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Integrated Wide-Bandwidth Current Sensing

Integrated Wide-Bandwidth Current Sensing
Author: Tobias Funk
Publisher: Springer Nature
Total Pages: 144
Release: 2020-09-04
Genre: Technology & Engineering
ISBN: 303053250X

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This book provides readers with a single-source reference to current sensing integrated circuit design. It is written in handbook style, including systematic guidelines and implementation examples. The authors focus on the implementation of wide-bandwidth current sensing on a single microchip, toward usage in applications such as sensing, control and optimization of the energy flow in growth areas like industrial electronics, renewable energies, smart grids, electromobility and the Internet of Things. Provides readers with a comprehensive, all-in-one source for current sensing integrated circuit design, including implementation examples; Discusses modeling and optimization of on-chip Rogowski coil and Hall sensor in both lateral and vertical orientation; Includes noise reduction techniques, such as auto-zeroing and chopping; Covers open-loop and closed-loop sensor front-end design; Presents the first on-chip current sensor with a planar coil placed besides a power line to measure internal signal currents and the first off-chip current sensor with a helix-shaped coil for external signal currents in the multi-MHz region.


Current Sensor for Wide Bandgap Devices Dynamic Characterization

Current Sensor for Wide Bandgap Devices Dynamic Characterization
Author: Wen Zhang (Researcher in electrical engineering)
Publisher:
Total Pages: 0
Release: 2019
Genre:
ISBN:

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High bandwidth sensors are required to measure the wide-bandgap devices’ transient behavior because of their very fast switching speed. In addition to high bandwidth, the current sensor must introduce little disturbance to the switching power loop. Specifically, excessive parasitic inductance introduced by the current sensor drastically changes the switching behavior, making the measurement result invalid. Conventional high bandwidth current sensors are first reviewed to understand their limitations. By combining the structure of coaxial shunt resistor and alumina substrate of surface mount thin film resistors, a novel current sensor surface mount coaxial shunt resistor (SMDCSR) is introduced. Its performance is then modeled and experimentally characterized. Experimental testing verifies its capability of achieving very high bandwidth of up to 2 GHz while introducing little parasitic inductance of less than 0.2 nH. Compared with state-of-the-art commercial products, SMDCSR achieves more than 10x higher bandwidth and less than 1/10 insertion inductance. SMDCSRs are thus ideal for current measurement where high bandwidth and low electrical footprint are required, especially for wide-bandgap devices’ dynamic characterization.


A New Built-in Current Sensor for I[subscript DDT] Testing and Its Evaluation for Testing Open Defects in SRAMs

A New Built-in Current Sensor for I[subscript DDT] Testing and Its Evaluation for Testing Open Defects in SRAMs
Author: Sreedhar Sivalingala
Publisher:
Total Pages: 196
Release: 2001
Genre:
ISBN:

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ABSTRACT: In very deep submicron technologies, supply current testing techniques are essential to achieve high fault coverage and to reduce test length. Due to high supply leakage currents, the quiescent power supply current (IDDQ) testing technique is no longer applicable for deep submicron technologies. However, the transient power supply current (IDDT) testing technique can be used in an environment of high leakage current and offers high fault coverage and reduced test time. A new built-in current sensor is presented here that has the potential to overcome some of the limitations of the other current sensors proposed previously. The current sensor can find application for testing embedded static random access memories (SRAMs) at high frequencies. It employs a high pass filter circuit to eliminate the effects of leakage current and utilizes cascaded high bandwidth amplifiers for high IDDT measurement sensitivity. Open defects in SRAMs are modeled as resistive open defects and studied using the new built-in current sensor for a 0.35 [(mu symbol)m] process technology. The current sensor efficiently detects the open defects in SRAMs that cause transition faults and destructive read-out faults. A two-vector test pattern is suggested with the current sensor for the detection of these faults. The first test vector is used to initialize the SRAM memory cell being tested, and the second test vector is applied to activate the fault.


An Integrated, Lossless, and Accurate Current-sensing Technique for High-performance Switching Regulators

An Integrated, Lossless, and Accurate Current-sensing Technique for High-performance Switching Regulators
Author: H. Pooya Forghani-zadeh
Publisher:
Total Pages:
Release: 2006
Genre: Electric current converters
ISBN:

