Current Material Research Using X Rays And Related Techniques Ii PDF Download

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Current Material Research Using X-Rays and Related Techniques II

Current Material Research Using X-Rays and Related Techniques II
Author: Zainal Arifin Ahmad
Publisher: Trans Tech Publications Ltd
Total Pages: 564
Release: 2017-03-06
Genre: Technology & Engineering
ISBN: 3035730296

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Selected, peer reviewed papers from the International Conference on X-Rays and Related Techniques in Research and Industry 2016 (ICXRI2016), August 17-18, 2016, Putrajaya, Malaysia


Current Material Research Using X-Rays & Related Techniques

Current Material Research Using X-Rays & Related Techniques
Author: Hasan Zuhudi Abdullah
Publisher: Trans Tech Publications Ltd
Total Pages: 540
Release: 2015-02-10
Genre: Technology & Engineering
ISBN: 3038267945

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As we have known, X-ray and related techniques are mainly used for quality control and materials characterization study. Most of the equipment used in these activities has contributed a lot to the advancement of materials science, solid state physics, chemistry, medical and other fields. In recent years, there have been a lot of improvements that includes the introduction of an array of software including instrument control, data interpretation and standard data that may provide quick results with enhanced efficiency. IXCRI 2014 aims to exchange and share experiences and research findings in all aspects of X-rays and related techniques among academics, researchers and the industry. Not only that, ICXRI 2014 includes a workshop session, which allows participants to gain a hands-on experience in learning fundamental understanding on X-ray applications. Due to this unique conference-workshop combination, I strongly believe that this conference will have a huge impact and will lead to future innovations and strong linkages among the participants. This is reflected in the number of participants, which amounts to a total of nearly 100 papers being presented here in this conference.


Current Materials Research Using X-Rays and Related Techniques III

Current Materials Research Using X-Rays and Related Techniques III
Author: Muhamad Faiz Md Din
Publisher: Trans Tech Publications Ltd
Total Pages: 710
Release: 2022-01-28
Genre: Science
ISBN: 3035732744

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Selected peer-reviewed full text papers from the 10th International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2021)


Advanced X-Ray Characterization Techniques

Advanced X-Ray Characterization Techniques
Author: Zainal Arifin Ahmad
Publisher: Trans Tech Publications Ltd
Total Pages: 550
Release: 2012-12-13
Genre: Technology & Engineering
ISBN: 3038139416

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Volume is indexed by Thomson Reuters CPCI-S (WoS) X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.


X-ray Characterization of Materials

X-ray Characterization of Materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
Total Pages: 277
Release: 2008-07-11
Genre: Technology & Engineering
ISBN: 3527613757

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.


Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
Total Pages: 322
Release: 2016-03-23
Genre: Technology & Engineering
ISBN: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials


Introduction to X-Ray Powder Diffractometry

Introduction to X-Ray Powder Diffractometry
Author: Ron Jenkins
Publisher: John Wiley & Sons
Total Pages: 432
Release: 2012-08-29
Genre: Science
ISBN: 1118520920

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When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.


Surface Analysis Methods in Materials Science

Surface Analysis Methods in Materials Science
Author: D.J. O'Connor
Publisher: Springer Science & Business Media
Total Pages: 588
Release: 2013-06-29
Genre: Technology & Engineering
ISBN: 366205227X

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This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.