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Development, Manufacturing and Characterization of Stacked MESA Photodiodes

Development, Manufacturing and Characterization of Stacked MESA Photodiodes
Author: Fabian Florek
Publisher: Cuvillier Verlag
Total Pages: 154
Release: 2016-09-13
Genre: Technology & Engineering
ISBN: 3736983514

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Diese Arbeit untersucht das Konzept von gestapelten Fotodioden basierend auf einem MESA Prozess. Eine Fotodiode mit einer vertikalen MESA Struktur ist eine neue Herangehensweise für die Detektion von farbigem Licht. Die Ergebnisse dieser Arbeit zeigen, dass ein Sensor zur Farbdetektion, basierend auf einer MESA Struktur, möglich ist. Durch chemische Gasphasenabscheidungen wird ein n-i-p-n-i-p Stapel gewachsen, der sehr dünne p-n Übergänge besitzt. Danach werden die unterschiedlichen p-i-n Dioden mit Hilfe eines neu entwickelten Ätzprozesses separat kontaktiert. Eine freistehende MESA Struktur wird dadurch erzeugt, dass alle überflüssigen Teile der Struktur durch einen hochselektiven RIE Ätzprozess entfernt werden. Diese neu geschaffene Struktur wird dann mit einer Passivierung und Metallkontakten versehen. Dadurch ist es möglich, sehr dünne und separat kontaktierte p-n Übergänge zu schaffen. Die hergestellten Prototypen wurden einzeln und gleichzeitig spektral vermessen um eine spektrale Antwort der Dioden zu erhalten. Diese spektrale Antwort wurde durch Simulationen sowie theoretische Berechnungen bestätigt.


Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
Total Pages: 800
Release: 2015-06-29
Genre: Technology & Engineering
ISBN: 0471739065

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This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.


Electrical Characterization of Silicon-on-Insulator Materials and Devices

Electrical Characterization of Silicon-on-Insulator Materials and Devices
Author: Sorin Cristoloveanu
Publisher: Springer Science & Business Media
Total Pages: 389
Release: 2013-11-27
Genre: Technology & Engineering
ISBN: 1461522455

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Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls the activity and enthu siasm of our SOl groups. Many contributing students have since then disappeared from the SOl horizon. Some of them believed that SOl was the great love of their scientific lives; others just considered SOl as a fantastic LEGO game for adults. We thank them all for kindly letting us imagine that we were guiding them. This book was very necessary to many people. SOl engineers will certainly be happy: indeed, if the performance of their SOl components is not always outstanding, they can now safely incriminate the relations given in the book rather than their process. Martine, Gunter, and Y. S. Chang can contemplate at last the amount of work they did with the figures. Our SOl accomplices already know how much we borrowed from their expertise and would find it indecent to have their detailed contri butions listed. Jean-Pierre and Dimitris incited the book, while sharing their experience in the reliability of floating bodies. Our families and friends now realize the SOl capability of dielectrically isolating us for about two years in a BOX. Our kids encouraged us to start writing. Our wives definitely gave us the courage to stop writing. They had a hard time fighting the symptoms of a rapidly developing SOl allergy.


Photodiodes

Photodiodes
Author: Jeong Woo Park
Publisher: BoD – Books on Demand
Total Pages: 460
Release: 2011-07-29
Genre: Technology & Engineering
ISBN: 9533075309

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Photodiodes or photodetectors are in one boat with our human race. Efforts of people in related fields are contained in this book. This book would be valuable to those who want to obtain knowledge and inspiration in the related area.


CRC Handbook of Metal Etchants

CRC Handbook of Metal Etchants
Author: Perrin Walker
Publisher: CRC Press
Total Pages: 1434
Release: 1990-12-11
Genre: Science
ISBN: 9781439822531

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This publication presents cleaning and etching solutions, their applications, and results on inorganic materials. It is a comprehensive collection of etching and cleaning solutions in a single source. Chemical formulas are presented in one of three standard formats - general, electrolytic or ionized gas formats - to insure inclusion of all necessary operational data as shown in references that accompany each numbered formula. The book describes other applications of specific solutions, including their use on other metals or metallic compounds. Physical properties, association of natural and man-made minerals, and materials are shown in relationship to crystal structure, special processing techniques and solid state devices and assemblies fabricated. This publication also presents a number of organic materials which are widely used in handling and general processing...waxes, plastics, and lacquers for example. It is useful to individuals involved in study, development, and processing of metals and metallic compounds. It is invaluable for readers from the college level to industrial R & D and full-scale device fabrication, testing and sales. Scientific disciplines, work areas and individuals with great interest include: chemistry, physics, metallurgy, geology, solid state, ceramic and glass, research libraries, individuals dealing with chemical processing of inorganic materials, societies and schools.


Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics
Author: Peter W. Epperlein
Publisher: John Wiley & Sons
Total Pages: 522
Release: 2013-01-25
Genre: Technology & Engineering
ISBN: 1118481860

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.


Current Sources and Voltage References

Current Sources and Voltage References
Author: Linden T. Harrison
Publisher: Elsevier
Total Pages: 603
Release: 2005-08-22
Genre: Technology & Engineering
ISBN: 0080455557

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Current Sources and Voltage References provides fixed, well-regulated levels of current or voltage within a circuit. These are two of the most important “building blocks “ of analog circuits, and are typically used in creating most analog IC designs. Part 1 shows the reader how current sources are created, how they can be optimized, and how they can be utilized by the OEM circuit designer. The book serves as a “must-have reference for the successful development of precision circuit applications. It shows practical examples using either BJTs, FETs, precision op amps, or even matched CMOS arrays being used to create highly accurate current source designs, ranging from nanoAmps to Amps. In each chapter the most important characteristics of the particular semiconductor type being studied are carefully reviewed. This not only serves as a helpful refresher for experienced engineers, but also as a good foundation for all EE student coursework, and includes device models and relevant equations. Part 2 focuses on semiconductor voltage references, from their design to their various practical enhancements. It ranges from the simple Zener diode to today’s most advanced topologies, including Analog Devices’ XFET® and Intersil’s FGATM (invented while this book was being written). Over 300 applications and circuit diagrams are shown throughout this easy-to-read, practical reference book. * Discusses how to design low-noise, precision current sources using matched transistor pairs. * Explains the design of high power current sources with power MOSFETs * Gives proven techniques to reduce drift and improve accuracy in voltage references.


Photodiodes

Photodiodes
Author: Ilgu Yun
Publisher:
Total Pages: 378
Release: 2012
Genre:
ISBN: 9789535162797

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This book represents recent progress and development of the photodiodes including the fundamental reviews and the specific applications developed by the authors themselves. The key idea of this book is that it allows authors to deal with a wide range of backgrounds and research progresses in photodiode-related areas. With respect to the original collection of the book chapters, this book contains several improvements and new problems and related solutions are also discussed in the areas from fundamental physics and design to device and circuit applications. The book is intended for graduate students, engineers, and researchers who are especially interested in the area of optoelectronic device applications, including photodiodes, solar cells, CMOS image sensors, Optoelectronic Integrated Circuits, etc.