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Design for Manufacturability and Statistical Design

Design for Manufacturability and Statistical Design
Author: Michael Orshansky
Publisher: Springer Science & Business Media
Total Pages: 319
Release: 2007-10-28
Genre: Technology & Engineering
ISBN: 0387690115

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Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.


Design for Manufacturability and Yield for Nano-Scale CMOS

Design for Manufacturability and Yield for Nano-Scale CMOS
Author: Charles Chiang
Publisher: Springer Science & Business Media
Total Pages: 277
Release: 2007-06-15
Genre: Technology & Engineering
ISBN: 1402051883

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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.


Design for Excellence in Electronics Manufacturing

Design for Excellence in Electronics Manufacturing
Author: Cheryl Tulkoff
Publisher: John Wiley & Sons
Total Pages: 400
Release: 2021-03-30
Genre: Technology & Engineering
ISBN: 1119109396

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DESIGN FOR EXCELLENCE IN ELECTRONICS MANUFACTURING An authoritative guide to optimizing design for manufacturability and reliability from a team of experts Design for Excellence in Electronics Manufacturing is a comprehensive, state-of-the-art book that covers design and reliability of electronics. The authors—noted experts on the topic—explain how using the DfX concepts of design for reliability, design for manufacturability, design for environment, design for testability, and more, reduce research and development costs and decrease time to market and allow companies to confidently issue warranty coverage. By employing the concepts outlined in Design for Excellence in Electronics Manufacturing, engineers and managers can increase customer satisfaction, market share, and long-term profits. In addition, the authors describe the best practices regarding product design and show how the practices can be adapted for different manufacturing processes, suppliers, use environments, and reliability expectations. This important book: Contains a comprehensive review of the design and reliability of electronics Covers a range of topics: establishing a reliability program, design for the use environment, design for manufacturability, and more Includes technical information on electronic packaging, discrete components, and assembly processes Shows how aspects of electronics can fail under different environmental stresses Written for reliability engineers, electronics engineers, design engineers, component engineers, and others, Design for Excellence in Electronics Manufacturing is a comprehensive book that reveals how to get product design right the first time.


Industrial Design of Experiments

Industrial Design of Experiments
Author: Sammy Shina
Publisher: Springer Nature
Total Pages: 391
Release: 2022
Genre: Electronic books
ISBN: 3030862674

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This textbook provides the tools, techniques, and industry examples needed for the successful implementation of design of experiments (DoE) in engineering and manufacturing applications. It contains a high-level engineering analysis of key issues in the design, development, and successful analysis of industrial DoE, focusing on the design aspect of the experiment and then on interpreting the results. Statistical analysis is shown without formula derivation, and readers are directed as to the meaning of each term in the statistical analysis. Industrial Design of Experiments: A Case Study Approach for Design and Process Optimization is designed for graduate-level DoE, engineering design, and general statistical courses, as well as professional education and certification classes. Practicing engineers and managers working in multidisciplinary product development will find it to be an invaluable reference that provides all the information needed to accomplish a successful DoE. Presents classical versus Taguchi DoE methodologies as well as techniques developed by the author for successful DoE; Offers a step-wise approach to DoE optimization and interpretation of results; Includes industrial case studies, worked examples and detailed solutions to problems.


Design for Manufacturability

Design for Manufacturability
Author: Artur Balasinski
Publisher: Springer Science & Business Media
Total Pages: 283
Release: 2013-10-05
Genre: Technology & Engineering
ISBN: 1461417619

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This book explains integrated circuit design for manufacturability (DfM) at the product level (packaging, applications) and applies engineering DfM principles to the latest standards of product development at 22 nm technology nodes. It is a valuable guide for layout designers, packaging engineers and quality engineers, covering DfM development from 1D to 4D, involving IC design flow setup, best practices, links to manufacturing and product definition, for process technologies down to 22 nm node, and product families including memories, logic, system-on-chip and system-in-package.


