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Cracking the TAAS

Cracking the TAAS
Author: Elizabeth Miller
Publisher: Princeton Review
Total Pages: 0
Release: 2000
Genre: Achievement tests
ISBN: 9780375755842

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The Princeton Review realizes that acing the TAAS Exit-Level Math exam is very different from getting straight As in school. TPR doesn't try to teach students everything there is to know about math -- only what they'll need to know to score higher on this exam. "There's a big difference. In Cracking the TAAS: Exit-Level Math, The Princeton Review will teach test takers how to think like the test makers. This is accomplished by teaching students how to: Eliminate answer choices using Process of Elimination and other techniques Use techniques such as Ballparking to save time and raise scores Improve scores by focusing on the material most likely to appear on the test Test one's knowledge with review questions for each math concept covered Nail even the toughest questions: fractions, word problems, algebra, geometry, and more Dodge the traps and pitfalls that cost test takers points *This book includes 2 full-length simulated Exit-Level Math exams. All of TPR's sample test questions are just like the ones test takers see on the actual exams, and every solution is fully explained. "Contents Include: Part I: Introduction About the TAAS Exams Structure and Strategies Part II: Math Review The Basics Exponents, Ratios, Probabilities, and More Geometry Analyzing Data Part III: The Princeton Review Practice Tests


Cracking the Taas Exit Level Reading and Writing

Cracking the Taas Exit Level Reading and Writing
Author: Gloria Levine
Publisher: Princeton Review
Total Pages: 0
Release: 2000-09-05
Genre: Achievement tests
ISBN: 9780375755835

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Provides strategies designed to help students score higher on the TAAS exit-level reading and writing exam.


Cracking the Texas EOC

Cracking the Texas EOC
Author: Jeff Mandell
Publisher: Princeton Review
Total Pages: 228
Release: 2000
Genre: Education
ISBN: 9780375755729

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Contains strategies and techniques designed to help students score higher on the Texas EOC exam in United States history.


Chemistry for Electronic Materials

Chemistry for Electronic Materials
Author: K.F. Jensen
Publisher: Elsevier
Total Pages: 215
Release: 1993-03-09
Genre: Science
ISBN: 0444596909

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The chemical aspects of materials processing used for electronic applications, e.g. Si, III-V compounds, superconductors, metallization materials, are covered in this volume. Significant recent advances have occurred in the development of new volatile precursors for the fabrication of III-V semiconductor and metal [Cu, W] films by OMCVD. Some fundamentally new and wide-ranging applications have been introduced in recent times. Experimental and modeling studies regarding deposition kinetics, operating conditions and transport as well as properties of films produced by PVD, CVD and PECVD are discussed. The thirty papers in this volume report on many other significant topics also. Research workers involved in these aspects of materials technology may find here some new perspectives with which to augment their projects.


The Southwestern Reporter

The Southwestern Reporter
Author:
Publisher:
Total Pages: 2318
Release: 1897
Genre: Law reports, digests, etc
ISBN:

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Cracking the Texas EOC

Cracking the Texas EOC
Author: John Haumann
Publisher: Princeton Review
Total Pages: 228
Release: 2000
Genre: Education
ISBN: 9780375755705

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Proven techniques for scoring higher from the world's #1 test-prep company.


Forthcoming Books

Forthcoming Books
Author: Rose Arny
Publisher:
Total Pages: 1546
Release: 2000
Genre: American literature
ISBN:

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Technical Information Indexes

Technical Information Indexes
Author:
Publisher:
Total Pages: 150
Release: 1975
Genre: Aeronautics, Military
ISBN:

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Cracking the AP Statistics Exam, 2012 Edition

Cracking the AP Statistics Exam, 2012 Edition
Author: Madhuri S. Mulekar
Publisher: Princeton Review
Total Pages: 418
Release: 2011-09-06
Genre: Advanced placement programs (Education)
ISBN: 037542735X

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Provides techniques for achieving high scores on the AP statistics exam and includes two full-length practice tests.