Crosstalk Fault Test Generation And Hierarchical Timing Verification In Vlsi Digital Circuits PDF Download
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Author | : Kyung Tek Lee |
Publisher | : |
Total Pages | : 214 |
Release | : 1999 |
Genre | : Integrated circuits |
ISBN | : |
Download Crosstalk fault test generation and hierarchical timing verification in VLSI digital circuits Book in PDF, ePub and Kindle
Author | : S. Jayanthy |
Publisher | : Springer |
Total Pages | : 156 |
Release | : 2018-09-20 |
Genre | : Technology & Engineering |
ISBN | : 981132493X |
Download Test Generation of Crosstalk Delay Faults in VLSI Circuits Book in PDF, ePub and Kindle
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Author | : Debashis Bhattacharya |
Publisher | : Springer |
Total Pages | : 184 |
Release | : 1990 |
Genre | : Computers |
ISBN | : |
Download Hierarchical Modeling for VLSI Circuit Testing Book in PDF, ePub and Kindle
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.
Author | : Kyung Tek Lee |
Publisher | : |
Total Pages | : 108 |
Release | : 1996 |
Genre | : |
ISBN | : |
Download Analysis of crosstalk effects and test generation for crosstalk glitches in VLSI digital circuits Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 2540 |
Release | : 2002 |
Genre | : Chemistry |
ISBN | : |
Download Chemical Abstracts Book in PDF, ePub and Kindle
Author | : Rathish Jayabharathi |
Publisher | : |
Total Pages | : 318 |
Release | : 1999 |
Genre | : Integrated circuits |
ISBN | : |
Download Hierarchical timing verification and delay fault testing Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 848 |
Release | : 1999 |
Genre | : Dissertation abstracts |
ISBN | : |
Download American Doctoral Dissertations Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 1360 |
Release | : 1995 |
Genre | : Electrical engineering |
ISBN | : |
Download Science Abstracts Book in PDF, ePub and Kindle
Author | : J. Bhasker |
Publisher | : Springer Science & Business Media |
Total Pages | : 588 |
Release | : 2009-04-03 |
Genre | : Technology & Engineering |
ISBN | : 0387938206 |
Download Static Timing Analysis for Nanometer Designs Book in PDF, ePub and Kindle
iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how does one verify it? The design team of a large digital design may spend months architecting and iterating the design to achieve the required timing target. Besides functional verification, the t- ing closure is the major milestone which dictates when a chip can be - leased to the semiconductor foundry for fabrication. This book addresses the timing verification using static timing analysis for nanometer designs. The book has originated from many years of our working in the area of timing verification for complex nanometer designs. We have come across many design engineers trying to learn the background and various aspects of static timing analysis. Unfortunately, there is no book currently ava- able that can be used by a working engineer to get acquainted with the - tails of static timing analysis. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.
Author | : |
Publisher | : |
Total Pages | : 870 |
Release | : 2000 |
Genre | : Dissertations, Academic |
ISBN | : |
Download Dissertation Abstracts International Book in PDF, ePub and Kindle