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Diffraction Analysis of the Microstructure of Materials

Diffraction Analysis of the Microstructure of Materials
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
Total Pages: 557
Release: 2013-11-21
Genre: Science
ISBN: 3662067234

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Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.


Microstructural Characterization of Materials

Microstructural Characterization of Materials
Author: David Brandon
Publisher: John Wiley & Sons
Total Pages: 517
Release: 2013-03-21
Genre: Technology & Engineering
ISBN: 1118681487

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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.


Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
Author:
Publisher: Walter de Gruyter GmbH & Co KG
Total Pages: 320
Release: 2015-10-29
Genre: Science
ISBN: 3486992562

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Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.


Defect and Microstructure Analysis by Diffraction

Defect and Microstructure Analysis by Diffraction
Author: Robert L. Snyder
Publisher: International Union of Crystal
Total Pages: 785
Release: 1999
Genre: Science
ISBN: 9780198501893

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Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.


Size-Strain V

Size-Strain V
Author: E. J. Mittemeijer
Publisher:
Total Pages: 324
Release: 2008
Genre: Crystal lattices
ISBN:

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Electron Backscatter Diffraction in Materials Science

Electron Backscatter Diffraction in Materials Science
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
Total Pages: 352
Release: 2013-06-29
Genre: Technology & Engineering
ISBN: 1475732058

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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).


Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
Author:
Publisher: de Gruyter Oldenbourg
Total Pages:
Release: 2016-06-30
Genre:
ISBN: 9783486992557

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Zeitschrift fur Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift fur Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography. "


Neutron Diffraction Analysis of Internal Stresses and Microstructure

Neutron Diffraction Analysis of Internal Stresses and Microstructure
Author: Vadim Davydov
Publisher: LAP Lambert Academic Publishing
Total Pages: 172
Release: 2013-01
Genre:
ISBN: 9783843320429

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In the current world of advanced technologies, materials play a key role in our day-to-day life, and the investigation of their mechanical properties with the aim of improvement, thus becomes a matter of crucial importance. Nondestructive studies of microstructure and of internal stresses coupled with in situ mechanical tests and diffraction techniques yield an attractive tool for materials scientists. This assists not only to a growth of this topic in significance but also to its development into the detached and relatively new scientific field of diffraction analysis. Neutron diffraction used in the listed works of this book as a main probe for materials, has become the most powerful technique for examination of microstructure and mechanical properties, and it is therefore considered as a prerequisite. In response to the needs of diligent fabricator of materials, striving for the improvement of materials quality, the topic of internal stress development pertains to the significantly relevant issues covered by this book.