre: Technology & Engineering
ISBN: 1402080069

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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.


Near-Field Nano-Optics

Near-Field Nano-Optics
Author: Motoichi Ohtsu
Publisher: Springer Science & Business Media
Total Pages: 397
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461548357

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Conventional optical science and technology have been restricted by the diffraction limit from reducing the sizes of optical and photoruc devices to nanometric dimensions. Thus, the size of optical integrated circuits has been incompatible with that of their counterpart, integrated electronic circuits, which have much smaller dimensions. This book provides potential ideas and methods to overcome this difficulty. Near-field optics has developed very rapidly from around the middle 1980s after preliminary trials in the microwave frequency region, as proposed as early as 1928. At the early stages of this development, most technical efforts were devoted to realizing super-high-resolution optical microscopy beyond the diffraction limit. However, the possibility of exploiting the optical near-field, phenomenon of quasistatic electromagnetic interaction at subwavelength distances between nanometric particles has opened new ways to nanometric optical science and technology, and many applications to nanometric fabrication and manipulation have been proposed and implemented. Building on this historical background, this book describes recent progress in near-field optical science and technology, mainly using research of the author's groups. The title of this book, Near-Field Nano-Optics-From Basic Principles to Nano-Fabrication and Nano-Photonics, implies capabilities of the optical near field not only for imaging/microscopy, but also for fabrication/manipulation/proc essing on a nanometric scale.


Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics

Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics
Author:
Publisher:
Total Pages: 12
Release: 1995
Genre:
ISBN:

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The main focus of our project is the further development and application of NSOM to studies of the local photophysical and photochemical properties of complex nanostructured materials. We are directly involved in the currently-rapid advance of NSOM methodologies and are especially interested in ultrafast time-resolved applications of NSOM. Our ultrafast NSOM currently allows for picosecond (and in the near future, femtosecond) time resolution to be obtained with nanometer-scale spatial resolution. In our experiments we are addressing questions pertaining to variations in excited state lifetimes, charge and energy transfer rates, and charge and energy transfer distances and directionality in highly nanostructured materials. These results are being employed along with static imaging and polarization-dependent imaging, as well as static spectroscopic measurements, to provide invaluable information on how nanoscale structural variations lead to variations in the important local photophysical and photochemical properties of numerous technologically-important, nanostructured samples. (MM).