Materials Reliability In Microelectronics Iv PDF Download
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Author | : Materials Research Society |
Publisher | : Materials Research Society |
Total Pages | : |
Release | : 1994-01-01 |
Genre | : Technology & Engineering |
ISBN | : 9783380000006 |
Download Materials Reliability in Microelectronics IV Book in PDF, ePub and Kindle
Author | : Materials Research Society. Spring Meeting |
Publisher | : |
Total Pages | : 666 |
Release | : 1994 |
Genre | : Electrodiffusion |
ISBN | : |
Download Materials Reliability in Microelectronics IV Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 392 |
Release | : 1999 |
Genre | : Microelectronics |
ISBN | : |
Download Materials Reliability in Microelectronics Book in PDF, ePub and Kindle
Author | : Peter Børgesen |
Publisher | : Materials Research Society |
Total Pages | : 629 |
Release | : 1994-10-19 |
Genre | : Technology & Engineering |
ISBN | : 9781558992382 |
Download Materials Reliability in Microelectronics IV: Volume 338 Book in PDF, ePub and Kindle
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author | : William F. Filter |
Publisher | : |
Total Pages | : 616 |
Release | : 1996-11-18 |
Genre | : Technology & Engineering |
ISBN | : |
Download Materials Reliability in Microelectronics VI: Volume 428 Book in PDF, ePub and Kindle
MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.
Author | : |
Publisher | : |
Total Pages | : 488 |
Release | : 1997 |
Genre | : Microelectronics |
ISBN | : |
Download Materials Reliability in Microelectronics Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 392 |
Release | : 1991 |
Genre | : Microelectronics |
ISBN | : |
Download Materials Reliability Issues in Microelectronics Book in PDF, ePub and Kindle
Proceedings of the "MRS Symposium on Materials Reliability Issues in Microelectronics"--Dedication, p. xiii.
Author | : Willem Dirk van Driel |
Publisher | : Springer Nature |
Total Pages | : 552 |
Release | : 2022-01-31 |
Genre | : Technology & Engineering |
ISBN | : 3030815765 |
Download Reliability of Organic Compounds in Microelectronics and Optoelectronics Book in PDF, ePub and Kindle
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.
Author | : Anthony S. Oates |
Publisher | : |
Total Pages | : 552 |
Release | : 1995-10-24 |
Genre | : Technology & Engineering |
ISBN | : |
Download Materials Reliability in Microelectronics V: Volume 391 Book in PDF, ePub and Kindle
This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.
Author | : |
Publisher | : |
Total Pages | : 583 |
Release | : 1996 |
Genre | : Electrodiffusion |
ISBN | : |
Download Materials Reliability in Microelectronics VI Book in PDF, ePub and Kindle