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Interferogram Analysis for Optical Testing

Interferogram Analysis for Optical Testing
Author: Daniel Malacara
Publisher: CRC Press
Total Pages: 458
Release: 1998-07-21
Genre: Technology & Engineering
ISBN: 9780824799403

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"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."


Interferogram Analysis For Optical Testing

Interferogram Analysis For Optical Testing
Author: Zacarias Malacara
Publisher: CRC Press
Total Pages: 568
Release: 2018-10-03
Genre: Science
ISBN: 1420027271

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In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.


Introduction to Optical Testing

Introduction to Optical Testing
Author: Joseph M. Geary
Publisher: SPIE Press
Total Pages: 168
Release: 1993
Genre: Technology & Engineering
ISBN: 9780819413772

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This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.


Optical Interferometry, 2e

Optical Interferometry, 2e
Author: P. Hariharan
Publisher: Academic Press
Total Pages: 369
Release: 2003-09-22
Genre: Science
ISBN: 0123116309

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Nanotechnology, sensor and measurement industries depend on these advances in optical interferometry for accuracy and profitability.


Field Guide to Interferometric Optical Testing

Field Guide to Interferometric Optical Testing
Author: Eric P. Goodwin
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 0
Release: 2006
Genre: Interferometry
ISBN: 9780819465108

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Based on the author's course at University of Arizona, this guide covers the key fundamentals of interferometry, types of interferometers and interferograms, concepts of phase-shifting interferometry, long-wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, flat and curved surface testing, and more.


Optical Interferometry, 2e

Optical Interferometry, 2e
Author: P. Hariharan
Publisher: Elsevier
Total Pages: 368
Release: 2003-10-20
Genre: Technology & Engineering
ISBN: 0080473644

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When the first edition of Optical Interferometry was published, interferometry was regarded as a rather esoteric method of making measurements, largely confined to the laboratory. Today, however, besides its use in several fields of research, it has applications in fields as diverse as measurement of length and velocity, sensors for rotation, acceleration, vibration and electrical and magnetic fields, as well as in microscopy and nanotechnology. Most topics are discussed first at a level accessible to anyone with a basic knowledge of physical optics, then a more detailed treatment of the topic is undertaken, and finally each topic is supplemented by a reference list of more than 1000 selected original publications in total. Historical development of interferometry The laser as a light source Two-beam interference Techniques for frequency stabilization Coherence Electronic phase measurements Multiple-beam interference Quantum effects in optical interference Extensive coverage of the applications of interferometry, such as measurements of length, optical testing, interference microscopy, interference spectroscopy, Fourier-transform spectroscopy, interferometric sensors, nonlinear interferometers, stellar interferometry, and studies of space-time and gravitation


Fringe Pattern Analysis for Optical Metrology

Fringe Pattern Analysis for Optical Metrology
Author: Manuel Servin
Publisher: John Wiley & Sons
Total Pages: 344
Release: 2014-08-18
Genre: Technology & Engineering
ISBN: 3527411526

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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.