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Switching power converters are an indispensable part of every battery-operated consumer electronic product, nourishing regulated voltages to various subsystems. In these circuits, sensing the inductor current is not only necessary for protection and control but also is critical to be done in a lossless and accurate fashion for state-of-the-art advanced control techniques, which are devised to optimize transient response, increase the efficiency over a wide range of loads, eliminate off-chip compensation networks, and integrate the power inductor. However, unavailability of a universal, integrable, lossless, and accurate current-sensing technique impedes the realization of those advanced techniques and limit their applications. Unfortunately, use of a conventional series sense resistor is not recommended in high-performance, high-power switching regulators where more than 90% efficiency is required because of their high current levels. A handful of lossless current-sensing techniques are available but their accuracies are significantly lower than the traditional sense resistor scheme. Among available lossless but not accurate techniques, an off-chip, filter-based method that uses a tuned filter across the inductor to estimate current flow and its accuracy is dependent on the inductance and its equivalent series resistance (ESR) was selected for improvement because of its inherent continuous and low-noise operation. A schemes is proposed to adapt the filter technique for integration by automatically adjusting bandwidth and gain of an on-chip programmable gm-C filter to the off-chip power inductor during the system start-up through measuring the inductance and its ESR with on-chip generated test currents. The IC prototype in AMI2s 0.5-um CMOS process achieved overall DC and AC gain errors of 8% and 9%, respectively, at 0.8 A DC load and 0.2 A ripple currents for inductors from 4 uH-14 uH and ESR from 48 mOhm to 384 mOhm when lossless, state-of-the-art schemes achieve 20640% error and only when the nominal specifications of power component (power MOSFET or inductor) are known. Moreover, the proposed circuit improved the efficiency of a test bed current-mode controlled switching regulator by more than 2.6% at 0.8 A load compared to the traditional sense resistor technique with a 50 mOhm sense resistor.


Sensors and Microsystems

Sensors and Microsystems
Author: Arnaldo D’Amico
Publisher: Springer Science & Business Media
Total Pages: 298
Release: 2012-01-11
Genre: Technology & Engineering
ISBN: 1461409357

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This book contains a selection of papers presented at the 16th AISEM (“Associazione Italiana Sensori e Microsistemi”) National Conference on Sensors and Microsystems, held in Rome 7-9 February 2011. The conference highlighted updated results from both theoretical and applied research in the field of sensors and microsystems. This book presents material in an interdisciplinary approach, covering many aspects of the disciplines related to sensors and microsystems, including physics, chemistry, materials science, biology and applications.


Measuring Current, Voltage and Power

Measuring Current, Voltage and Power
Author: K. Iwansson
Publisher: Elsevier
Total Pages: 233
Release: 1999-06-01
Genre: Technology & Engineering
ISBN: 0080523978

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This authoritative new book focuses on recent developments in the instrumentation for sending voltages and currents. It covers new trends and challenges in the field, such as measurements of biocurrents, the increased speed of the components for data taking, testing of computers and integrated circuits where the measurement of rapid voltage and current variations on a very small geometrical scale is necessary. The first chapter concentrates on recent methods to sense voltages and currents, while the rest of the book investigates the applied side, covering for instance electrical power and energy measurements. The main purpose of this volume is to illustrate commonly employed techniques rather than track the scientific evolution and merits and therefore mainly covers patent literature aimed at industrial applications. It is an exciting addition, justifying the series' claim to cover state-of-the-art developments in both the applied and theoretical fields of sensors and actuators. The measurement of voltages and currents is a common task in the field of electricity and electronics. From a technical point of view it is useful to identify schematically different steps of such a measurement. In a first step a voltage or a current is sensed, intermediate steps such as amplification, transmission and further treatment may follow to yield the result in the final step. Today in most cases microprocessors perform the final steps of such measurements. Analog-to digital converters digitise a voltage that is proportional to the value to be measured and a processor performs further computations and handles the storage and the display of the results. The prerequisite for such measurements are sensors or transducers that respond in a known way to the voltage or current to be measured. The emphasis of this book is put on recent developments of the instrumentation for sensing voltages and currents. Aside from the general trend towards smaller, cheaper and more reliable instrumentation, new demands have arisen. New applications, like measurements of biocurrents, ask for higher sensitivities. Computers and integrated circuits pose new challenges. To exploit the increased speed of the components for data taking, suitable sensors are required. The accuracy that can be achieved depends more than ever on the first step, the acquisition of the raw data. The influence of the measurement process on the results becomes more crucial. Testing of integrated circuits themselves is a completely new application. For such tests one has to measure rapid voltage and current variations on very small geometrical scales. Here, as well as in the traditional high voltage applications, contactless measurements play an important role. The organisation of this book is as follows: In the first chapter different methods to sense voltages and currents are described. For the sake of completeness most commonly used methods are mentioned, we concentrate, however, on those developed recently. The chapters address the subject from the side of different applications in which voltages and currents are sensed. Since the main purpose of this publication is to illustrate commonly employed techniques rather than to track the scientific evolution and merits in particular fields, in general those publications that illustrate a particular measurement principle best have been cited. The citation of a particular reference does therefore not imply that this is the first or most pertinent publication in the respective field.