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| Author | : Walter Maxwell Gibson |
| Publisher | : Institution of Electrical Engineers |
| Total Pages | : 1652 |
| Release | : 1980-01-01 |
| Genre | : Energy-band theory of solids |
| ISBN | : 9780852964576 |
| Author | : Michael Nastasi |
| Publisher | : Cambridge University Press |
| Total Pages | : 572 |
| Release | : 1996-03-29 |
| Genre | : Science |
| ISBN | : 052137376X |
Comprehensive guide to an important materials science technique for students and researchers.
| Author | : Wolfgang Eckstein |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 303 |
| Release | : 2013-03-12 |
| Genre | : Science |
| ISBN | : 3642735134 |
In this book the author discusses the investigation of ion bombardment of solids by computer simulation, with the aim of demonstrating the usefulness of this approach to the problem of interactions of ions with solids. The various chapters present the basic physics behind the simulation programs, their structure and many applications to different topics. The two main streams, the binary collision model and the classical dynamics model, are discussed, as are interaction potentials and electronic energy losses. The main topics investigated are backscattering, sputtering and implantation for incident atomic particles with energies from the eV to the MeV range. An extensive overview of the literature is given, making this book of interest to the active reseacher as well to students entering the field.
| Author | : Walter M. Gibson |
| Publisher | : |
| Total Pages | : 318 |
| Release | : 1980 |
| Genre | : |
| ISBN | : |
| Author | : Zinetula Insepov |
| Publisher | : CRC Press |
| Total Pages | : 266 |
| Release | : 2016-04-21 |
| Genre | : Science |
| ISBN | : 143987543X |
Cluster Ion-Solid Interactions: Theory, Simulation, and Experiment provides an overview of various concepts in cluster physics and related topics in physics, including the fundamentals and tools underlying novel cluster ion beam technology. The material is based on the author's highly regarded courses at Kyoto University, Purdue University, the Mos
| Author | : Walter M. Gibson |
| Publisher | : |
| Total Pages | : 608 |
| Release | : 1980 |
| Genre | : |
| ISBN | : |
| Author | : Walter M. Gibson |
| Publisher | : |
| Total Pages | : 632 |
| Release | : 1980 |
| Genre | : Collisions (Physics) |
| ISBN | : |
| Author | : Kevin J. Boyd |
| Publisher | : |
| Total Pages | : 488 |
| Release | : 1996 |
| Genre | : Ion bombardment |
| ISBN | : |
| Author | : |
| Publisher | : |
| Total Pages | : |
| Release | : 1985 |
| Genre | : |
| ISBN | : |
| Author | : Sarah Fearn |
| Publisher | : Morgan & Claypool Publishers |
| Total Pages | : 67 |
| Release | : 2015-10-16 |
| Genre | : Technology & Engineering |
| ISBN | : 1681740885 |
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
