High Speed Clock And Data Recovery Analysis PDF Download

Clock and data recovery circuits play a very important role in modern data communication systems. It has very wide application in many areas, such as optical communications and interconnection between chips [1]. Today in IC industry, the shrinkage of feature size increasingly enlarges the uncertainty of circuit performance caused by process variation. As the data transmission speed dramatically increases, this uncertainty will heavily affect the clock and data recovery circuit performance and reliability in communication systems. Thus, research on performance variation of a clock and data recovery circuit caused by process variation is meaningful. The conclusion will have significant influence on chip testing. In this research, a clock and data recovery circuit is laid out by TSMC 180nm technology. The performance variation caused by process variation is investigated by HSPICE simulation, and compared with the theoretical analysis results derived through the mathematical model of the clock and data recovery circuit. The results demonstrate that our theoretical model matches well with the real simulations. Both theoretical and simulation results also indicate that process variations in the low pass filter have significant impact on performance parameters such as damping ratio, natural frequency, and lock time of the clock and data recovery circuit. Reference 1. B. Razavi, Challenges in the design high-speed clock and data recovery circuits, IEEE Communications Magazine, vol. 40, no. 8, pp. 94- 101, Aug. 2002.