Measurement Of Wavefront Structure From Large Aperture Optical Components By Phase Shifting Interferometry PDF Download

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Measurement of Wavefront Structure from Large Aperture Optical Components by Phase Shifting Interferometry

Measurement of Wavefront Structure from Large Aperture Optical Components by Phase Shifting Interferometry
Author:
Publisher:
Total Pages: 27
Release: 1995
Genre:
ISBN:

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This paper discusses the results of high spatial resolution measurement of the transmitted or reflected wavefront of optical components using phase shifting interferometry with a wavelength of 6328 Å. The optical components studied range in size from approximately 50 mm × 100 mm to 400 mm × 750 mm. Wavefront data, in the form of 3-D phase maps, have been obtained for three regimes of scale length: ''micro roughness'', ''mid-spatial scale'', and ''optical figure/curvature.'' Repetitive wavefront structure has been observed with scale lengths from 10 mm to 100 mm. The amplitude of this structure is typically [lambda]/100 to [lambda]/20. Previously unobserved structure has been detected in optical materials and on the surfaces of components. We are using this data to assist in optimizing laser system design, to qualify optical components and fabrication processes under study in our component development program.


The Measurement and Analysis of Wavefront Structure from Large Aperture ICF Optics

The Measurement and Analysis of Wavefront Structure from Large Aperture ICF Optics
Author:
Publisher:
Total Pages: 25
Release: 1995
Genre:
ISBN:

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This paper discusses the techniques, developed over the past year, for high spatial resolution measurement and analysis of the transmitted and/or reflected wavefront of large aperture ICF optical components. Parts up to 400 mm × 750 mm have been measured and include: laser slabs, windows, KDP crystals and lenses. The measurements were performed using state-of-the-art commercial phase shifting interferometers at a wavelength of 633 [mu]m. Both 1 and 2-D Fourier analysis have been used to characterize the wavefront; specifically the Power Spectral Density, (PSD), function was calculated. The PSDs of several precision optical components will be shown. The PSD(V) is proportional to the (amplitude)2 of components of the Fourier frequency spectrum. The PSD describes the scattered intensity and direction as a function of scattering angle in the wavefront. The capability of commercial software is limited to 1-D Fourier analysis only. We are developing our own 2-D analysis capability in support of work to revise specifications for NIF optics. 2-D analysis uses the entire wavefront phase map to construct 2D PSD functions. We have been able to increase the signal-to-noise relative to 1-D and can observe very subtle wavefront structure.


Fringe 2009

Fringe 2009
Author: Wolfgang Osten
Publisher: Springer Science & Business Media
Total Pages: 808
Release: 2010-04-28
Genre: Technology & Engineering
ISBN: 3642030513

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21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.


Optical Engineering at the Lawrence Livermore National Laboratory II

Optical Engineering at the Lawrence Livermore National Laboratory II
Author: Monya A. Lane
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 206
Release: 2004
Genre: Political Science
ISBN:

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.


Optical Interferometry

Optical Interferometry
Author: Alexandr Banishev
Publisher: BoD – Books on Demand
Total Pages: 262
Release: 2017-02-15
Genre: Technology & Engineering
ISBN: 9535129554

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Optical methods of measurements are the most sensitive techniques of noncontact investigations, and at the same time, they are fast as well as accurate which increases reproducibility of observed results. In recent years, the importance of optical interferometry methods for research has dramatically increased, and applications range from precise surface testing to finding extrasolar planets. This book covers various aspects of optical interferometry including descriptions of novel apparatuses and methods, application interferometry for studying biological objects, surface qualities, materials characterization, and optical testing. The book includes a series of chapters in which experts share recent progress in interferometry through original research and literature reviews.


Optical Interferometry, 2e

Optical Interferometry, 2e
Author: P. Hariharan
Publisher: Academic Press
Total Pages: 369
Release: 2003-09-22
Genre: Science
ISBN: 0123116309

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Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.