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Models in Hardware Testing

Models in Hardware Testing
Author: Hans-Joachim Wunderlich
Publisher: Springer Science & Business Media
Total Pages: 263
Release: 2009-11-12
Genre: Computers
ISBN: 9048132827

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.


Models in Hardware Testing

Models in Hardware Testing
Author: Hans-Joachim Wunderlich
Publisher: Springer
Total Pages: 257
Release: 2009-12-07
Genre: Computers
ISBN: 9789048132812

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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.


Digital Hardware Testing

Digital Hardware Testing
Author: Rochit Rajsuman
Publisher: Artech House on Demand
Total Pages: 317
Release: 1992-01-01
Genre: Technology & Engineering
ISBN: 9780890065808

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Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.


Model-Based Testing for Embedded Systems

Model-Based Testing for Embedded Systems
Author: Justyna Zander
Publisher: CRC Press
Total Pages: 688
Release: 2017-12-19
Genre: Computers
ISBN: 135183391X

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What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." —Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." —Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." —Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comté, Besançon, France, and co-author of Practical Model-Based Testing


System-level Test and Validation of Hardware/Software Systems

System-level Test and Validation of Hardware/Software Systems
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
Total Pages: 187
Release: 2006-03-30
Genre: Technology & Engineering
ISBN: 1846281458

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New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.


Statistics, Testing, and Defense Acquisition

Statistics, Testing, and Defense Acquisition
Author: National Research Council
Publisher: National Academies Press
Total Pages: 180
Release: 1999-08-17
Genre: Technology & Engineering
ISBN: 0309184088

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The Panel on Statistical Methods for Testing and Evaluating Defense Systems had a broad mandate-to examine the use of statistics in conjunction with defense testing. This involved examining methods for software testing, reliability test planning and estimation, validation of modeling and simulation, and use of modem techniques for experimental design. Given the breadth of these areas, including the great variety of applications and special issues that arise, making a contribution in each of these areas required that the Panel's work and recommendations be at a relatively general level. However, a variety of more specific research issues were either brought to the Panel's attention by members of the test and acquisition community, e.g., what was referred to as Dubin's challenge (addressed in the Panel's interim report), or were identified by members of the panel. In many of these cases the panel thought that a more in-depth analysis or a more detailed application of suggestions or recommendations made by the Panel would either be useful as input to its deliberations or could be used to help communicate more individual views of members of the Panel to the defense test community. This resulted in several research efforts. Given various criteria, especially immediate relevance to the test and acquisition community, the Panel has decided to make available three technical or background papers, each authored by a Panel member jointly with a colleague. These papers are individual contributions and are not a consensus product of the Panel; however, the Panel has drawn from these papers in preparation of its final report: Statistics, Testing, and Defense Acquisition. The Panel has found each of these papers to be extremely useful and they are strongly recommended to readers of the Panel's final report.


Graph Theory, Combinatorics and Algorithms

Graph Theory, Combinatorics and Algorithms
Author: Martin Charles Golumbic
Publisher: Springer Science & Business Media
Total Pages: 296
Release: 2006-03-30
Genre: Mathematics
ISBN: 0387250360

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Graph Theory, Combinatorics and Algorithms: Interdisciplinary Applications focuses on discrete mathematics and combinatorial algorithms interacting with real world problems in computer science, operations research, applied mathematics and engineering. The book contains eleven chapters written by experts in their respective fields, and covers a wide spectrum of high-interest problems across these discipline domains. Among the contributing authors are Richard Karp of UC Berkeley and Robert Tarjan of Princeton; both are at the pinnacle of research scholarship in Graph Theory and Combinatorics. The chapters from the contributing authors focus on "real world" applications, all of which will be of considerable interest across the areas of Operations Research, Computer Science, Applied Mathematics, and Engineering. These problems include Internet congestion control, high-speed communication networks, multi-object auctions, resource allocation, software testing, data structures, etc. In sum, this is a book focused on major, contemporary problems, written by the top research scholars in the field, using cutting-edge mathematical and computational techniques.


Verification by Error Modeling

Verification by Error Modeling
Author: Katarzyna Radecka
Publisher: Springer Science & Business Media
Total Pages: 227
Release: 2005-12-17
Genre: Technology & Engineering
ISBN: 030648739X

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This book presents the basis for reusing the test vector generation and simulation for the purpose of implementation verification, to result in a significant timesaving. It brings the results in the direction of merging manufacturing test vector generation and verification.


Managing the Testing Process

Managing the Testing Process
Author: Rex Black
Publisher: John Wiley & Sons
Total Pages: 530
Release: 2003-08-16
Genre: Computers
ISBN: 0471449342

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An updated edition of the best tips and tools to plan, build, and execute a structured test operation In this update of his bestselling book, Rex Black walks you through how to develop essential tools and apply them to your test project. He helps you master the basic tools, apply the techniques to manage your resources, and give each area just the right amount of attention so that you can successfully survive managing a test project! Offering a thorough review of the tools and resources you will need to manage both large and small projects for hardware and software, this book prepares you to adapt the concepts across a broad range of settings. Simple and effective, the tools comply with industry standards and bring you up to date with the best test management practices and tools of leading hardware and software vendors. Rex Black draws from his own numerous testing experiences-- including the bad ones, so you can learn from his mistakes-- to provide you with insightful tips in test project management. He explores such topics as: Dates, budgets, and quality-expectations versus reality Fitting the testing process into the overall development or maintenance process How to choose and when to use test engineers and technicians, contractors and consultants, and external test labs and vendors Setting up and using an effective and simple bug-tracking database Following the status of each test case The companion Web site contains fifty tools, templates, and case studies that will help you put these ideas into action--fast!


Digital System Test and Testable Design

Digital System Test and Testable Design
Author: Zainalabedin Navabi
Publisher: Springer Science & Business Media
Total Pages: 452
Release: 2010-12-10
Genre: Technology & Engineering
ISBN: 1441975489

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This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.