Focusing Of Charged Particles Volume Ii PDF Download

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Focusing of Charged Particles V2

Focusing of Charged Particles V2
Author: Albert Septier
Publisher: Elsevier
Total Pages: 487
Release: 2012-12-02
Genre: Science
ISBN: 0323148468

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Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.


Focusing of Charged Particles

Focusing of Charged Particles
Author: Albert Septier
Publisher:
Total Pages: 471
Release: 1967
Genre: Electron optics
ISBN:

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Focusing of Charged Particles V1

Focusing of Charged Particles V1
Author: Albert Septier
Publisher: Elsevier
Total Pages: 524
Release: 2012-12-02
Genre: Science
ISBN: 0323147186

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Focusing of Charged Particles, Volume I, explains the focusing principles needed to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This book discusses the geometrical corpuscular optics as well as the methods for computing fields. Comprised of two parts encompassing two chapters, this volume starts with an overview of the general properties of potentials, fields, and trajectories. This book then examines the methods for resolving Laplace’s and Poisson’s equations, as well as computing trajectories with or without space charge. Other chapters describe the methods used for the measurement of magnetic field. This text discusses as well the optics of straight axis systems for focusing and producing low-intensity beams. The final chapter deals with the particular and very delicate problem of the production of electron microbes. Engineers, students, and researchers working with charged particles will find this book extremely useful.


Focusing of Charged Particles

Focusing of Charged Particles
Author: Albert Septier
Publisher: Academic Press
Total Pages: 524
Release: 2013-10-22
Genre: Science
ISBN: 1483270610

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Focusing of Charged Particles, Volume I deals with the various aspects of problems in corpuscular optics such as the need for new focusing principles to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This volume is comprised of articles from specialists who attempt to find solutions to various problems in geometrical corpuscular optics. The topics discussed in the book include the general properties of potentials, fields and trajectories, the methods for resolving Laplace's and Poisson's equations and computing trajectories with or without space charge, and a description of the methods used for the measurement of magnetic fields. The optics of straight axis systems for producing and focusing low-intensity beams: high-brightness electron guns, electrostatic and magnetic electron lenses, and strong focusing lenses for high-energy beams are covered as well. The text ends with the elucidation of the problem of the production of electron microprobes. Physicists, students, researchers, and engineers working with charged particles will find the book invaluable.


Optics of Charged Particles

Optics of Charged Particles
Author: Hermann Wollnik
Publisher: Elsevier
Total Pages: 304
Release: 2012-12-02
Genre: Science
ISBN: 0323156789

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Optics of Charged Particles describes how charged particles move in the main and fringing fields of magnetic or electrostatic dipoles, quadrupoles, and hexapoles using the same type of formulation and consistent nomenclature throughout. This book not only describes the particle trajectories and beam shapes, but also provides guidelines for designing particle optical instruments. The topics discussed include Gaussian optics and transfer matrices, general relations for the motion of charged particles in electromagnetic fields, and quadrupole lenses. The sector field lenses, charged particle beams and phase space, and particle beams in periodic structures are also elaborated. This text likewise considers the fringing fields, image aberrations, and design of particle spectrometers and beam guide lines. This publication is suitable for undergraduate students in physics and mathematics.


Principles of Electron Optics, Volume 2

Principles of Electron Optics, Volume 2
Author: Peter W. Hawkes
Publisher: Academic Press
Total Pages: 767
Release: 2017-12-13
Genre: Science
ISBN: 0128134054

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Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text


Handbook of Charged Particle Optics

Handbook of Charged Particle Optics
Author: Jon Orloff
Publisher: CRC Press
Total Pages: 666
Release: 2017-12-19
Genre: Science
ISBN: 1420045555

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With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.