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X-Rays and Extreme Ultraviolet Radiation

X-Rays and Extreme Ultraviolet Radiation
Author: David Attwood
Publisher: Cambridge University Press
Total Pages:
Release: 2017-02-16
Genre: Technology & Engineering
ISBN: 1316810666

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With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.


Soft X-Rays and Extreme Ultraviolet Radiation

Soft X-Rays and Extreme Ultraviolet Radiation
Author: David Attwood
Publisher: Cambridge University Press
Total Pages: 611
Release: 2007-02-22
Genre: Technology & Engineering
ISBN: 1139643428

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This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.


Radiation characteristics of extreme UV and soft X-ray sources

Radiation characteristics of extreme UV and soft X-ray sources
Author: Tobias Mey
Publisher: Göttingen University Press
Total Pages: 154
Release: 2015
Genre:
ISBN: 3863952111

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Electromagnetic radiation in the extreme UV and soft x-ray spectral range is of steadily increasing importance in fundamental research and industrial applications. An optimum use of the available photons can only be achieved under condition of a comprehensive beam characterization. Following that goal, this work addresses the pathway of extreme UV and soft x-ray radiation from its generation, through the beam transport by the beamline to the probe position. Experimentally, those aspects are optimized at a laser-produced plasma source and at an arrangement for the generation of high-harmonics. Additionally, the coherence of laser beams is analyzed by measurements of the Wigner distribution function. This method is applied to the photon beam of the free-electron laser FLASH, resulting in the entire characterization of its propagation properties.


Soft x-rays and extreme ultraviolet radiation

Soft x-rays and extreme ultraviolet radiation
Author: David Attwood
Publisher:
Total Pages: 470
Release: 2000
Genre:
ISBN: 9781139641326

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This self-contained, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The book will be of great interest to graduate students, researchers and practising engineers.


Coherent Sources of XUV Radiation

Coherent Sources of XUV Radiation
Author: Pierre Jaeglé
Publisher: Springer
Total Pages: 414
Release: 2007-12-11
Genre: Science
ISBN: 0387299904

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Extreme ultraviolet radiation, also referred to as soft X-rays or XUV, offers very special optical properties. The X-UV refractive index of matter is such that normal reflection cannot take place on polished surfaces whereas beam transmission through one micrometer of almost all materials reduces to zero. Therefore, it has long been a difficult task to imagine and to implement devices designed for complex optics experiments in this wavelength range. Thanks to new sources of coherent radiation - XUV-lasers and High Order Harmonics - the use of XUV radiation, for interferometry, holography, diffractive optics, non-linear radiation-matter interaction, time-resolved study of fast and ultrafast phenomena and many other applications, including medical sciences, is ubiquitous.


Soft X-Rays and Extreme Ultraviolet Radiation

Soft X-Rays and Extreme Ultraviolet Radiation
Author: David Attwood
Publisher:
Total Pages: 488
Release: 1999
Genre: Grenz rays
ISBN: 9781316085097

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This self-contained, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The book will be of great interest to graduate students, researchers and practising engineers.