Design of Experiments for Engineers and Scientists

Design of Experiments for Engineers and Scientists
Author: Jiju Antony
Publisher: Elsevier
Total Pages: 296
Release: 2023-06-02
Genre: Technology & Engineering
ISBN: 0443151741

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This third edition of Design of Experiments for Engineers and Scientists adds to the tried and trusted tools that were successful in so many engineering organizations with new coverage of design of experiments (DoE) in the service sector. Case studies are updated throughout, and new ones are added on dentistry, higher education, and utilities. Although many books have been written on DoE for statisticians, this book overcomes the challenges a wider audience faces in using statistics by using easy-to-read graphical tools. Readers will find the concepts in this book both familiar and easy to understand, and users will soon be able to apply them in their work or research. This classic book is essential reading for engineers and scientists from all disciplines tackling all kinds of product and process quality problems and will be an ideal resource for students of this topic. Written in nonstatistical language, the book is an essential and accessible text for scientists and engineers who want to learn how to use DoE Explains why teaching DoE techniques in the improvement phase of Six Sigma is an important part of problem-solving methodology New edition includes two new chapters on DoE for services as well as case studies illustrating its wider application in the service industry


Nano-CMOS Design for Manufacturability

Nano-CMOS Design for Manufacturability
Author: Ban P. Wong
Publisher: John Wiley & Sons
Total Pages: 408
Release: 2008-12-29
Genre: Technology & Engineering
ISBN: 0470382813

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Discover innovative tools that pave the way from circuit and physical design to fabrication processing Nano-CMOS Design for Manufacturability examines the challenges that design engineers face in the nano-scaled era, such as exacerbated effects and the proven design for manufacturability (DFM) methodology in the midst of increasing variability and design process interactions. In addition to discussing the difficulties brought on by the continued dimensional scaling in conformance with Moore's law, the authors also tackle complex issues in the design process to overcome the difficulties, including the use of a functional first silicon to support a predictable product ramp. Moreover, they introduce several emerging concepts, including stress proximity effects, contour-based extraction, and design process interactions. This book is the sequel to Nano-CMOS Circuit and Physical Design, taking design to technology nodes beyond 65nm geometries. It is divided into three parts: Part One, Newly Exacerbated Effects, introduces the newly exacerbated effects that require designers' attention, beginning with a discussion of the lithography aspects of DFM, followed by the impact of layout on transistor performance Part Two, Design Solutions, examines how to mitigate the impact of process effects, discussing the methodology needed to make sub-wavelength patterning technology work in manufacturing, as well as design solutions to deal with signal, power integrity, WELL, stress proximity effects, and process variability Part Three, The Road to DFM, describes new tools needed to support DFM efforts, including an auto-correction tool capable of fixing the layout of cells with multiple optimization goals, followed by a look ahead into the future of DFM Throughout the book, real-world examples simplify complex concepts, helping readers see how they can successfully handle projects on Nano-CMOS nodes. It provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule.


VLSI Design for Manufacturing: Yield Enhancement

VLSI Design for Manufacturing: Yield Enhancement
Author: Stephen W. Director
Publisher: Springer Science & Business Media
Total Pages: 299
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 1461315212

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One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.


Statistical Robust Design

Statistical Robust Design
Author: Magnus Arner
Publisher: John Wiley & Sons
Total Pages: 194
Release: 2014-02-04
Genre: Mathematics
ISBN: 1118841956

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A UNIQUELY PRACTICAL APPROACH TO ROBUST DESIGN FROM A STATISTICAL AND ENGINEERING PERSPECTIVE Variation in environment, usage conditions, and the manufacturing process has long presented a challenge in product engineering, and reducing variation is universally recognized as a key to improving reliability and productivity. One key and cost-effective way to achieve this is by robust design – making the product as insensitive as possible to variation. With Design for Six Sigma training programs primarily in mind, the author of this book offers practical examples that will help to guide product engineers through every stage of experimental design: formulating problems, planning experiments, and analysing data. He discusses both physical and virtual techniques, and includes numerous exercises and solutions that make the book an ideal resource for teaching or self-study. • Presents a practical approach to robust design through design of experiments. • Offers a balance between statistical and industrial aspects of robust design. • Includes practical exercises, making the book useful for teaching. • Covers both physical and virtual approaches to robust design. • Supported by an accompanying website (www.wiley/com/go/robust) featuring MATLAB® scripts and solutions to exercises. • Written by an experienced industrial design practitioner. This book’s state of the art perspective will be of benefit to practitioners of robust design in industry, consultants providing training in Design for Six Sigma, and quality engineers. It will also be a valuable resource for specialized university courses in statistics or quality engineering.