Image Based Metrology for Nanoscale Self-assembly Processes
Author | : Prabu Ravindran |
Publisher | : |
Total Pages | : 138 |
Release | : 2007 |
Genre | : |
ISBN | : |
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Author | : Prabu Ravindran |
Publisher | : |
Total Pages | : 138 |
Release | : 2007 |
Genre | : |
ISBN | : |
Author | : Federico Ferrarese Lupi |
Publisher | : Mdpi AG |
Total Pages | : 138 |
Release | : 2021-11-25 |
Genre | : Science |
ISBN | : 9783036519616 |
The self-assembly process underlies a plethora of natural phenomena from the macro to the nano scale. Often, technological development has found great inspiration in the natural world, as evidenced by numerous fabrication techniques based on self-assembly (SA). One striking example is given by epitaxial growths, in which atoms represent the building blocks. In lithography, the use of self-assembling materials is considered an extremely promising patterning option to overcome the size scale limitations imposed by the conventional photolithographic methods. To this purpose, in the last two decades several supramolecular self-assembling materials have been investigated and successfully applied to create patterns at a nanometric scale. Although considerable progress has been made so far in the control of self-assembly processes applied to nanolithography, a number of unresolved problems related to the reproducibility and metrology of the self-assembled features are still open. Addressing these issues is mandatory in order to allow the widespread diffusion of SA materials for applications such as microelectronics, photonics, or biology. In this context, the aim of the present Special Issue is to gather original research papers and comprehensive reviews covering various aspects of the self-assembly processes applied to nanopatterning. Topics include the development of novel SA methods, the realization of nanometric structures and devices, and the improvement of their longrange order. Moreover, metrology issues related to the nanoscale characterization of selfassembled structures are addressed.
Author | : Prabu Ravindran |
Publisher | : |
Total Pages | : 99 |
Release | : 2010 |
Genre | : |
ISBN | : |
Author | : Christopher Michael Green |
Publisher | : |
Total Pages | : 150 |
Release | : 2019 |
Genre | : DNA. |
ISBN | : |
"Methods to engineer nanomaterials and devices with uniquely tailored properties are highly sought after in fields such as manufacturing, medicine, energy, and the environment. The macromolecule deoxyribonucleic acid (DNA) enables programmable self-assembly of nanostructures with near arbitrary shape and size and with unprecedented precision and accuracy. Additionally, DNA can be chemically modified to attach molecules and nanoparticles, providing a means to organize active materials into devices with unique or enhanced properties. One particularly powerful form of DNA-based self-assembly, DNA origami, provides robust structures with the potential for nanometer-scale resolution of addressable sites. DNA origami are assembled from one large DNA "scaffold" strand and many unique, short "staple" strands; each staple programmatically binds the scaffold at several distant domains, and the coordinated interactions of many staples with the scaffold act to fold the scaffold into a desired shape. The utility of DNA origami has been demonstrated through multiple applications, such as plasmonic and photonic devices, electronic device patterning, information storage, drug delivery, and biosensors. Despite the promise of DNA nanotechnology, few products have successfully translated from the laboratory to industry. Achieving high yield and high-precision synthesis of stable DNA nanostructures is one of the biggest challenges to applications of DNA nanostructures. For adoption in manufacturing, methods to measure and inspect assembled structures (i.e. metrology) are essential. Common high-resolution imaging techniques used to characterize DNA nanostructures, such as atomic force microscopy and transmission electron microscopy, cannot facilitate high-throughput characterization, and few studies have been directed towards the development of improved methods for nanoscale metrology. DNA-PAINT super-resolution microscopy enables high-resolution, multiplexed imaging of reactive sites on DNA nanostructures and offers the potential for inline optical metrology. In this work, nanoscale metrologies utilizing DNA-PAINT were developed for DNA nanostructures and applied to characterize DNA origami arrays and single site defects on DNA origami. For metrology of DNA origami arrays, an embedded, multiplexed optical super-resolution methodology was developed to characterize the periodic structure and defects of two-dimensional arrays. Images revealed the spatial arrangement of structures within the arrays, internal array defects, and grain boundaries between arrays, enabling the reconstruction of arrays from the images. The nature of the imaging technique is also highly compatible with statistical methods, enabling rapid statistical analysis of synthesis conditions. To obtain a greater understanding of DNA origami defects at the scale of individual strands, correlative super-resolution and atomic force microscopies were enabled through the development of a simple and flexibl."--Boise State University ScholarWorks.
Author | : Günter Wilkening |
Publisher | : John Wiley & Sons |
Total Pages | : 541 |
Release | : 2006-05-12 |
Genre | : Technology & Engineering |
ISBN | : 3527606874 |
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author | : |
Publisher | : DIANE Publishing |
Total Pages | : 88 |
Release | : |
Genre | : |
ISBN | : 1437985718 |
Author | : Elisabeth Mansfield |
Publisher | : John Wiley & Sons |
Total Pages | : 630 |
Release | : 2017-01-20 |
Genre | : Technology & Engineering |
ISBN | : 3527800050 |
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author | : National Institute of Standards and Technology (U.S.) |
Publisher | : |
Total Pages | : 178 |
Release | : 1996 |
Genre | : Science and state |
ISBN | : |
Author | : Shinill Kang |
Publisher | : John Wiley & Sons |
Total Pages | : 384 |
Release | : 2012-04-03 |
Genre | : Technology & Engineering |
ISBN | : 0470392134 |
An introduction to micro and nano replication processes and applications Micro/Nano Replication: Processes and Applications provides an overview of the fundamentals, processes, and applications involved in micro and nano replication in the manufacturing of product parts. A major field of nanotechnology, the study of micro/nano replication is sure to become one of increasing importance as the construction of completely new devices based on innovative concepts and crafted at the molecular level increases. Designed to help the reader understand and learn to work with the growing number of tools for molding plastic components, the book covers the key topics related to replication, including patterning technology, the modification of mold surface properties, and much more. In addition, it addresses the strengths and weaknesses of different molding processes. With a strong focus not only on how micro/nano replication works, but also the broader implications for the industry, the book is packed with examples of real world applications. These are drawn from a variety of fields, including information storage devices, optoelectronic elements, optical communication, and biosensors, in order to provide a complete view of the importance of micro and nano processes. A valuable introduction to a new but fast-growing field, Micro/Nano Replication is an essential resource for anyone looking to get a head start on understanding this emerging discipline.
Author | : Chiwoo Park |
Publisher | : Springer Nature |
Total Pages | : 376 |
Release | : 2021-07-31 |
Genre | : Business & Economics |
ISBN | : 3030728226 |
This book combines two distinctive topics: data science/image analysis and materials science. The purpose of this book is to show what type of nano material problems can be better solved by which set of data science methods. The majority of material science research is thus far carried out by domain-specific experts in material engineering, chemistry/chemical engineering, and mechanical & aerospace engineering. The book could benefit materials scientists and manufacturing engineers who were not exposed to systematic data science training while in schools, or data scientists in computer science or statistics disciplines who want to work on material image problems or contribute to materials discovery and optimization. This book provides in-depth discussions of how data science and operations research methods can help and improve nano image analysis, automating the otherwise manual and time-consuming operations for material engineering and enhancing decision making for nano material exploration. A broad set of data science methods are covered, including the representations of images, shape analysis, image pattern analysis, and analysis of streaming images, change points detection, graphical methods, and real-time dynamic modeling and object tracking. The data science methods are described in the context of nano image applications, with specific material science case studies.