Deposing & Examining Employment Witnesses R10
Author | : |
Publisher | : |
Total Pages | : |
Release | : 2020-09 |
Genre | : |
ISBN | : 9781949517927 |
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Author | : |
Publisher | : |
Total Pages | : |
Release | : 2020-09 |
Genre | : |
ISBN | : 9781949517927 |
Author | : Tod F. Schleier |
Publisher | : |
Total Pages | : |
Release | : 2007-10 |
Genre | : Depositions |
ISBN | : 9781580121248 |
To make it easy for you to prepare for a particular deposition or examination, the book is organized by witness. Each witness-specific section delivers: (1) trial-tested strategies and arguments, (2) model deposition questions specific to cause of action and annotated with tactics, (3) checklists and tactics for direct and cross examinations, with extensive examples sprinkled with practice tips, and (4) summary checklists of the important points that should be inquired into for each cause of action. Tools and advice are provided for both employee and management attorneys.Mastering the art of questioning employment witnesses is a career-long process.It can take dozens of years in the courtroom to learn how to persuasively: (1) demonstrate that reasonable economists can disagree, (2) compel an adverse witness to ratify your position, and (3) contradict a manager or plaintiff on an important fact.Tod Schleier's Deposing & Examining Employment Witnesses will take years off your learning curve. It is filled with practical strategies, examples, tactics, and tips for successful questioning and other essential elements of employment advocacy.
Author | : Steven Lubet |
Publisher | : Aspen Publishing |
Total Pages | : 251 |
Release | : 2020-02-06 |
Genre | : Law |
ISBN | : 1601568711 |
Order two copies of this book: one for yourself and one for your expert witness. It will give experts the confidence they need to be comfortable in court, and give you the skills necessary to emphasize the credibility of your experts. You can avoid pitfalls such as unintentional signals, inappropriate demeanor and appearance, and awkward body language by using Expert Testimony: A Guide for Expert Witnesses and the Lawyers Who Examine Them as your guide. In this newly revised Fourth Edition, Elizabeth Boals and Steve Lubet provide counsel on the development and presentation of expert testimony in the digital age, including discussion of visual aids and electronic discovery; analyze the Federal Rules of Evidence and Federal Rules of Civil Procedure; discuss the ethical rules governing expert retention and testimony; give examples of expert witness examinations and detailed discussion of techniques for coping with lawyer questioning; and provide checklists for quick reference. The collaborative effort of Professors Lubet and Boals has resulted in a new edition worthwhile to both the expert witnesses and the lawyers who examine them.
Author | : Christopher Jon Sprigman |
Publisher | : Lulu.com |
Total Pages | : 203 |
Release | : 2017-07-11 |
Genre | : Law |
ISBN | : 1892628023 |
This public domain book is an open and compatible implementation of the Uniform System of Citation.
Author | : United States |
Publisher | : |
Total Pages | : 1722 |
Release | : 1997 |
Genre | : Law |
ISBN | : |
Author | : James Fitzjames Stephen |
Publisher | : |
Total Pages | : 440 |
Release | : 1886 |
Genre | : Evidence (Law) |
ISBN | : |
Author | : United States. Supreme Court |
Publisher | : |
Total Pages | : 88 |
Release | : 2010 |
Genre | : Civil procedure |
ISBN | : |
Author | : United Provinces of Agra and Oudh (India). High Court of Judicature |
Publisher | : |
Total Pages | : 262 |
Release | : 1918 |
Genre | : |
ISBN | : |
Author | : Gary S. May |
Publisher | : John Wiley & Sons |
Total Pages | : 428 |
Release | : 2006-05-26 |
Genre | : Technology & Engineering |
ISBN | : 0471790273 |
A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.
Author | : Alan Henderson Gardiner |
Publisher | : |
Total Pages | : 216 |
Release | : 1916 |
Genre | : Egyptian language |
ISBN | : |