Failure Analysis Of Integrated Circuits PDF Download

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Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits
Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
Total Pages: 256
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461549191

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.


Integrated Circuit Failure Analysis

Integrated Circuit Failure Analysis
Author: Friedrich Beck
Publisher: John Wiley & Sons
Total Pages: 198
Release: 1998-02-04
Genre: Technology & Engineering
ISBN: 9780471974017

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Funktionstests an integrierten Schaltungen sind für deren Zuverlässigkeit von herausragender Bedeutung. Erstmals werden in diesem Werk die speziellen Präparationstechniken für die Fehleranalyse beschrieben. Ausgehend von den theoretischen Grundlagen erläutert der Autor in praxisnahem Stil die verschiedenen Techniken, die das Zurückverfolgen von Ausfällen ermöglichen.


Electronic Failure Analysis Handbook

Electronic Failure Analysis Handbook
Author: Perry L. Martin
Publisher: McGraw Hill Professional
Total Pages: 770
Release: 1999
Genre: Technology & Engineering
ISBN: 9780070410442

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Annotation "In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--BOOK JACKET. Title Summary field provided by Blackwell North America, Inc. All Rights Reserved.


2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: IEEE Staff
Publisher:
Total Pages:
Release: 2016-07-18
Genre:
ISBN: 9781467382601

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IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies


Failure-Free Integrated Circuit Packages

Failure-Free Integrated Circuit Packages
Author: Charles Cohn
Publisher: McGraw Hill Professional
Total Pages: 394
Release: 2005
Genre: Technology & Engineering
ISBN: 9780071434843

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The shrinking of integrated circuits (ICs) puts tremendous stress on overall device reliability. This unique treatment uses graphic illustration to clearly identify all major failure mode types, so engineers can spot failures before they occur.