Nanometer Scale Defect Detection Using Polarized Light PDF Download

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Nanometer-scale Defect Detection Using Polarized Light

Nanometer-scale Defect Detection Using Polarized Light
Author: Pierre-Richard Dahoo
Publisher: John Wiley & Sons
Total Pages: 316
Release: 2016-08-22
Genre: Technology & Engineering
ISBN: 1848219369
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Nanometer-scale Defect Detection Using Polarized Light

Nanometer-scale Defect Detection Using Polarized Light
Author: Pierre-Richard Dahoo
Publisher: John Wiley & Sons
Total Pages: 321
Release: 2016-08-16
Genre: Technology & Engineering
ISBN: 1119329655
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Download Nanometer-scale Defect Detection Using Polarized Light Book in PDF, ePub and Kindle

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Applications and Metrology at Nanometer-Scale 2

Applications and Metrology at Nanometer-Scale 2
Author: Pierre-Richard Dahoo
Publisher: John Wiley & Sons
Total Pages: 288
Release: 2021-03-05
Genre: Science
ISBN: 1119818966
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Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum computing, which is based on two-level systems, makes it possible to manufacture computers with high computational power. This book provides essential knowledge and culminates with an industrial application of quantum engineering and nanotechnologies. It presents optical systems for measuring at the nanoscale, as well as quantum physics models that describe how a two-state system interacts with its environment. The concept of spin and its derivation from the Dirac equation is also explored, while theoretical foundations and example applications aid in understanding how a quantum gate works. Application of the reliability-based design optimization (RBDO) method of mechanical structures is implemented, in order to ensure reliability of estimates from the measurement of mechanical properties of carbon nanotube structures. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and MasterÂs students.

Applications and Metrology at Nanometer Scale 1

Applications and Metrology at Nanometer Scale 1
Author: Pierre-Richard Dahoo
Publisher: John Wiley & Sons
Total Pages: 256
Release: 2021-03-16
Genre: Technology & Engineering
ISBN: 1786306409
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To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Masters students.

Measurement Technology and Intelligent Instruments VI

Measurement Technology and Intelligent Instruments VI
Author: Yongsheng Gao
Publisher: Trans Tech Publications Ltd
Total Pages: 800
Release: 2005-10-15
Genre: Technology & Engineering
ISBN: 3038130222
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The requirements of high precision and of high-quality components and devices in meeting the needs of modern industry and society in disciplines such as semiconductors, optics, nanotechnology, MEMS, manufacturing, biomedical and environmental engineering, make measurement technology and intelligent instruments (which sense, measure and report), more important than ever, and essential for the rapid development of information technology. Following the lead of the previous five publications (1989, 1993, 1996, 1998, 2001) in the series, “Measurement Technology and Intelligent Instruments”, this book presents the most recent advances in this important field. In all, 123 papers were contributed from many regions of the world; including China, Taiwan (China), Japan, Russia, Hong Kong (China), Germany, Australia, Austria, Canada, Korea, Poland, Slovakia and the UK and US.

(Nanometer Scale Exciton Spectroscopy and Photochemistry

(Nanometer Scale Exciton Spectroscopy and Photochemistry
Author:
Publisher:
Total Pages: 6
Release: 1991
Genre:
ISBN:
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We have constructed a scanning near-field optical microscope. For this we developed subwavelength micropipette light sources containing photostable crystal tips. We have also developed a technique for pulling and metal coating for single mode optical fibers to give nanometer silica tips emitting polarized laser light. Clear images have been obtained of polymeric porous membranes with nanometer pore sizes of comparable quality to that of scanning electron microscopy, but without the need for a vacuum. This method is aimed at both transmission and fluorescence nanoscopy. We believe that at least one of these will be operational in the coming year. We have also made significant progress on the next stage: Scanning, Tunneling, Exciton Microscopy. This is based on direct energy transfer between the tip and the particular molecule or fluorophore in the sample. We expect this stage to be operational in the third year of the project. Preliminary near-field optical scans indicate our resolution is already in the nanometer range. 3 figs. (MHB).

Nanotechnology

Nanotechnology
Author: Norio Taniguchi
Publisher:
Total Pages: 432
Release: 1996
Genre: Science
ISBN:
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The manufacture of integrated circuits and opto- electronic devices, for example, calls for accuracies in the nanometre range (approximately three atomic lattice spacings). This book examines the technology and systems needed to achieve this level of accuracy. It is written by the leading researchers in Japan, that is the world leaders. The underlying concept of nanotechnology systems comes from the prediction that the extremely high accuracy required in materials processing will ultimately reach the order of 1nm (nanometer) = 0.001 m. Since the distance between lattice atoms is about 0.3 nm this constitutes the limit in resolution for measurable or confirmable lengths of solid materials. This leads directly to processing at the atomic bit level at which sub-nm resolution becomes necessary. This means that the accuracy and resolution of the positioning and measuring apparatus used in atomic bit processing must at least be on the order of sub-nm. Nanotechnology is thus concerned with integrated processing systems with measurement, position control, and processing technologies in the sub-nm range. This is essential in the fabrication of extremely precise and fine parts. fabrication of extremely precise and fine parts.