Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Near Field Scanning Optical Microscopy Of Soft Organic Materials PDF full book. Access full book title Near Field Scanning Optical Microscopy Of Soft Organic Materials.
| Author | : Lynn Fong Lee |
| Publisher | : |
| Total Pages | : 242 |
| Release | : 2005 |
| Genre | : |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : 4 |
| Release | : 2000 |
| Genre | : |
| ISBN | : |
In this project, we requested funds from the Air Force of Scientific Research (AFOSR) under DOD's Defense University Research Instrumentation Program (DURIP) to acquire a near-field scanning optical microscope (NSOM). Near-field scanning optical microscope (NSOM) is a unique research tool commercialized in the past two years, which provides unprecedented optical resolution defying the diffraction limit, as small as 1/20 laterally and 1/100 vertically. The funds from AFOSR has enabled us to purchase and install a state-of-the-art NSOM from TopoMetric. We have successfully installed and tested the instrument. A number of experiments have been performed using the instrument. The NSOM has proved to be a powerful instrument which allows innovative new approaches to address fundamental issues and enhance the existing and future DOD sponsored research projects in the University of Rochester. The preliminary application of the NSOM has already demonstrated the great potential of NSOM, its value to DOD sponsored research, and its usefulness for training future scientists and engineers for the DOD interests.
| Author | : Vladimir V. Tsukruk |
| Publisher | : John Wiley & Sons |
| Total Pages | : 663 |
| Release | : 2012-01-09 |
| Genre | : Technology & Engineering |
| ISBN | : 3527639969 |
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors
| Author | : Xiao Wang |
| Publisher | : |
| Total Pages | : 140 |
| Release | : 2012 |
| Genre | : |
| ISBN | : |
| Author | : Courjon Daniel |
| Publisher | : World Scientific Publishing Company |
| Total Pages | : 340 |
| Release | : 2003-03-12 |
| Genre | : Science |
| ISBN | : 1911298968 |
Near-field optics studies the behaviour of light fields in the vicinity of matter, where light is structured in propagating and evanescent fields. Near-field optical microscopy is the straightforward application of near-field optics.This textbook provides an overview for undergraduates and anyone who has an interest in peculiar optical phenomena, and serves as a technical manual for engineers and researchers. It consists of 12 chapters dealing with the history of near-field optics, non-radiating optics, optical noise, inverse problems, theory, instrumentation and applications; there is an appendix including the basic elements of Fourier optics and Maxwell equations.
| Author | : Gerd Kaupp |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 302 |
| Release | : 2006-10-24 |
| Genre | : Technology & Engineering |
| ISBN | : 3540284729 |
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
| Author | : Eun-soo Kwak |
| Publisher | : |
| Total Pages | : 222 |
| Release | : 2002 |
| Genre | : Near-field microscopy |
| ISBN | : |
| Author | : Gordon S. Kino |
| Publisher | : Academic Press |
| Total Pages | : 353 |
| Release | : 1996-09-18 |
| Genre | : Science |
| ISBN | : 008052978X |
This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications Discusses the theory and design of near-field optical microscopes Explains phase imaging in the scanning optical and interference microscopes
| Author | : Anthony Louis Campillo |
| Publisher | : |
| Total Pages | : 264 |
| Release | : 2002 |
| Genre | : |
| ISBN | : |
| Author | : D.W. Pohl |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 426 |
| Release | : 2012-12-06 |
| Genre | : Science |
| ISBN | : 9401119783 |
Scanning near-field optical microscopy (SNOM, also known as NSOM) is a new local probe technique with a resolving power of 10--50 nm. Not being limited by diffraction, near-field optics (NFO) opens new perspectives for optical characterization and the understanding of optical phenomena, in particular in biology, microelectronics and materials science. SNOM, after first demonstrations in '83/'84, has undergone a rapid development in the past two to four years. The increased interest has been largely stimulated by the wealth of optical properties that can be investigated and the growing importance of characterization on the nanometer scale in general. Examples include the use of fluorescence, birefrigence and plasmon effects for applications in particular in biology, microelectronics and materials science, to name just a few. This volume emerged from the first international meeting devoted exclusively to NFO, and comprises a complete survey of the 1992 activities in the field, in particular the variety of instrumental techniques that are currently being explored, the demonstration of the imaging capabilities as well as theoretical interpretations - a highly nontrivial task. The comprehensive collection of papers devoted to these and related subjects make the book a valuable tool for anybody interested in near-field optics.
