Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Near Field Scanning Optical Microscopy Studies Of Cuingase2 Solar Cells PDF full book. Access full book title Near Field Scanning Optical Microscopy Studies Of Cuingase2 Solar Cells.
| Author | : Amanda Abeel McDaniel |
| Publisher | : |
| Total Pages | : 126 |
| Release | : 1997 |
| Genre | : |
| ISBN | : |
| Author | : Daniel Abou-Ras |
| Publisher | : John Wiley & Sons |
| Total Pages | : 760 |
| Release | : 2016-07-13 |
| Genre | : Science |
| ISBN | : 3527699015 |
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
| Author | : Dawn Bonnell |
| Publisher | : John Wiley & Sons |
| Total Pages | : 520 |
| Release | : 2000-12-05 |
| Genre | : Science |
| ISBN | : 047124824X |
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
| Author | : Ruskin Skidmore Freer |
| Publisher | : |
| Total Pages | : 674 |
| Release | : 1997 |
| Genre | : Science |
| ISBN | : |
| Author | : Ruskin Skidmore Freer |
| Publisher | : |
| Total Pages | : 416 |
| Release | : 1997 |
| Genre | : Science |
| ISBN | : |
| Author | : Mohamed Fadhali |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 390 |
| Release | : 2012-03-21 |
| Genre | : Technology & Engineering |
| ISBN | : 9535101536 |
The new emerging field of photonics has significantly attracted the interest of many societies, professionals and researchers around the world. The great importance of this field is due to its applicability and possible utilization in almost all scientific and industrial areas. This book presents some advanced research topics in photonics. It consists of 16 chapters organized into three sections: Integrated Photonics, Photonic Materials and Photonic Applications. It can be said that this book is a good contribution for paving the way for further innovations in photonic technology. The chapters have been written and reviewed by well-experienced researchers in their fields. In their contributions they demonstrated the most profound knowledge and expertise for interested individuals in this expanding field. The book will be a good reference for experienced professionals, academics and researchers as well as young researchers only starting their carrier in this field.
| Author | : Peter W. Hawkes |
| Publisher | : Academic Press |
| Total Pages | : 226 |
| Release | : 2007-07-18 |
| Genre | : Technology & Engineering |
| ISBN | : 0080549292 |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
| Author | : Materials Research Society. Meeting |
| Publisher | : |
| Total Pages | : 580 |
| Release | : 2005-11-09 |
| Genre | : Technology & Engineering |
| ISBN | : |
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
| Author | : Jian V. Li |
| Publisher | : CRC Press |
| Total Pages | : 320 |
| Release | : 2018-07-06 |
| Genre | : Science |
| ISBN | : 1351368443 |
Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, academia, national institutions, and industry, divided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. The first section establishes the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. The second section reviews the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. The third section details the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. The last section presents the latest advances in capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.
| Author | : International Workshop on Electromagnetic Nondestructive Evaluation |
| Publisher | : IOS Press |
| Total Pages | : 444 |
| Release | : 2009-07-20 |
| Genre | : Science |
| ISBN | : 1607504421 |
The 13th International Workshop on Electromagnetic Nondestructive Evaluation (ENDE) was held at the Seoul Education and Culture Center, Korea in June 2008. Electromagnetic Nondestructive Evaluation (XII) contains the proceedings of this workshop. 51 research papers present the latest research in topics ranging from ENDE in nuclear power plants, eddy current testing, modeling, material characterization, to inverse problem and imaging and the application of electromagnetic nondestructive techniques.
