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Scanning Transmission Electron Microscopy

Scanning Transmission Electron Microscopy
Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
Total Pages: 764
Release: 2011-03-24
Genre: Technology & Engineering
ISBN: 1441972005

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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.


Introduction to Scanning Transmission Electron Microscopy

Introduction to Scanning Transmission Electron Microscopy
Author: Dr Robert Keyse
Publisher: Routledge
Total Pages: 127
Release: 2018-12-19
Genre: Technology & Engineering
ISBN: 1351436619

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1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.


Introduction to Conventional Transmission Electron Microscopy

Introduction to Conventional Transmission Electron Microscopy
Author: Marc De Graef
Publisher: Cambridge University Press
Total Pages: 741
Release: 2003-03-27
Genre: Science
ISBN: 0521620066

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A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.


Introduction to Scanning Transmission Electron Microscopy

Introduction to Scanning Transmission Electron Microscopy
Author: Robert Keyse
Publisher: CRC Press
Total Pages:
Release: 2018-06-28
Genre:
ISBN: 9781138441514

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STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.


Scanning and Transmission Electron Microscopy

Scanning and Transmission Electron Microscopy
Author: Stanley L. Flegler
Publisher: Oxford University Press, USA
Total Pages: 225
Release: 1995
Genre: Science
ISBN: 9780195107517

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A core textbook for courses on electron microscopy Ideal for use in any laboratory, this book presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Clear and concise explanations coupled with instructive diagrams and photographs guide you through: * microscope operation * image production * analytical techniques Specimen preparation is discussed in detail with emphasis on specific parameters for biological specimens. This unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity, this text offers the best introduction to scanning and transmission electron microscopy available.


Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy
Author: Ray Egerton
Publisher: Springer Science & Business Media
Total Pages: 224
Release: 2011-02-11
Genre: Technology & Engineering
ISBN: 9780387258003

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.


Introduction to Scanning Transmission Electron Microscopy

Introduction to Scanning Transmission Electron Microscopy
Author: Robert J. Keyse
Publisher:
Total Pages:
Release: 1998
Genre: SCIENCE
ISBN: 9780203749890

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Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.


A Beginners' Guide to Scanning Electron Microscopy

A Beginners' Guide to Scanning Electron Microscopy
Author: Anwar Ul-Hamid
Publisher: Springer
Total Pages: 422
Release: 2018-10-26
Genre: Technology & Engineering
ISBN: 3319984829

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This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.


Introduction to Scanning Transmission Electron Microscopy

Introduction to Scanning Transmission Electron Microscopy
Author: Robert J. Keyse
Publisher: Springer
Total Pages: 114
Release: 1997-07-28
Genre:
ISBN: 9789813083431

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STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.


Analytical Transmission Electron Microscopy

Analytical Transmission Electron Microscopy
Author: Jürgen Thomas
Publisher: Springer Science & Business
Total Pages: 357
Release: 2014-04-17
Genre: Technology & Engineering
ISBN: 9401786011

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This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.