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Nanoscale Calibration Standards and Methods

Nanoscale Calibration Standards and Methods
Author: Günter Wilkening
Publisher: John Wiley & Sons
Total Pages: 541
Release: 2006-05-12
Genre: Technology & Engineering
ISBN: 3527606874
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The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Nanoscale 2004

Nanoscale 2004
Author:
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Total Pages:
Release: 2004
Genre:
ISBN:
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Nanoscale 2013

Nanoscale 2013
Author:
Publisher:
Total Pages: 210
Release: 2013
Genre:
ISBN:
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Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy
Author: Petr Klapetek
Publisher: Elsevier
Total Pages: 418
Release: 2018-02-03
Genre: Science
ISBN: 0128133481
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Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

The Nano-Micro Interface

The Nano-Micro Interface
Author: Hans-Jörg Fecht
Publisher: John Wiley & Sons
Total Pages: 351
Release: 2006-03-06
Genre: Technology & Engineering
ISBN: 3527604332
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Two exciting worlds of science and technology - the nano and micro dimensions. The former is a booming new field of research, the latter the established size range for electronics, and for mutual technological benefit and future commercialization, suitable junctions need to be found. Functional nanostructures such as DNA computers, sensors, neural interfaces, nanooptics or molecular electronics need to be wired to their 'bigger' surroundings. Coming from the opposite direction, microelectronics have experienced an unprecedented miniaturization drive in the last decade, pushing ever further down through the micro size scale towards submicron circuitry. Bringing these two worlds together is a new interdisciplinary challenge for scientists and engineers alike - recognized and substantially funded by the European Commission and other major project initiators worldwide. This book offers a wide range of information from technologies to materials and devices as well as from research to administrative know-how collected by the editors from renowned key members of the nano/micro community.

Handbook of Surface and Nanometrology

Handbook of Surface and Nanometrology
Author: David J. Whitehouse
Publisher: CRC Press
Total Pages: 982
Release: 2002-12-01
Genre: Science
ISBN: 1420034197
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The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained wit

Nanotechnology Standards

Nanotechnology Standards
Author: Vladimir Murashov
Publisher: Springer Science & Business Media
Total Pages: 269
Release: 2011-02-01
Genre: Technology & Engineering
ISBN: 1441978534
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Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting

Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting
Author: Alexei Nazarov
Publisher: Springer
Total Pages: 464
Release: 2014-08-28
Genre: Technology & Engineering
ISBN: 3319088041
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This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between “More Moore” and “More than Moore” are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.

Scanning Probe Microscopy of Soft Matter

Scanning Probe Microscopy of Soft Matter
Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
Total Pages: 663
Release: 2012-01-09
Genre: Technology & Engineering
ISBN: 3527639969
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Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors