Electron Energy Loss Spectroscopy In The Electron Microscope PDF Download
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Author | : R.F. Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 491 |
Release | : 2013-03-09 |
Genre | : Science |
ISBN | : 1475750994 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Author | : R.F. Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 418 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1461568870 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
Electron energy-loss spectroscopy (EELS or ELS) has been used to investi gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their own spectrometer or electron-detection system. Chapter 3 outlines the theory used to interpret spectral features, while Chapter 4 gives procedures for numerical processing of the energy-loss spectrum. Chapter 5 contains examples of practical applications of EELS and a discussion of radiation damage, spatial resolution, and detection limits.
Author | : R. F. Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 506 |
Release | : 1996 |
Genre | : Science |
ISBN | : 9780306452239 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
A comprehensive guide to a technique for the chemical and structural analysis of thin specimens in a transmission electron microscope. About a third of the text has been rewritten from the 1986 first edition to reflect the substantial developments in methods, instruments, applications, and interpret
Author | : R.F. Egerton |
Publisher | : Springer Science & Business Media |
Total Pages | : 498 |
Release | : 2011-07-29 |
Genre | : Technology & Engineering |
ISBN | : 1441995838 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
Author | : Channing C. Ahn |
Publisher | : John Wiley & Sons |
Total Pages | : 472 |
Release | : 2006-03-06 |
Genre | : Science |
ISBN | : 3527604774 |
Download Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas Book in PDF, ePub and Kindle
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.
Author | : Ray Egerton |
Publisher | : |
Total Pages | : 500 |
Release | : 2014-01-15 |
Genre | : |
ISBN | : 9781475751000 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 504 |
Release | : 2011-10-29 |
Genre | : |
ISBN | : 9781441995841 |
Download Electron Energy-Loss Spectroscopy in the Electron Microscope Book in PDF, ePub and Kindle
Author | : R. Brydson |
Publisher | : Garland Science |
Total Pages | : 237 |
Release | : 2020-08-13 |
Genre | : Science |
ISBN | : 1000144623 |
Download Electron Energy Loss Spectroscopy Book in PDF, ePub and Kindle
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
Author | : Zhong Lin Wang |
Publisher | : Cambridge University Press |
Total Pages | : 457 |
Release | : 1996-05-23 |
Genre | : Science |
ISBN | : 0521482666 |
Download Reflection Electron Microscopy and Spectroscopy for Surface Analysis Book in PDF, ePub and Kindle
A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Author | : Ludwig Reimer |
Publisher | : Springer |
Total Pages | : 532 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 3662135531 |
Download Transmission Electron Microscopy Book in PDF, ePub and Kindle
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.