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In-situ Electron Microscopy

In-situ Electron Microscopy
Author: Gerhard Dehm
Publisher: John Wiley & Sons
Total Pages: 403
Release: 2012-05-30
Genre: Technology & Engineering
ISBN: 3527652183

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.


Science of Microscopy

Science of Microscopy
Author: P.W. Hawkes
Publisher: Springer Science & Business Media
Total Pages: 1336
Release: 2008-08-29
Genre: Technology & Engineering
ISBN: 0387497625

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This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.


In Situ Electron and Tunneling Microscopy of Dynamic Processes: Volume 404

In Situ Electron and Tunneling Microscopy of Dynamic Processes: Volume 404
Author: Renu Sharma
Publisher:
Total Pages: 250
Release: 1996-08-26
Genre: Science
ISBN:

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Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy


Electron Microscopy Of Subcellular Dynamics

Electron Microscopy Of Subcellular Dynamics
Author: Helmut Plattner
Publisher: CRC Press
Total Pages: 390
Release: 1989-09-30
Genre: Science
ISBN: 9780849360794

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This illustrated volume surveys the correlated use of currently available methods of electron microscopic techniques, along with the goals and perspectives for future developments. The authors discuss an integrative approach of different EM preparation and analysis techniques that can allow for an analysis of dynamic cellular processes with high temporal and spatial resolution on the electron microscope level. This concise, yet thorough, work is a valuable reference for researchers in the field.


Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)

Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM)
Author: Debbie Stokes
Publisher: John Wiley & Sons
Total Pages: 247
Release: 2008-12-22
Genre: Science
ISBN: 0470065400

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Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk